4 Revision History
Changes from D Revision (September 2010) to E Revision
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Added ESD Ratings table, Feature Description section, Device Functional Modes section, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section Go
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Changed front page diagram. Go
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Changed pin names in the pin description.Go
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Changed the temperature values in the Absolute Maximum Ratings tableGo
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Changed Ambient temperature from –25 to –40 in the MIN column. Go
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Deleted Temperature Range parameters from Electrical Characteristics.Go
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Changed I2C timing spec change based on characterization data. Go
Changes from C Revision (September, 2009) to D Revision
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Changed High Accuracy bullet in Features from 1% to 0.5% for B-grade deviceGo
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Added new paragraph to Description regarding A- and B-grade versions of the deviceGo
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Added new row to Packaging Information table to show new B-grade deviceGo
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Added B-grade columns in Electrical Characteristics for MIN, TYP and MAX valuesGo
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Changed Current Sense Gain Error over temperature specification from 10 ppm/°C to 1m%/°CGo
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Added Configure/Measure/Calculate ExampleGo
Changes from B Revision (June, 2009) to C Revision
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Changed specified temperature range from –25°C to –40°CGo
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Changed Offset Voltage (RTI) vs Temperature minimum specification from 0.1 μV/°C to 0.16 μV/°CGo
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Changed Typical Characteristics: Figure 3, Figure 4, Figure 5, Figure 6Go
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Changed Typical Characteristics: Figure 9, Figure 10Go