SLLSEQ0C august 2015 – may 2023 ISO5852S
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
tr | Output-signal rise time at OUTH | CLOAD = 1 nF | See Figure 8-1, Figure 8-2, and Figure 8-3 | 12 | 18 | 35 | ns |
tf | Output-signal fall time at OUTL | CLOAD = 1 nF | 12 | 20 | 37 | ns | |
tPLH, tPHL | Propagation Delay | CLOAD = 1 nF | 76 | 110 | ns | ||
tsk-p | Pulse skew |tPHL – tPLH| | CLOAD = 1 nF | 20 | ns | |||
tsk-pp | Part-to-part skew | CLOAD = 1 nF | 30(1) | ns | |||
tGF (IN,/RST) | Glitch filter on IN+, IN–, RST | CLOAD = 1 nF | 20 | 30 | 40 | ns | |
tDS (90%) | DESAT sense to 90% VOUTH/L delay | CLOAD = 10 nF | 553 | 760 | ns | ||
tDS (10%) | DESAT sense to 10% VOUTH/L delay | CLOAD = 10 nF | 2 | 3.5 | μs | ||
tDS (GF) | DESAT-glitch filter delay | CLOAD = 1 nF | 330 | ns | |||
tDS ( FLT) | DESAT sense to FLT-low delay | See Figure 8-3 | 1.4 | μs | |||
tLEB | Leading-edge blanking time | See Figure 8-1 and Figure 8-2 | 310 | 400 | 480 | ns | |
tGF(RSTFLT) | Glitch filter on RST for resetting FLT | 300 | 800 | ns | |||
CI | Input capacitance(2) | VI = VCC1 / 2 + 0.4 × sin (2πft), f = 1 MHz, VCC1 = 5 V | 2 | pF | |||
CMTI | Common-mode transient immunity | VCM = 1500 V, see Figure 8-4 | 100 | 120 | kV/μs |