SLLSEQ0C august 2015 – may 2023 ISO5852S
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
VOLTAGE SUPPLY | |||||||
VIT+(UVLO1) | Positive-going UVLO1 threshold-voltage input side (VCC1 – GND1) | 2.25 | V | ||||
VIT-(UVLO1) | Negative-going UVLO1 threshold-voltage input side (VCC1 – GND1) | 1.7 | V | ||||
VHYS(UVLO1) | UVLO1 Hysteresis voltage (VIT+ – VIT–) input side | 0.2 | V | ||||
VIT+(UVLO2) | Positive-going UVLO2 threshold-voltage output side (VCC2 – GND2) | 12 | 13 | V | |||
VIT–(UVLO2) | Negative-going UVLO2 threshold-voltage output side (VCC2 – GND2) | 9.5 | 11 | V | |||
VHYS(UVLO2) | UVLO2 hysteresis voltage (VIT+ – VIT–) output side | 1 | V | ||||
IQ1 | Input-supply quiescent current | 2.8 | 4.5 | mA | |||
IQ2 | Output-supply quiescent current | 3.6 | 6 | mA | |||
LOGIC I/O | |||||||
VIT+(IN, RST) | Positive-going input-threshold voltage (IN+, IN–, RST) | 0.7 × VCC1 | V | ||||
VIT–(IN, RST) | Negative-going input-threshold voltage (IN+, IN–, RST) | 0.3 × VCC1 | V | ||||
VHYS(IN, RST) | Input hysteresis voltage (IN+, IN–, RST) | 0.15 × VCC1 | V | ||||
IIH | High-level input leakage at (IN+)(1) | IN+ = VCC1 | 100 | µA | |||
IIL | Low-level input leakage at (IN–, RST)(2) | IN– = GND1, RST = GND1 | -100 | µA | |||
IPU | Pullup current of FLT, RDY | V(RDY) = GND1, V(FLT) = GND1 | 100 | µA | |||
V(OL) | Low-level output voltage at FLT, RDY | I(FLT) = 5 mA | 0.2 | V | |||
GATE DRIVER STAGE | |||||||
V(OUTPD) | Active output pulldown voltage | I(OUTH/L) = 200 mA, VCC2 = open | 2 | V | |||
VOUTH | High-level output voltage | I(OUTH) = –20 mA | VCC2 – 0.5 | VCC2 – 0.24 | V | ||
VOUTL | Low-level output voltage | I(OUTL) = 20 mA | VEE2 + 13 | VEE2 + 50 | mV | ||
I(OUTH) | High-level output peak current | IN+ = high, IN– = low, V(OUTH) = VCC2 - 15 V | 1.5 | 2.5 | A | ||
I(OUTL) | Low-level output peak current | IN+ = low, IN– = high, V(OUTL) = VEE2 + 15 V | 3.4 | 5 | A | ||
I(OLF) | Low-level output current during fault condition | 130 | mA | ||||
ACTIVE MILLER CLAMP | |||||||
V(CLP) | Low-level clamp voltage | I(CLP) = 20 mA | VEE2 + 0.015 | VEE2 + 0.08 | V | ||
I(CLP) | Low-level clamp current | V(CLAMP) = VEE2 + 2.5 V | 1.6 | 2.5 | 3.3 | A | |
V(CLTH) | Clamp threshold voltage | 1.6 | 2.1 | 2.5 | V | ||
SHORT CIRCUIT CLAMPING | |||||||
V(CLP-OUTH) | Clamping voltage (VOUTH – VCC2) | IN+ = high, IN– = low, tCLP = 10 µs, I(OUTH) = 500 mA | 1.1 | 1.3 | V | ||
V(CLP-OUTL) | Clamping voltage (VOUTL – VCC2) | IN+ = high, IN– = low, tCLP = 10 µs, I(OUTL) = 500 mA | 1.3 | 1.5 | V | ||
V(CLP-CLP) | Clamping voltage (VCLP – VCC2) | IN+ = high, IN– = low, tCLP = 10 µs, I(CLP) = 500 mA | 1.3 | V | |||
V(CLP-CLAMP) | Clamping voltage at CLAMP | IN+ = High, IN– = Low, I(CLP) = 20 mA | 0.7 | 1.1 | V | ||
V(CLP-OUTL) | Clamping voltage at OUTL (VCLP – VCC2) | IN+ = High, IN– = Low, I(OUTL) = 20 mA | 0.7 | 1.1 | V | ||
DESAT PROTECTION | |||||||
I(CHG) | Blanking-capacitor charge current | V(DESAT) – GND2 = 2 V | 0.42 | 0.5 | 0.58 | mA | |
I(DCHG) | Blanking-capacitor discharge current | V(DESAT) – GND2 = 6 V | 9 | 14 | mA | ||
V(DSTH) | DESAT threshold voltage with respect to GND2 | 8.3 | 9 | 9.5 | V | ||
V(DSL) | DESAT voltage with respect to GND2, when OUTH or OUTL is driven low | 0.4 | 1 | V |