4 Revision History
Changes from Revision D (August 2015) to Revision E (January 2022)
- Updated the numbering format for tables, figures, and
cross-references throughout the document. Go
- Added additional IL specification test condition Go
- Internal Comment: Added additional IL specification test
condition for the low VIN condition. See Changelink #C2112156 for details Go
Changes from Revision C (May 2013) to Revision D (August 2015)
- Added Device Information and Pin Configuration and Functions sections, ESD Rating table, Feature Description, Device Functional Modes, Application and Implementation, Power Supply Recommendations, Layout, Device and Documentation Support, and Mechanical, Packaging, and Orderable Information sectionsGo