4 Revision History
Changes from G Revision (April 2013) to H Revision
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Added Device Information table, ESD Ratings table, Thermal Information table, Detailed Description section, Feature Description section, Device Functional Modes section, Application and Implementation section, Typical Application section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information sectionGo
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Added AEC-Q100 Test Guidance bullets to FeaturesGo
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Changed RθJA value for NGG package from 80°C/W : to 55.3°C/WGo
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Changed RθJA value for DGN package from 80°C/W : to 53.7°C/WGo
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Changed RθJA value for DBV package from 118°C/W : to 164.2°C/WGo
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Changed RθJC(top) value for NGG package from 18°C/W : to 65.9°C/WGo
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Changed RθJC(top) value for DGN package from 18°C/W : to 61.4°C/WGo
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Changed RθJC(top) value for DBV package from 60°C/W : to 115.3°C/WGo
Changes from F Revision (May 2013) to G Revision
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Changed layout of National Semiconductor Data Sheet to TI formatGo