SBASAK0 December   2020  – May 2022 PCM1822

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements: TDM or I2S Interface
    7. 7.7 Switching Characteristics: TDM or I2S Interface
    8. 7.8 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Hardware Control
      2. 8.3.2 Audio Serial Interfaces
        1. 8.3.2.1 Time Division Multiplexed Audio (TDM) Interface
        2. 8.3.2.2 Inter IC Sound (I2S) Interface
      3. 8.3.3 Phase-Locked Loop (PLL) and Clock Generation
      4. 8.3.4 Input Channel Configurations
      5. 8.3.5 Reference Voltage
      6. 8.3.6 Signal-Chain Processing
        1. 8.3.6.1 Digital High-Pass Filter
        2. 8.3.6.2 Configurable Digital Decimation Filters
          1. 8.3.6.2.1 Linear Phase Filters
            1. 8.3.6.2.1.1 Sampling Rate: 8 kHz or 7.35 kHz
            2. 8.3.6.2.1.2 Sampling Rate: 16 kHz or 14.7 kHz
            3. 8.3.6.2.1.3 Sampling Rate: 24 kHz or 22.05 kHz
            4. 8.3.6.2.1.4 Sampling Rate: 32 kHz or 29.4 kHz
            5. 8.3.6.2.1.5 Sampling Rate: 48 kHz or 44.1 kHz
            6. 8.3.6.2.1.6 Sampling Rate: 96 kHz or 88.2 kHz
            7. 8.3.6.2.1.7 Sampling Rate: 192 kHz or 176.4 kHz
          2. 8.3.6.2.2 Low-Latency Filters
            1. 8.3.6.2.2.1 Sampling Rate: 16 kHz or 14.7 kHz
            2. 8.3.6.2.2.2 Sampling Rate: 24 kHz or 22.05 kHz
            3. 8.3.6.2.2.3 Sampling Rate: 32 kHz or 29.4 kHz
            4. 8.3.6.2.2.4 Sampling Rate: 48 kHz or 44.1 kHz
            5. 8.3.6.2.2.5 Sampling Rate: 96 kHz or 88.2 kHz
      7. 8.3.7 Dynamic Range Enhancer (DRE)
    4. 8.4 Device Functional Modes
      1. 8.4.1 Active Mode
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Receiving Notification of Documentation Updates
    2. 12.2 Support Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.1 Absolute Maximum Ratings

over the operating ambient temperature range (unless otherwise noted)(1)
MIN MAX UNIT
Supply voltage AVDD to AVSS –0.3 3.9 V
AREG to AVSS –0.3 2.0
IOVDD to VSS (thermal pad) –0.3 3.9
Ground voltage differences AVSS to VSS (thermal pad) –0.3 0.3 V
Analog input voltage Analog input pins voltage to AVSS –0.3 AVDD + 0.3 V
Digital input voltage Digital input pins voltage to VSS (thermal pad) –0.3 IOVDD + 0.3 V
Temperature Operating ambient, TA –40 125 °C
Junction, TJ –40 150
Storage, Tstg –65 150
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.