SCDS475A April 2024 – July 2024 SN4599-Q1
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
The SN4599-Q1 has a transmission-gate topology. Any mismatch in capacitance between the NMOS and PMOS transistors results in a charge injected into the drain or source during the falling or rising edge of the gate signal. The amount of charge injected into the source or drain of the device is known as charge injection, and is denoted by the symbol QC. Figure 6-6 shows the setup used to measure charge injection from Drain (D) to Source (Sx).