SCLS970 November 2023 SN54SC4T125-SEP
PRODUCTION DATA
VID V62/23631-01XE
Radiation Tolerant
Single Event Latch-Up (SEL) immune up to 43 MeV-cm2/mg at 125°C
Total Ionizing Does (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si)
Single Event Transient (SET) characterized up to LET = 43 MeV-cm2/mg
Wide operating range of 1.2 V to 5.5 V
Single-supply voltage translator:
Up translation:
1.2 V to 1.8 V
1.5 V to 2.5 V
1.8 V to 3.3 V
3.3 V to 5.0 V
Down translation:
Space Enhanced Plastic
Controlled baseline
Au bondwire and NiPdAu lead finish
Meets NASA ASTM E595 outgassing specification
One fabrication, assembly, and test site
Extended product life cycle
Product traceability