4 Revision History
Changes from B Revision (June 2017) to C Revision
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Changed 3.3 VISO To: 5 VISO in Figure 24 Go
Changes from A Revision (September 2015) to B Revision
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Changed text From: "characterized from –40°C to 85°C" To: "characterized from –40°C to 125°C" in the DescriptionGo
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Changed the TA MAX value From: 85°C To: 125°C in the Recommended Operating Conditions tableGo
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Changed ICC to show values for the temperature ranges of –40°C to 85°C and –40°C to 125°C in the Electrical Characteristics tableGo
Changes from * Revision (July 2013) to A Revision
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Added Pin Configuration and Functions section, ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section Go
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Changed JEDEC Standard 22, Test Method A114 (HBM) from ±4 to ±8 kV.Go
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Changed JEDEC Standard 22, Test Method A115 (Machine Model) from ±100 to ±200 V.Go
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Changed the "D and RE Inputs" circuit and the "DE Input" circuit of Figure 15Go