SLLSFV9 July   2024 TCAN1473-Q1

ADVANCE INFORMATION  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  ESD Ratings - IEC Specifications
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Thermal Information
    6. 5.6  Power Dissipation Ratings
    7. 5.7  Power Supply Characteristics
    8. 5.8  Electrical Characteristics
    9. 5.9  Timing Requirements
    10. 5.10 Switching Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
      1. 7.1.1 Signal Improvement
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Supply Pins
        1. 7.3.1.1 VSUP Pin
        2. 7.3.1.2 VCC Pin
        3. 7.3.1.3 VIO Pin
      2. 7.3.2 Digital Inputs and Outputs
        1. 7.3.2.1 TXD Pin
        2. 7.3.2.2 RXD Pin
        3. 7.3.2.3 nFAULT Pin
        4. 7.3.2.4 EN Pin
        5. 7.3.2.5 nSTB Pin
      3. 7.3.3 GND
      4. 7.3.4 INH Pin
      5. 7.3.5 WAKE Pin
      6. 7.3.6 CAN Bus Pins
      7. 7.3.7 Faults
        1. 7.3.7.1 Internal and External Fault Indicators
          1. 7.3.7.1.1 Power-Up (PWRON Flag)
          2. 7.3.7.1.2 Wake-Up Request (WAKERQ Flag)
          3. 7.3.7.1.3 Undervoltage Faults
            1. 7.3.7.1.3.1 Undervoltage on VSUP
            2. 7.3.7.1.3.2 Undervoltage on VCC
            3. 7.3.7.1.3.3 Undervoltage on VIO
          4. 7.3.7.1.4 CAN Bus Fault (CBF Flag)
          5. 7.3.7.1.5 TXD Dominant State Timeout (TXDDTO Flag)
          6. 7.3.7.1.6 TXD Shorted to RXD Fault (TXDRXD Flag)
          7. 7.3.7.1.7 CAN Bus Dominant Fault (CANDOM Flag)
      8. 7.3.8 Local Faults
        1. 7.3.8.1 TXD Dominant Timeout (TXD DTO)
        2. 7.3.8.2 Thermal Shutdown (TSD)
        3. 7.3.8.3 Undervoltage Lockout (UVLO)
        4. 7.3.8.4 Unpowered Devices
        5. 7.3.8.5 Floating Terminals
        6. 7.3.8.6 CAN Bus Short-Circuit Current Limiting
    4. 7.4 Device Functional Modes
      1. 7.4.1 Operating Mode Description
        1. 7.4.1.1 Normal Mode
        2. 7.4.1.2 Silent Mode
        3. 7.4.1.3 Standby Mode
        4. 7.4.1.4 Go-To-Sleep Mode
        5. 7.4.1.5 Sleep Mode
          1. 7.4.1.5.1 Remote Wake Request via Wake-Up Pattern (WUP)
          2. 7.4.1.5.2 Local Wake-Up (LWU) via WAKE Input Terminal
      2. 7.4.2 CAN Transceiver
        1. 7.4.2.1 CAN Transceiver Operation
          1. 7.4.2.1.1 CAN Transceiver Modes
            1. 7.4.2.1.1.1 CAN Off Mode
            2. 7.4.2.1.1.2 CAN Autonomous: Inactive and Active
            3. 7.4.2.1.1.3 CAN Active
          2. 7.4.2.1.2 Driver and Receiver Function Tables
          3. 7.4.2.1.3 CAN Bus States
  9. 8 Application Information Disclaimer
    1. 8.1 Application Information
      1. 8.1.1 Typical Application
      2. 8.1.2 Design Requirements
        1. 8.1.2.1 Bus Loading, Length and Number of Nodes
      3. 8.1.3 Detailed Design Procedure
        1. 8.1.3.1 CAN Termination
      4. 8.1.4 Application Curves
    2. 8.2 Power Supply Recommendations
    3. 8.3 Layout
      1. 8.3.1 Layout Guidelines
      2. 8.3.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information
    1. 11.1 Package Option Addendum
      1. 11.1.1 Packaging Information
      2. 11.1.2 Tape and Reel Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.3.8.2 Thermal Shutdown (TSD)

If the junction temperature of the TCAN1473-Q1 exceeds the thermal shutdown threshold the device turns off the CAN driver circuits thus blocking the TXD to bus transmission path. The CAN bus terminals are biased to recessive level during a TSD fault and the receiver to RXD path remains operational. The TSD fault condition is cleared when the junction temperature, TJ, of the device drops below the thermal shutdown release temperature, TSDF, of the device. If the fault condition that caused the TSD fault is still present, the temperature may rise again and the device will enter thermal shutdown again. Prolonged operation with TSD fault conditions may affect device reliability. The TSD circuit includes hysteresis to avoid any oscillation of the driver output. During the fault the TSD fault condition is indicated to the CAN FD controller via the nFAULT terminal.