A. Time stamp
markers:
- T0 – 3.3V voltages start ramp-up to
VOPR MIN. (0 ms)
- T1 – 1.8-V voltages start ramp-up to
VOPR MIN. (2 ms)
- T2 – Low voltage core supplies start
ramp-up to VOPR MIN. (3 ms)
- T3 – Low voltage RAM array voltages
start ramp-up to VOPR MIN. (4 ms)
- T4 – OSC1 is stable and PORz/MCU_PORz
are de-asserted to release processor from reset. (13 ms)
B. Any MCU or
Main dual voltage IO supplies (VDDSHVn_MCU or VDDSHVn) being supplied by 3.3V to support
3.3V digital interfaces. A few supplies could have varying start times between T0 to T1
due to PDN designs using different power resources with varying turn-on & ramp-up time
delays.
C. Any MCU or
Main dual voltage IO supplies (VDDSHVn_MCU or VDDSHVn) being supplied by 1.8 V to support
1.8-V digital interfaces. When eMMC memories are used, Main 1.8-V supplies could have a
ramp-up aligned to T3 due to PDN designs grouping supplies with VDD_MMC0.
D. VDDSHV5
supports MMC1 signaling for SD memory cards. If compliant high-speed SD card operation is
needed, then an independent, dual voltage (3.3 V/1.8 V) power source and rail are
required. The start of ramp-up to 3.3 V will be same as other 3.3-V domains as shown. If
SD card is not needed or standard data rates with fixed 3.3 V operation is acceptable,
then domain can be grouped with digital IO 3.3-V power rail. If a SD card is capable of
operating with fixed 1.8 V, then domain can be grouped with digital IO 1.8-V power
rail.
E. VDDA_3P3_USB is 3.3-V analog domain used for USB 2.0 differential interface signaling. A
low noise, analog supply is recommended to provide best signal integrity for USB data eye
mask compliance. The start of ramp-up to 3.3 V will be same as other 3.3-V domains as
shown. If USB interface is not needed or data bit errors can be tolerated, then domain can
be grouped with 3.3-V digital IO power rail either directly or through a supply
filter.
F. VDDA_1P8_<clk/pll/ana> are 1.8-V analog domains supporting clock oscillator, PLL
and analog circuitry needing a low noise supply for optimal performance. It is not
recommended to combine digital VDDSHVn_MCU and VDDSHVn IO domains since high frequency
switching noise could negatively impact jitter performance of clock, PLL and DLL signals.
Combining analog VDDA_1p8_<phy> domains should be avoided but if grouped, then
in-line ferrite bead supply filtering is required.
G. VDDA_1P8_<phy> are 1.8-V analog domains supporting multiple serial PHY interfaces.
A low noise, analog supply is recommended to provide best signal integrity, interface
performance and spec compliance. If any of these interfaces are not needed, data bit
errors or non-compliant operation can be tolerated, then domains can be grouped with
digital IO 1.8-V power rail either directly or through an in-line supply filter is
allowed.
H. VDDA_0P8_<dll/pll> are 0.8-V analog domains supporting PLL and DLL circuitry
needing a low noise supply for optimal performance. It is not recommended to combine these
domains with any other 0.8-V domains since high frequency switching noise could negatively
impact jitter performance of PLL and DLL signals.
I. VDD_MCU is
a digital voltage domain with a wide operational voltage range enabling it to be grouped
either with VDDAR_MCU domain or with VDD_CORE; for the “Combined MCU and Main Domains
Power-Up Sequencing,” VDD_MCU can be grouped with VDD_CORE, and VDDAR_MCU can be grouped
with VDDAR_CPU and VDDAR_CORE. If VDD_MCU is grouped with VDD_CORE, VDD_MCU must be
ramped-up from a common voltage resource with 0.8-V VDD_CORE at T2. If VDD_MCU is not
grouped with VDD_CORE, VDD_MCU must be ramped-up before T2. In either case, the VDDAR
supplies must be ramped at T3.
J. Minimum
set-up and hold times shown with respect to MCU_PORz and PORz asserting high to latch
MCU_BOOTMODEn (referenced to MCU_VDDSHV0) and BOOTMODEn (reference to VDDSHV2) settings
into registers during power up sequence.
K. Minimum
elapsed time from crystal oscillator circuitry being energized (VDDA_OSC1 at T1) until
stable clock frequency is reached depends upon on crystal oscillator, capacitor parameters
and PCB parasitic values. A conservative 10 ms elapsed time defined by (T4 – T1) time
stamps is shown. This could be reduced depending upon customer’s clock circuit (that is,
crystal oscillator or clock generator) and PCB designs.
Figure 6-3 Combined MCU and
Main Domains, Primary Power-Up Sequence