SBOS854F March 2018 – June 2024 TMP1075
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |||
---|---|---|---|---|---|---|---|---|
TEMPERATURE INPUT | ||||||||
Range | –55 | 125 | °C | |||||
Accuracy (temperature error) | DGK, D | –40°C to 110°C | ±0.25 | ±1 | °C | |||
–55°C to 125°C | ±0.25 | ±2 | ||||||
DSG | –40°C to 75°C | ±0.25 | ±1 | °C | ||||
–55°C to 125°C | ±0.25 | ±2 | °C | |||||
Accuracy (temperature error) vs supply | PSRR | ±0.03 | °C/V | |||||
Resolution | 1 LSB (12 bit) | 0.0625 | °C | |||||
Repeatability(1) | 25°C, V+= 3.3 V(2) | 0.0625 | °C | |||||
Long-term drift(3) | 500 hours at 150°C, 5.5 V | 0.0625 | °C | |||||
DIGITAL INPUT/OUTPUT | ||||||||
Input capacitance | 5 | pF | ||||||
VIH | High-level input logic | 0.7(V+) | V | |||||
VIL | Low-level input logic | 0.3(V+) | V | |||||
IIN | Leakage input current | –0.25 | 0 | 0.25 | µA | |||
Input voltage hysteresis | SCL and SDA pins | 600 | mV | |||||
VOL | Low-level output logic | IOL = -3 mA, SDA and ALERT pins | 0 | 0.15 | 0.4 | V | ||
ADC Conversion time | one-shot mode | 4.5 | 5.5 | 7 | ms | |||
TC | Conversion Time | R1 = 0, R0 = 0 (default) | 27.5 | ms | ||||
R1 = 0, R0 = 1 | 55 | |||||||
R1 = 1, R0 = 0 | 110 | |||||||
R1 = 1, R0 = 1 | 220 | |||||||
Reset time | The time between reset until ADC conversion start | 0.3 | ms | |||||
Conversion Rate Variation | –10 | 0 | 10 | % | ||||
POWER SUPPLY | ||||||||
Operating voltage range | 1.7 | 3.3 | 5.5 | V | ||||
IQ | Quiescent current (serial bus inactive) | R1 = 0, R0 = 0 (default) | 10 | 20 | µA | |||
R1 = 0, R0 = 1 | 5.5 | 9 | µA | |||||
R1 = 1, R0 = 0 | 4 | 6 | ||||||
R1 = 1, R0 = 1 | 2.7 | 4 | ||||||
During 5.5 ms active conversion | 52 | 85 | µA | |||||
ISD | Shutdown current | Serial bus active, SCL frequency = 400 kHz, A0=A1=A2=GND | 13 | µA | ||||
Serial bus inactive, A0=A1=A2=SCL=SDA=V+, 25°C | 0.37 | 0.65 | µA | |||||
Serial bus inactive, A0=A1=A2=SCL=SDA=V+ | 0.37 | 3.5 | µA | |||||
Power supply thresholds | Supply rising, Power-on Reset | 1.22 | V | |||||
Supply failing, Brown-out Detect | 1.1 |