11 Revision History
Changes from Revision C (August 2021) to Revision D (July 2024)
- Update HBM ESD value on PW and RUM packageGo
- Updated IIH max specificationGo
Changes from Revision B (April 2021) to Revision C (August 2021)
- Added the QFN packages for TMUX7211, TMUX7212, and TMUX7213Go
- Added ESD detail for RUM packageGo
- Changed THD+N typical for 12V supplyGo
- Added the Integrated Pull-Down Resistor on Logic Pins
sectionGo
- Updated the Ultra-Low
Charge Injection sectionGo
- Updated the TMUX721x
Layout Example figure in the Layout Example
sectionGo
Changes from Revision A (March 2021) to Revision B (April 2021)
- Included Break-before-make time delay for TMUX7213 Go
- Updated the Charge
Injection Compensation figureGo
Changes from Revision * (December 2020) to Revision A (March 2021)
- Added high current support for WQFN in Features
sectionGo
- Added thermal information for QFN packageGo
- Updated IDC specs for TSSOP package in Source or Drain Continuous Current table Go
- Added IDC specs for QFN package in Source or Drain Continuous Current table Go
- Updated VDD rise time value from 100ns to 1µs in TON(VDD) test conditionGo
- Updated CL value from 1nF to 100pF in Charge Injection test conditionGo
- Updated Figure 7-10 Leakage
Current vs. Temperature
Go