SLVSGU5A April 2022 – July 2022 TPS22811
PRODUCTION DATA
The following table summarizes the device response to various fault conditions.
Event |
Protection Response |
Fault Latched Internally |
---|---|---|
Overtemperature |
Shutdown |
Y |
Undervoltage (UVP or UVLO) |
Shutdown |
N |
Input overvoltage |
Shutdown |
N |
Output short circuit to GND |
Fast-trip |
Y |
Faults which are latched internally can be cleared either by power cycling the part (pulling VIN to 0 V) or by pulling the EN/UVLO pin voltage below VSD.
During a latched fault, pulling the EN/UVLO just below the UVLO threshold has no impact on the device.