5 Revision History
Changes from B Revision (May 2012) to C Revision
-
Added Pin Configuration and Functions section, ESD Rating table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section Go
Changes from A Revision (December 2008) to B Revision
-
Changed Feature From: Ultra-Low Quiescent Current: 78 nA at 1.8 V To: Ultra-Low Quiescent Current: Typical 78 nA at 1.8 VGo
-
Changed Feature From: Typical 78 nA at 1.8 V To: Ultra-Low Shutdown Current: Typical 35 nA at 1.8 VGo
-
Changed Feature From: Six Terminal Wafer-Chip-Scale Package To: Six Terminal Wafer-Chip-Scale Package (nominal dimensions shown - see addendum for detailsGo
-
Changed Feature From: 0.5-mm Height To: 0.5-mm Height (YFP)Go
-
Changed TPS22921 QUICK OUTPUT DISCHARGE From: - To: NoGo
-
Changed the format of the ELECTRICAL CHARACTERISTICS Test Conditions From: VIN = 1-V to VIN = 1 VGo
-
Deleted Note 1 - RL_CHIP = 120 Ω from all SWITCHING CHARACTERISTICS tablesGo
-
Changed Figure 50 title From: tOFF Response To: tON ResponseGo
Changes from * Revision (November 2008) to A Revision
-
Added Note A to the TYPICAL APPLICATION circuitGo