4 Revision History
Changes from B Revision (November 2016) to C Revision
- Added UL 2367 Recognized – File No. E339631 to the Features section Go
Changes from A Revision (September 2015) to B Revision
Changes from * Revision (October 2013) to A Revision
- Added the ESD Ratings table, Detailed Descriptions, Feature Description, Device Functional Modes, Application and Implementation, Power Supply Recommendations, Device and Documentation Support, and Mechanical, Packaging, and Orderable InformationGo
- Deleted Features "FET short detection (TPS24752, TPS24753)"Go
- Changed the Application Schematic image. Deleted CVIN and D1Go
- Deleted devices TPS24752 and TPS24753 from the data sheetGo
- Deleted list item from the Overview section: "Internal MOSFET short detection (TPS24752/3 only)"Go
- Removed notes for pin 30 and 31 from the Functional Block DiagramGo
- Deleted section Fault Detection of Internal Mosfet ShortGo
- Changed Figure 40. Deleted CVIN and D1Go
- Changed text in STEP 3. Choose Output Voltage Rising Time, tON, and Timing Capacitor CT From: "maximum steady state junction temperature (TJDMAX = TA(MAX) + ILIM2 x R(DS)ON)." To: " maximum steady state junction temperature (TJDMAX = TA(MAX) + ILIM2 x R(DS)ON x RθJA)."Go
- Changed Figure 46 and Figure 47. Deleted CVIN and D1Go
- Added text and Figure 48 to System ExamplesGo
- Changed Figure 51Go
- Added Figure 52Go