SLVSE94G September 2018 – June 2024 TPS2663
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
During a transient output short-circuit event, the current through the device increases rapidly. As the current-limit amplifier cannot respond quickly to this event due to its limited bandwidth, the device incorporates a fast-trip comparator. The fast-trip comparator architecture is designed for fast turn-OFF tFASTTRIP(dly) = 1 µs (typical) with I(SCP) = 45 A of the internal FET during an output short-circuit event. The fast-trip threshold is internally set to I(FASTTRIP). The fast-trip circuit holds the internal FET off for only a few microseconds, after which the device turns back on slowly, allowing the current-limit loop to regulate the output current to I(OL). Then the device functions similar to the overload condition. Figure 8-14 illustrates output hot-short performance of the device.
VIN_SYS = 24 V | RILIM = 9.09 kΩ | |
The fast-trip comparator architecture has a supply line noise immunity resulting in a robust performance in noisy environments. This event is achieved by controlling the turn-OFF time of the internal FET based on the overcurrent level, I(FASTTRIP), through the device. The higher the overcurrent, the faster the turn-OFF time, tFASTTRIP(dly). At overload current level in the range of IFASTTRIP < IOUT < ISCP, the fast-trip comparator response is 3.2 μs (typical).