SLVSFW7 September 2022 TPS544C26
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
SUPPLY | ||||||
PVIN operating input range | 4 | 16 | V | |||
IQ(PVIN) | PVIN quiescent current | Non-switching, PVIN = 12 V, VEN = 0 V, no bias on VCC/VDRV pin | 6 | 7.9 | 9 | mA |
IVCC | VCC/VDRV external bias current | External 5 V bias on VCC/VDRV pin, regular switching. TJ = 25°C, PVIN = 12 V, IOUT = 35 A, VEN = 2 V, fSW = 0.6 MHz | 32.7 | mA | ||
IVCC | VCC/VDRV external bias current | External 5 V bias on VCC/VDRV pin, regular switching. TJ = 25°C, PVIN = 12 V, IOUT = 35 A, VEN = 2 V, fSW = 0.8 MHz | 39.7 | mA | ||
IVCC | VCC/VDRV external bias current | External 5 V bias on VCC/VDRV pin, regular switching. TJ = 25°C, PVIN = 12 V, IOUT = 35 A, VEN = 2 V, fSW = 1.0 MHz | 48.7 | mA | ||
IVCC | VCC/VDRV external bias current | External 5 V bias on VCC/VDRV pin, regular switching. TJ = 25°C, PVIN = 12 V, IOUT = 35 A, VEN = 2 V, fSW = 1.2 MHz | 57.3 | mA | ||
IQ(VCC) | VCC/VDRV quiescent current | External 5 V bias on VCC/VDRV pin, non-switching. PVIN = 12V, VEN = 2 V, VVOSNS = VO_Setting + 50 mV | 6 | 7.9 | 9 | mA |
UVLO | ||||||
PVINOV | PVIN overvoltage rising threshold | PVIN rising, register (55h) VIN_OV_FAULT_LIMIT = 00h | 16.3 | 16.9 | 17.5 | V |
PVINOV | PVIN overvoltage rising threshold | PVIN rising, register (55h) VIN_OV_FAULT_LIMIT = 01h | 18.0 | 18.6 | 19.2 | V |
PVINOV | PVIN overvoltage falling threshold | PVIN falling. PVIN_OVF status bit, once it is set, cannot be cleared unless PVIN falls below the PVIN overvoltage falling threshold |
12.9 | 13.4 | 13.9 | V |
VIN_ON | PVIN turn-on voltage | PVIN rising, register (35h) VIN_ON = 00h | 9.7 | 10 | 10.2 | V |
VIN_ON | PVIN turn-on voltage (1) | PVIN rising, register (35h) VIN_ON = 01h | 9 | V | ||
VIN_ON | PVIN turn-on voltage | PVIN rising, register (35h) VIN_ON = 02h | 7.8 | 8 | 8.2 | V |
VIN_ON | PVIN turn-on voltage | PVIN rising, register (35h) VIN_ON = 03h, VVCC = Internal LDO | 3.6 | 3.8 | 4.0 | V |
VIN_OFF | PVIN turn-off voltage | PVIN falling, register (36h) VIN_OFF = 00h | 4.0 | 4.2 | 4.4 | V |
VIN_OFF | PVIN turn-off voltage | PVIN falling, register (36h) VIN_OFF = 01h | 9.1 | 9.5 | 9.8 | V |
VIN_OFF | PVIN turn-off voltage (1) | PVIN falling, register (36h) VIN_OFF = 02h | 8.5 | V | ||
VIN_OFF | PVIN turn-off voltage (1) | PVIN falling, register (36h) VIN_OFF = 03h | 7.5 | V | ||
VIN_OFF | PVIN turn-off voltage (1) | PVIN falling, register (36h) VIN_OFF = 04h | 6.5 | V | ||
VIN_OFF | PVIN turn-off voltage (1) | PVIN falling, register (36h) VIN_OFF = 05h | 5.5 | V | ||
VIN_OFF | PVIN turn-off voltage | PVIN falling, register (36h) VIN_OFF = 06h | 4.0 | 4.2 | 4.4 | V |
VIN_OFF | PVIN turn-off voltage | PVIN falling, register (36h) VIN_OFF = 07h, VVCC = Internal LDO | 3.2 | 3.4 | 3.6 | V |
PVINUVLO(R) | PVIN UVLO rising threshold | PVIN rising, external 5 V bias on VCC/VDRV pin | 2.35 | 2.55 | 2.75 | V |
PVINUVLO(F) | PVIN UVLO falling threshold | PVIN falling, external 5 V bias on VCC/VDRV pin | 2.10 | 2.30 | 2.50 | V |
PVINUVLO(H) | PVIN UVLO hysteresis | 0.25 | V | |||
ENABLE | ||||||
VEN(R) | EN voltage rising threshold | EN rising, enable switching | 1.14 | 1.19 | 1.24 | V |
VEN(F) | EN voltage falling threshold | EN falling, disable switching | 0.94 | 0.98 | 1.02 | V |
VEN(H) | EN voltage hysteresis | 0.21 | V | |||
tEN(DIG) | EN Deglitch Time | 0.2 | µs | |||
EN internal pulldown resistor | VEN = 2 V, EN pin to AGND | 110 | 125 | 140 | kΩ | |
INTERNAL VCC LDO | ||||||
tdelay(uvlo_I2C) | Delay from VCC_OK to I2C ready to communicate (1) | VCC/VDRV >= 3 V | 300 | µs | ||
Internal VCC LDO output voltage | PVIN = 4 V, IVCC(load) = 5 mA | 3.925 | 3.97 | 4.0 | V | |
Internal VCC LDO output voltage | PVIN = 5 V to 16 V, IVCC(load) = 5 mA | 4.28 | 4.44 | 4.55 | V | |
VCC_OK rising threshold | TJ = –40°C to 85°C. VCC rising, enabling initial power-on including digital communication | 3.0 | 3.15 | 3.3 | V | |
VCC_OK falling threshold | TJ = –40°C to 85°C. VCC falling, disabling controller circuit including digital communication | 2.95 | 3.10 | 3.25 | V | |
VCC LDO dropout voltage | PVIN – VVCC, PVIN = 4 V, IVCC(load) = 50 mA | 184 | 300 | mV | ||
VCC LDO short-circuit current limit | 150 | mA | ||||
VOUT VOLTAGE | ||||||
Output Voltage controlled through SVID interface | Output voltage range by SetVID & SetWP commands | 0.5 | 3.04 | V | ||
Output Voltage controlled through SVID interface | Output voltage resolution by SetVID & SetWP commands | 5 | mV | |||
Output Voltage controlled through SVID interface | SVID fast slew rate, register (AFh) DVS_CFG = 02h | 2.5 | 2.78 | 3.06 | mV/µs | |
Output Voltage controlled through SVID interface | SVID fast slew rate, register (AFh) DVS_CFG = 04h | 5 | 5.5 | 6.1 | mV/µs | |
Output Voltage controlled through SVID interface | SVID fast slew rate, register (AFh) DVS_CFG = 06h | 10 | 11.1 | 12.2 | mV/µs | |
Output Voltage controlled through SVID interface | SVID OFFSET range | –128 | 127 | Step | ||
Output Voltage controlled through SVID interface | SVID OFFSET resolution | 1 | Step | |||
Output Voltage controlled through I2C interface | Output voltage range by register (A6h) VOUT_CMD | 0.5 | 3.04 | V | ||
Output Voltage controlled through I2C interface | Output voltage resolution by register (A6h) VOUT_CMD | 5 | mV | |||
Output Voltage controlled through I2C interface | Output voltage transition slew rate by register (A6h) VOUT_CMD, register (AFh) DVS_CFG = 02h | 0.625 | mV/µs | |||
Output Voltage controlled through I2C interface | Output voltage transition slew rate by register (A6h) VOUT_CMD, register (AFh) DVS_CFG = 04h | 1.25 | mV/µs | |||
Output Voltage controlled through I2C interface | Output voltage transition slew rate by register (A6h) VOUT_CMD, register (AFh) DVS_CFG = 06h | 2.5 | mV/µs | |||
Output Voltage controlled through I2C interface | I2C offset (register A8h) range, VOUT step = 5 mV | –64 | 63 | mV | ||
Output Voltage controlled through I2C interface | I2C offset (register A8h) resolution, VOUT step = 5 mV | 0.5 | mV | |||
Output Voltage controlled through I2C interface | I2C offset (register A8h) range, VOUT step = 10 mV | –128 | 127 | mV | ||
Output Voltage controlled through I2C interface | I2C offset (register A8h) resolution, VOUT step = 5 mV | 1.0 | mV | |||
VOUT(ACC) | Output voltage accuracy | TJ = 0°C to 85°C, VOUT_Setting = 0.75 V, VVOSNS–VGOSNS | 0.7425 | 0.75 | 0.7575 | V |
VOUT(ACC) | Output voltage accuracy | TJ = 0°C to 85°C, VOUT_Setting = 1.1 V, VVOSNS–VGOSNS | 1.0945 | 1.1 | 1.1055 | V |
VOUT(ACC) | Output voltage accuracy | TJ = 0°C to 85°C, VOUT_Setting = 1.8 V, VVOSNS–VGOSNS | 1.791 | 1.8 | 1.809 | V |
VOUT(ACC) | Output voltage accuracy | TJ = –40°C to 125°C, VOUT_Setting = 0.75 V, VVOSNS–VGOSNS | 0.739 | 0.75 | 0.761 | V |
VOUT(ACC) | Output voltage accuracy | TJ = –40°C to 125°C, VOUT_Setting = 1.1 V, VVOSNS–VGOSNS | 1.089 | 1.1 | 1.111 | V |
VOUT(ACC) | Output voltage accuracy | TJ = –40°C to 125°C, VOUT_Setting = 1.8 V, VVOSNS–VGOSNS | 1.782 | 1.8 | 1.818 | V |
IVOS | VOSNS input current | VVOSNS = 1.8 V | 120 | 130 | µA | |
SWITCHING FREQUENCY | ||||||
fSW(FCCM) | Switching frequency, FCCM operation | TJ = –40°C to 125°C, PVIN = 12 V, VOUT = 1.1 V, no load, register (33h) FREQUENCY_SWITCH = 00h | 510 | 600 | 660 | kHz |
fSW(FCCM) | Switching frequency, FCCM operation | TJ = –40°C to 125°C, PVIN = 12 V, VOUT = 1.1 V, no load, register (33h) FREQUENCY_SWITCH = 01h | 680 | 800 | 920 | kHz |
fSW(FCCM) | Switching frequency, FCCM operation | TJ = –40°C to 125°C, PVIN = 12 V, VOUT = 1.1 V, no load, register (33h) FREQUENCY_SWITCH = 02h | 850 | 1000 | 1150 | kHz |
fSW(FCCM) | Switching frequency, FCCM operation | TJ = –40°C to 125°C, PVIN = 12 V, VOUT = 1.1 V, no load, register (33h) FREQUENCY_SWITCH = 03h | 1020 | 1200 | 1440 | kHz |
STARTUP | ||||||
tON(DLY) | Power on sequence delay | VVCC = 4.5 V, register (60h) TON_DELAY = 00h | 0.5 | 0.55 | ms | |
tON(DLY) | Power on sequence delay | VVCC = 4.5 V, register (60h) TON_DELAY = 01h | 1.0 | 1.1 | ms | |
tON(DLY) | Power on sequence delay | VVCC = 4.5 V, register (60h) TON_DELAY = 02h | 1.5 | 1.65 | ms | |
tON(DLY) | Power on sequence delay | VVCC = 4.5 V, register (60h) TON_DELAY = 03h | 2.0 | 2.2 | ms | |
tOFF(DLY) | Power off sequence delay | VVCC = 4.5 V, register (64h) TOFF_DELAY = 00h | 0 | 0.02 | ms | |
tOFF(DLY) | Power off sequence delay | VVCC = 4.5 V, register (64h) TOFF_DELAY = 01h | 1.0 | 1.1 | ms | |
tOFF(DLY) | Power off sequence delay | VVCC = 4.5 V, register (64h) TOFF_DELAY = 02h | 1.5 | 1.65 | ms | |
tOFF(DLY) | Power off sequence delay | VVCC = 4.5 V, register (64h) TOFF_DELAY = 03h | 2.0 | 2.2 | ms | |
tON(Rise) | Soft-start time | VVCC = 4.5 V, register (61h) TON_RISE = 00h | 1.0 | 1.1 | ms | |
tON(Rise) | Soft-start time | VVCC = 4.5 V, register (61h) TON_RISE = 01h | 2.0 | 2.2 | ms | |
tON(Rise) | Soft-start time | VVCC = 4.5 V, register (61h) TON_RISE = 02h | 4.0 | 4.4 | ms | |
tON(Rise) | Soft-start time | VVCC = 4.5 V, register (61h) TON_RISE = 03h | 8.0 | 8.8 | ms | |
tON(Rise) | Soft-start time | VVCC = 4.5 V, register (61h) TON_RISE = 04h to 07h | 16.0 | 17.6 | ms | |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 00h, Vboot = 1.1V, PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | 2.2 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 01h, Vboot = 1.1V, PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | 1.1 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 02h, Vboot = 1.1V, PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | 0.55 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 03h, Vboot = 1.1V, PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | 0.275 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 00h, Vboot = 1.8V, PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | 3.6 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 01h, Vboot = 1.8V, PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | 1.8 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 02h, Vboot = 1.8V, PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | 0.9 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 03h, Vboot = 1.8V, PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | 0.45 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 00h, PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | 2.2 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 01h, PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | 1.1 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 02h, PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | 0.55 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 03h, PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | 0.275 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 00h, PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | 3.6 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 01h, PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | 1.8 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 02h, PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | 0.9 | V/ms | ||
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 03h, PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | 0.45 | V/ms | ||
POWER STAGE | ||||||
RDSON(HS) | High-side MOSFET on-resistance | TJ = 25°C, PVIN = 12 V, VBOOT-SW = 4.5 V | 4 | mΩ | ||
RDSON(HS) | High-side MOSFET on-resistance | TJ = 25°C, PVIN = 12 V, VBOOT-SW = 5.0 V | 3.91 | mΩ | ||
RDSON(LS) | Low-side MOSFET on-resistance | TJ = 25°C, PVIN = 12 V, VVCC = 4.5 V | 1 | mΩ | ||
RDSON(LS) | Low-side MOSFET on-resistance | TJ = 25°C, PVIN = 12 V, VVCC = 5 V | 0.98 | mΩ | ||
tON(min) | Minimum ON pulse width | VVCC = 4.5 V | 60 | ns | ||
tOFF(min) | Minimum OFF pulse width | VVCC = 4.5 V, IO=1.5A, VVOSNS = VOUT_Setting – 20 mV, SW falling edge to rising edge | 210 | 250 | ns | |
BOOT CIRCUIT | ||||||
IBOOT(LKG) | BOOT leakage current | VEN = 2 V, VBOOT-SW = 5 V | 150 | µA | ||
VBOOT-SW(UV_F) | BOOT-SW UVLO falling threshold | 2.60 | 2.76 | V | ||
OVERCURRENT LIMIT | ||||||
ILS(OC) | Low-side valley overcurrent limit | Valley current limit on LS FET, register (46h) IOUT_OC_FAULT_LIMIT = 00h | 8.5 | 10 | 11.5 | A |
ILS(OC) | Low-side valley overcurrent limit (1) | Valley current limit on LS FET, register (46h) IOUT_OC_FAULT_LIMIT = 01h | 10.2 | 12 | 13.8 | A |
ILS(OC) | Low-side valley overcurrent limit | Valley current limit on LS FET, register (46h) IOUT_OC_FAULT_LIMIT = 02h | 13.5 | 15 | 16.5 | A |
ILS(OC) | Low-side valley overcurrent limit (1) | Valley current limit on LS FET, register (46h) IOUT_OC_FAULT_LIMIT = 03h | 17.1 | 19 | 20.9 | A |
ILS(OC) | Low-side valley overcurrent limit | Valley current limit on LS FET, register (46h) IOUT_OC_FAULT_LIMIT = 04h | 18 | 20 | 22 | A |
ILS(OCL) | Low-side valley overcurrent limit | Valley current limit on LS FET, register (46h) IOUT_OC_FAULT_LIMIT = 05h | 22.5 | 25 | 27.5 | A |
ILS(OCL) | Low-side valley overcurrent limit (1) | Valley current limit on LS FET, register (46h) IOUT_OC_FAULT_LIMIT = 06h | 23.4 | 26 | 28.6 | A |
ILS(OCL) | Low-side valley overcurrent limit | Valley current limit on LS FET, register (46h) IOUT_OC_FAULT_LIMIT = 07h | 27 | 30 | 33 | A |
ILS(OCL) | Low-side valley overcurrent limit (1) | Valley current limit on LS FET, register (46h) IOUT_OC_FAULT_LIMIT = 08h | 29.7 | 33 | 36.3 | A |
ILS(OCL) | Low-side valley overcurrent limit | Valley current limit on LS FET, register (46h) IOUT_OC_FAULT_LIMIT = 09h | 31.5 | 35 | 38.5 | A |
ILS(OCL) | Low-side valley overcurrent limit (1) | Valley current limit on LS FET, register (46h) IOUT_OC_FAULT_LIMIT = 0Ah | 35.1 | 39 | 42.9 | A |
ILS(OCL) | Low-side valley overcurrent limit | Valley current limit on LS FET, register (46h) IOUT_OC_FAULT_LIMIT = 0Bh to 0Fh | 36 | 40 | 44 | A |
ILS(NOC) | Low-side negative overcurrent limit | Sinking current limit on LS FET, register (B4h) IOUT_NOC_LIMIT = 00h, ICCMAX ≥ 15A | –24 | –21 | –18 | A |
ILS(NOC) | Low-side negative overcurrent limit | Sinking current limit on LS FET, register (B4h) IOUT_NOC_LIMIT = 01h, ICCMAX ≥ 15A | –18 | –16 | –14 | A |
ILS(NOC) | Low-side negative overcurrent limit | Sinking current limit on LS FET, register (B4h) IOUT_NOC_LIMIT = 02h, ICCMAX ≥ 15A | –14.5 | –12.8 | –11 | A |
ILS(NOC) | Low-side negative overcurrent limit | Sinking current limit on LS FET, register (B4h) IOUT_NOC_LIMIT = 03h, ICCMAX ≥ 15A | –12.5 | –10.8 | –9 | A |
ILS(NOC) | Low-side negative overcurrent limit (1) | Sinking current limit on LS FET, register (B4h) IOUT_NOC_LIMIT = 00h, ICCMAX ≤ 10 A | –14 | –11.3 | –9 | A |
ILS(NOC) | Low-side negative overcurrent limit (1) | Sinking current limit on LS FET, register (B4h) IOUT_NOC_LIMIT = 01h, ICCMAX ≤ 10 A | –12 | –8.7 | –6 | A |
ILS(NOC) | Low-side negative overcurrent limit (1) | Sinking current limit on LS FET, register (B4h) IOUT_NOC_LIMIT = 02h, ICCMAX ≤ 10 A | –10 | –7.2 | –4.5 | A |
ILS(NOC) | Low-side negative overcurrent limit (1) | Sinking current limit on LS FET, register (B4h) IOUT_NOC_LIMIT = 03h, ICCMAX ≤ 10 A | –8.5 | –6.2 | –3.9 | A |
IZC | Zero-cross detection current threshold | ZC comparator threshold, enter DCM. PVIN = 12 V, VVCC = 4.5 V, | 900 | mA | ||
Response delay before entering Hiccup | UVF RESPONSE_DELAY = 00b | 2 | 4 | µs | ||
Response delay before entering Hiccup | UVF RESPONSE_DELAY = 01b | 16 | 20 | µs | ||
Response delay before entering Hiccup | UVF RESPONSE_DELAY = 10b | 64 | 80 | µs | ||
Response delay before entering Hiccup | UVF RESPONSE_DELAY = 11b | 256 | 320 | µs | ||
Hiccup sleep time before a restart | 49 | 56 | 59 | ms | ||
OUTPUT OVP AND UVP | ||||||
VOVF | VOUT tracking overvoltage fault (OVF) threshold, offset above VOUT setting value | (VOSNS – GOSNS) rising. Register (40h) VOUT_OV_FAULT_LIMIT = 00h | 80 | 100 | 120 | mV |
VOVF | VOUT tracking overvoltage fault (OVF) threshold, offset above VOUT setting value | (VOSNS – GOSNS) rising. Register (40h) VOUT_OV_FAULT_LIMIT = 01h | 120 | 150 | 180 | mV |
VOVF | VOUT tracking overvoltage fault (OVF) threshold, offset above VOUT setting value | (VOSNS – GOSNS) rising. Register (40h) VOUT_OV_FAULT_LIMIT = 02h | 160 | 200 | 240 | mV |
VOVF | VOUT tracking overvoltage fault (OVF) threshold, offset above VOUT setting value | (VOSNS – GOSNS) rising. Register (40h) VOUT_OV_FAULT_LIMIT = 03h | 240 | 300 | 360 | mV |
VOVW | VOUT tracking overvoltage warning (OVW) threshold, offset above VOUT setting value | (VOSNS – GOSNS) rising. Register (42h) VOUT_OV_WARN_LIMIT = 00h | 80 | 100 | 120 | mV |
VOVW | VOUT tracking overvoltage warning (OVW) threshold, offset above VOUT setting value | (VOSNS – GOSNS) rising. Register (42h) VOUT_OV_WARN_LIMIT = 01h | 120 | 150 | 180 | mV |
VOVW | VOUT tracking overvoltage warning (OVW) threshold, offset above VOUT setting value | (VOSNS – GOSNS) rising. Register (42h) VOUT_OV_WARN_LIMIT = 02h | 160 | 200 | 240 | mV |
VOVW | VOUT tracking overvoltage warning (OVW) threshold, offset above VOUT setting value | (VOSNS – GOSNS) rising. Register (42h) VOUT_OV_WARN_LIMIT = 03h | 240 | 300 | 360 | mV |
VFixOVF | VOUT fixed OVF threshold, VOUT step = 5 mV | (VOSNS – GOSNS) rising. SEL_FIX_OVF = 0b, PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | 1.425 | 1.5 | 1.575 | V |
VFixOVF | VOUT fixed OVF threshold, VOUT step = 5 mV | (VOSNS – GOSNS) rising. SEL_FIX_OVF = 1b, PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | 1.71 | 1.8 | 1.89 | V |
VFixOVF | VOUT fixed OVF threshold, VOUT step = 10 mV | (VOSNS – GOSNS) rising. SEL_FIX_OVF = 0b, PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | 2.3 | 2.4 | 2.47 | V |
VFixOVF | VOUT fixed OVF threshold, VOUT step = 10 mV | (VOSNS – GOSNS) rising. SEL_FIX_OVF = 1b, PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | 2.85 | 3.0 | 3.07 | V |
VUVF | VOUT tracking undervoltage fault (UVF) threshold, offset below VOUT setting value | (VOSNS – GOSNS) falling. Register (44h) VOUT_UV_FAULT_LIMIT = 00h | –180 | –150 | –120 | mV |
VUVF | VOUT tracking undervoltage fault (UVF) threshold, offset below VOUT setting value | (VOSNS – GOSNS) falling. Register (44h) VOUT_UV_FAULT_LIMIT = 01h | –240 | –200 | –160 | mV |
VUVF | VOUT tracking undervoltage fault (UVF) threshold, offset below VOUT setting value | (VOSNS – GOSNS) falling. Register (44h) VOUT_UV_FAULT_LIMIT = 02h | –240 | –200 | –160 | mV |
VUVF | VOUT tracking undervoltage fault (UVF) threshold, offset below VOUT setting value | (VOSNS – GOSNS) falling. Register (44h) VOUT_UV_FAULT_LIMIT = 03h | –360 | –300 | –240 | mV |
VUVW | VOUT tracking undervoltage warning (UVW) threshold, offset below VOUT setting value | (VOSNS – GOSNS) falling. Register (43h) VOUT_UV_WARN_LIMIT = 00h | –120 | –100 | –80 | mV |
VUVW | VOUT tracking undervoltage warning (UVW) threshold, offset below VOUT setting value | (VOSNS – GOSNS) falling. Register (43h) VOUT_UV_WARN_LIMIT = 01h | –180 | –150 | –120 | mV |
VUVW | VOUT tracking undervoltage warning (UVW) threshold, offset below VOUT setting value | (VOSNS – GOSNS) falling. Register (43h) VOUT_UV_WARN_LIMIT = 02h | –240 | –200 | –160 | mV |
VUVW | VOUT tracking undervoltage warning (UVW) threshold, offset below VOUT setting value | (VOSNS – GOSNS) falling. Register (43h) VOUT_UV_WARN_LIMIT = 03h | –360 | –300 | –240 | mV |
VOUT tracking UVF response delay time | UVF RESPONSE_DELAY = 00b. From UVF detection to tri-state of the power FETs | 2 | 4 | µs | ||
VOUT tracking UVF response delay time | UVF RESPONSE_DELAY = 01b. From UVF detection to tri-state of the power FETs | 16 | 20 | µs | ||
VOUT tracking UVF response delay time | UVF RESPONSE_DELAY = 10b. From UVF detection to tri-state of the power FETs | 64 | 80 | µs | ||
VOUT tracking UVF response delay time | UVF RESPONSE_DELAY = 11b. From UVF detection to tri-state of the power FETs | 256 | 320 | µs | ||
VR READY AND CATASTROPHIC FAULT | ||||||
VOL(VRRDY) | VRRDY pin output low-level voltage | IVRRDY = 10 mA, PVIN = 12 V, VVCC = 4.5 V | 300 | mV | ||
ILKG(VRRDY) | VRRDY pin Leakage current when open drain output is high | Rpullup = 10 kΩ, VVRRDY = 5 V | 5 | µA | ||
Minimum VCC for valid VRRDY pin output | PVIN = 0 V, VEN = 0 V, Rpullup = 10 kΩ, VVRRDY ≤ 0.3 V | 1.2 | V | |||
CAT_FAULT# pin output low-level voltage | Rpullup = 4.99 kΩ, Vpullup = 3.3 V | 210 | 300 | mV | ||
CAT_FAULT# pin Leakage current when open drain output is high | Rpullup = 4.99 kΩ, Vpullup = 3.3 V | 5 | µA | |||
OUTPUT DISCHARGE | ||||||
Output discharge on VOSNS pin | PVIN = 12 V, VVCC = 4.5 V, VVOSNS = 0.5 V, EN=0V | 1.15 | 1.47 | 1.85 | kΩ | |
THERMAL SHUTDOWN | ||||||
TJ(SD) | Thermal shutdown (Analog OTP) threshold (1) | Junction temperature rising | 153 | 166 | °C | |
TJ(HYS) | Thermal shutdown (Analog OTP) hysteresis (1) | 30 | °C | |||
MEASUREMENT SYSTEM (I2C) | ||||||
MIOUT(rng) | Output current measurement range | Register (C0h) ICC_MAX = 07h (40 A) | 0 | 40 | A | |
MIOUT(acc) | Output current measurement accuracy (2) | Register (C0h) ICC_MAX = 07h (40 A), 0 ≤ IOUT ≤ 4 A | –0.7 | 0.7 | A | |
MIOUT(acc) | Output current measurement accuracy (2) | Register (C0h) ICC_MAX = 07h (40 A), IOUT = 12 A |
–8% | 8% | ||
MIOUT(acc) | Output current measurement accuracy (2) | Register (C0h) ICC_MAX = 07h (40 A), 24 A ≤ IOUT < 40 A |
–6% | 6% | ||
MIOUT(lsb) | Output current measurement bit resolution | Register (C0h) ICC_MAX = 07h (40 A) | 0.15686 | A | ||
MVOUT(rng) | Output voltage measurement range | PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | 0 | 1.6 | V | |
MVOUT(rng) | Output voltage measurement range | PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | 0 | 3.2 | V | |
MVOUT(acc) | Output voltage measurement accuracy | 0.75 V ≤ VOUT ≤ 1.52 V, PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | –18.75 | 18.75 | mV | |
MVOUT(acc) | Output voltage measurement accuracy | 0.75 V ≤ VOUT ≤ 3.04 V, PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | –37.5 | 37.5 | mV | |
MVOUT(lsb) | Output voltage measurement bit resolution | PROTOCOL_ID = 01b or 10b (VOUT step = 5 mV) | 6.25 | mV | ||
MVOUT(lsb) | Output voltage measurement bit resolution | PROTOCOL_ID = 00b or 11b (VOUT step = 10 mV) | 12.5 | mV | ||
MPIN(rng) | Input power measurement range | (6Bh) PIN_OP_WARN_LIMIT = 00h (510 W) | 0 | 510 | W | |
MPIN(acc) | Input power measurement accuracy (3) | TJ = 25 ℃, VIN = 12 V, IIN = 15 A, register (6Bh) PIN_OP_WARN_LIMIT = 03h (360 W), register (B3h) PIN_SENSE_RES = 03h (RSENSE = 1.0 mΩ, IIN_MAX = 40 A) | 174 | W | ||
MPIN(acc) | Input power measurement accuracy (3) | TJ = 25 ℃, VIN = 12 V, IIN = 20 A, register (6Bh) PIN_OP_WARN_LIMIT = 03h (360 W), register (B3h) PIN_SENSE_RES = 03h (RSENSE = 1.0 mΩ, IIN_MAX = 40 A) | 233.4 | W | ||
MPIN(acc) | Input power measurement accuracy (3) | TJ = 25 ℃, VIN = 12 V, IIN = 25 A, register (6Bh) PIN_OP_WARN_LIMIT = 03h (360 W), register (B3h) PIN_SENSE_RES = 03h (RSENSE = 1.0 mΩ, IIN_MAX = 40 A) | 292.8 | W | ||
MPIN(acc) | Input power measurement accuracy (3) | TJ = 25 ℃, VIN = 12 V, IIN = 15 A, register (6Bh) PIN_OP_WARN_LIMIT = 03h (360 W), register (B3h) PIN_SENSE_RES = 05h (RSENSE = 0.5 mΩ, IIN_MAX = 40 A) | 171 | W | ||
MPIN(acc) | Input power measurement accuracy (3) | TJ = 25 ℃, VIN = 12 V, IIN = 20 A, register (6Bh) PIN_OP_WARN_LIMIT = 03h (360 W), register (B3h) PIN_SENSE_RES = 05h (RSENSE = 0.5 mΩ, IIN_MAX = 40 A) | 230.4 | W | ||
MPIN(acc) | Input power measurement accuracy (3) | TJ = 25 ℃, VIN = 12 V, IIN = 25 A, register (6Bh) PIN_OP_WARN_LIMIT = 03h (360 W), register (B3h) PIN_SENSE_RES = 05h (RSENSE = 0.5 mΩ, IIN_MAX = 40 A) | 289.8 | W | ||
MPIN(lsb) | Input power measurement bit resolution | (6Bh) PIN_OP_WARN_LIMIT = 03h (360 W) | 1.412 | W | ||
MVIN(rng) | Input voltage measurement range | VINSNSM – PGND. READ_VIN reporting range | 8 | 16 | V | |
MVIN(acc) | Input voltage measurement accuracy | 10 V ≤ VINSNSM – PGND ≤ 14 V | –0.5% | 0.5% | ||
MVIN(lsb) | Input voltage measurement bit resolution | VINSNSM – PGND | 31.25 | mV | ||
MIIN(rng) | Input current measurement range | Register (B3h) PIN_SENSE_RES = 03h or 05h | 0 | 40 | A | |
MIIN(acc) | Input current measurement accuracy (3) | TJ = 25 ℃, VIN = 12 V, IIN = 15 A, register (B3h) PIN_SENSE_RES = 03h (RSENSE = 1.0 mΩ, IIN_MAX = 40 A) | 14.5 | A | ||
MIIN(acc) | Input current measurement accuracy (3) | TJ = 25 ℃, VIN = 12 V, IIN = 20 A, register (B3h) PIN_SENSE_RES = 03h (RSENSE = 1.0 mΩ, IIN_MAX = 40 A) | 19.45 | A | ||
MIIN(acc) | Input current measurement accuracy (3) | TJ = 25 ℃, VIN = 12 V, IIN = 25 A, register (B3h) PIN_SENSE_RES = 03h (RSENSE = 1.0 mΩ, IIN_MAX = 40 A) | 24.4 | A | ||
MIIN(acc) | Input current measurement accuracy (3) | TJ = 25 ℃, VIN = 12 V, IIN = 15 A, register (B3h) PIN_SENSE_RES = 05h (RSENSE = 0.5 mΩ, IIN_MAX = 40 A) | 14.25 | A | ||
MIIN(acc) | Input current measurement accuracy (3) | TJ = 25 ℃, VIN = 12 V, IIN = 20 A, register (B3h) PIN_SENSE_RES = 05h (RSENSE = 0.5 mΩ, IIN_MAX = 40 A) | 19.2 | A | ||
MIIN(acc) | Input current measurement accuracy (3) | TJ = 25 ℃, VIN = 12 V, IIN = 25 A, register (B3h) PIN_SENSE_RES = 05h (RSENSE = 0.5 mΩ, IIN_MAX = 40 A) | 24.15 | A | ||
MIIN(lsb) | Input current measurement bit resolution | 0.15625 | A | |||
MTSNS(rng) | Internal temperature sense range | Temperature sensor on the Controller die | –40 | 125 | °C | |
MTSNS(acc) | Internal temperature sense accuracy | –40°C ≤ TJ ≤ 125°C | –5 | 5 | °C | |
MTSNS(lsb) | Internal temperature sense bit resolution | 1 | °C | |||
SVID Timing and Physical Characteristics | ||||||
CPAD_SVID | SVID pin pad capacitance (1) | 0 | 4 | pF | ||
CPIN_SVID | SVID pin capacitance (1) | 0 | 5 | pF | ||
VMAX_SVID | VDS max open drain buffer to accommodate ringing on bus | –1 | 3.3 | V | ||
VIL_SVID | SV_CLK, SV_DIO input low voltage | 0.45 | 0.5 | 0.55 | V | |
VIH_SVID | SV_CLK, SV_DIO input high voltage | 0.54 | 0.59 | 0.64 | V | |
VHYS_SVID | SV_CLK, SV_DIO input voltage hysteresis | 0.05 | V | |||
RRSVIDL | Open Drain Pulldown resistance | SV_DIO, SV_ALERT# pins pulldown resistance | 4 | 8 | 13 | Ω |
ILKG_SVID | Input leakage current | Pullup source = 5.5 V, off state | 20 | µA | ||
DCLK_SVID | SVID clock duty ratios (Period and duty cycle are measured with respect to 0.5 x VccIO) | 0.4 | 0.6 | |||
tCO_VR_SVID | VR Clock to Data delay without board parasitic | 12 | ns | |||
tSU_VR_SVID | Setup time of data at VR side | 7 | ns | |||
tH_VR_SVID | Hold time of data at VR side | 14 | ns | |||
tCO_CPU_SVID | CPU Clock to Data delay | –3.6 | 0.65 | ns | ||
tSU_CPU_SVID | Setup time of data at CPU side | 1 | ns | |||
tH_CPU_SVID | Hold time of data at CPU side | 3 | ns | |||
SRF_DATA | Falling slew rate of SV_DIO (1) | SV_DIO from 0.735V to 0.315V, Rpu=64.9Ω | 1.2 | 4 | V/ns | |
SRR_DATA | Rising slew rate of SV_DIO (1) | SV_DIO from 0.315V to 0.735V, Rpu=64.9Ω | 1.1 | 3.6 | V/ns | |
SRF_ALERT | Falling slew rate of SV_ALERT# (1) | SV_ALERT# from 0.735V to 0.315V, Rpu=75Ω | 1.25 | 4.2 | V/ns | |
SRR_ALERT | Rising slew rate of SV_ALERT# (1) | SV_ALERT# from 0.315V to 0.735V, Rpu=75Ω | 1.15 | 3.3 | V/ns | |
FREQSVID | Max SVID Clock frequency Support | 43 | MHz | |||
I2C Timing and Physical Characteristics | ||||||
FREQI2C | I2C operating frequency range | 50 | 1000 | kHz | ||
VIH_I2C | I2C_SCL, I2C_SDA High-level input voltage | 0.535 | 0.585 | 0.635 | V | |
VIL_I2C | I2C_SCL, I2C_SDA Low-level input voltage | 0.465 | 0.515 | 0.565 | V | |
VHYS_I2C | I2C_SCL, I2C_SDA Input voltage hysteresis | 0.05 | V | |||
NWRNVM | Number of NVM writeable cycles (1) | –40°C ≤ TJ ≤ 125°C | 1000 | Cycles | ||
CBUS_I2C | I2C bus capacitance on each bus line (1) | 0 | 400 | pF | ||
CPIN_I2C | I2C pin capacitance (1) | 0 | 10 | pF | ||
tH_STA | Hold time for a (repeated) START condition | 0.26 | µs | |||
tLOW | Low period of I2C_SCL | 0.5 | µs | |||
tHIGH | High period of I2C_SCL | 0.26 | µs | |||
tSU_STA | Setup time for a repeated START condition | 0.26 | µs | |||
tH_I2C | I2C DATA hold time | 0 | µs | |||
tSU_I2C | I2C DATA setup time | 50 | ns | |||
tR_I2C | I2C_SCL and I2C_SDA rise time (1) | 100 kHz class | 1000 | ns | ||
400 kHz class | 300 | ns | ||||
1000 kHz class | 120 | ns | ||||
tF_I2C | I2C_SCL and I2C_SDA fall time (1) | 100 kHz class | 1000 | ns | ||
400 kHz class | 300 | ns | ||||
1000 kHz class | 120 | ns | ||||
tSU_STO | Setup time for a STOP condition | 0.26 | µs | |||
tBUF | Bus free time between a STOP and START condition | 0.5 | µs |