4 Revision History
Changes from Revision C (January 2023) to Revision D (November 2023)
- Change ESD level to C3 per the latest standard in
FeaturesGo
- Change device temperature grade from 0 to 1 in
FeaturesGo
Changes from Revision B (March 2020) to Revision C (January 2023)
- Added AEC-Q100 sub bullets to FeaturesGo
- Added Safety-related certifications to FeaturesGo
- Added what to do with unused pins to pin functions
table.Go
- Changed recommended value of decoupling capacitors. Go
- Added recommended decoupling capacitor layout placement. Go
- Changed
test conditions per DIN EN IEC 60747-17 (VDE
0884-17)
Go
- Changed Ichg lower limit to 430uAGo
- Changed
VAin lower limit to 0.6VGo
- Changed direction of ICLMPI in VCLP-CLMPI test
conditionGo
- Added test condition for soft turn-off currentGo
- Deleted short circuit clamping max conditionGo
- Changed VDE and UL to certifiedGo
- Changed DESAT figureGo
- Changed DESAT soft turn-off figureGo
- Added function state showing gate driver turning on. Changed RDY
condition when VCC is PD. Go
Changes from Revision A (March 2020) to Revision B (March 2020)
- Deleted test voltage, 9600V, from
value columnGo
Changes from Revision * (September 2019) to Revision A (March 2020)
- Changed marketing status from Advance Information to production data. Go