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Data Sheet
AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors
1 Features
- 256 channels
- On-chip, 16-bit ADC
- High performance:
- Noise: 440 electrons RMS
(1.2-pC input charge range) - Low correlated noise
- Full-channel integral nonlinearity:
±2 LSB at 16 bit - Scan time: < 16 μs to 204.8 μs
- Integration:
- Programmable full-scale input charge range:
0.3pC to 12.5pC with resolution of 0.3pC - Internal timing generator (TG)
- Built-in correlated double sampler
- Software programmable electron or hole integration mode
- Pipelined integrate-and-read for improved throughput—data-read during integration
- Serial LVDS output
- On-chip temperature sensor
- Simple power supply scheme:
- Single 1.85V power supply operation
- Multiple power modes with power consumption ranging from 1mW/ch to 2mW/ch
- Power-down modes: sleep and standby
- Binning mode support
- Custom chip-on-film (COF) packages
