Driver or library
AFE3256-DESIGN — AFE3256 design files
AFE3256 datasheet, COF package drawings, EVM GUI/user guide and other design resources
AFE3256
256-channel analog front end (AFE) for dynamic and semi-dynamic X-ray flat-panel detectors
Data sheet
AFE3256
- 256 channels
- On-chip, 16-bit ADC
- High performance:
- Noise: 440 electrons RMS (1.2-pC input charge range)
- Low correlated noise
- Full-channel integral nonlinearity: ±2 LSB at 16 bit
- Scan time: < 16 µs to 204.8 µs
- Integration:
- Programmable full-scale input charge range: 0.3pC to 12.5pC with resolution of 0.3pC
- Internal timing generator (TG)
- Built-in correlated double sampler
- Software programmable electron or hole integration mode
- Pipelined integrate-and-read for improved throughput—data-read during integration
- Serial LVDS output
- On-chip temperature sensor
- Simple power supply scheme:
- Single 1.85V power supply operation
- Multiple power modes with power consumption ranging from 1mW/ch to 2mW/ch
- Power-down modes: sleep and standby
- Binning mode support
- Custom chip-on-film (COF) packages
The AFE3256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detector (FPD) based digital X-ray systems. The device includes 256 integrators, correlated double samplers (CDSs) with dual banking, and 256:2 analog multiplexers. The device also features two 16-bit successive-approximation register (SAR) analog-to-digital converters (ADCs). Serial data from the ADCs are available in low-voltage differential signaling (LVDS) format.
The device, also commonly referred to as a readout integrated circuit (ROIC), optimizes the overall system performance using features such as multiple power modes and in-system debug options.
The sleep and standby modes enable substantial power saving which is critical for battery-powered systems.
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Technical documentation
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View all 3 | Type | Title | Date | ||
|---|---|---|---|---|
| * | Data sheet | AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors datasheet (Rev. A) | PDF | HTML | 24 Apr 2024 |
| Certificate | AFE3256EVM EU Declaration of Conformity (DoC) | 18 Sep 2023 | ||
| Analog Design Journal | Selecting a multichannel ultra-low-current measurement IC | PDF | HTML | 18 Mar 2022 |
Design & development
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Evaluation board
AFE3256EVM — AFE3256 evaluation module for 256-channel analog front end (AFE) for X-ray flat-panel detectors
The AFE3256 evaluation module (EVM) is used to evaluate the AFE3256 device, a low-power, low-noise charge readout IC (charge to digital converter) in chip-on-flex (COF) package. The EVM comprises an analog board, which seamlessly integrates with the TSWDC155EVM (FPGA EVM) for data capture. The EVM (...)
Simulation tool
PSPICE-FOR-TI — PSpice® for TI design and simulation tool
PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
| Package | Pins | CAD symbols, footprints & 3D models |
|---|---|---|
| COF (TFU) | 320 | Ultra Librarian |
| COF (TFV) | 315 | Ultra Librarian |
Ordering & quality
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