Refer to the PDF data sheet for device specific package drawings
This –8 V, 8.2 mΩ, 1.5 mm × 1.5 mm device is designed to deliver the lowest on resistance and gate charge in the smallest outline possible with excellent thermal characteristics in an ultra low profile. Low on-resistance coupled with the small footprint and low profile make the device ideal for battery operated space constrained applications.
TA = 25°C | TYPICAL VALUE | UNIT | ||
---|---|---|---|---|
VDS | Drain-to-Source Voltage | –8 | V | |
Qg | Gate Charge Total (–4.5 V) | 18.9 | nC | |
Qgd | Gate Charge Gate-to-Drain | 4.2 | nC | |
RDS(on) | Drain-to-Source On-Resistance | VGS = –2.5 V | 11.5 | mΩ |
VGS = –4.5 V | 8.2 | mΩ | ||
VGS(th) | Threshold Voltage | –0.7 | V |
Device | Qty | Media | Package | Ship |
---|---|---|---|---|
CSD22204W | 3000 | 7-Inch Reel | 1.5 mm × 1.5 mm Wafer BGA Package | Tape and Reel |
CSD22204WT | 250 | 7-Inch Reel |
TA = 25°C | VALUE | UNIT | |
---|---|---|---|
VDS | Drain-to-Source Voltage | –8 | V |
VGS | Gate-to-Source Voltage | –6 | V |
ID | Continuous Drain Current(1) | –5 | A |
Pulsed Drain Current(2) | –80 | A | |
PD | Power Dissipation | 1.7 | W |
TJ, Tstg |
Operating Junction and Storage Temperature Range |
–55 to 150 | °C |
RDS(on) vs VGS![]() |
Gate Charge![]() |
DATE | REVISION | NOTES |
---|---|---|
March 2015 | * | Initial release. |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
STATIC CHARACTERISTICS | |||||||
BVDSS | Drain-to-Source Voltage | VGS = 0 V, IDS = –250 μA | –8 | V | |||
BVGSS | Gate-to-Source Voltage | VDS = 0 V, IG = –5 μA | –6 | V | |||
IDSS | Drain-to-Source Leakage Current | VGS = 0 V, VDS = –6.4 V | –1 | μA | |||
IGSS | Gate-to-Source Leakage Current | VDS = 0 V, VGS = –6 V | –4 | μA | |||
VGS(th) | Gate-to-Source Threshold Voltage | VDS = VGS, IDS = –250 μA | –0.45 | –0.7 | –0.95 | V | |
RDS(on) | Drain-to-Source On-Resistance | VGS = –2.5 V, IDS = –2 A | 11.5 | 14.0 | mΩ | ||
VGS = –4.5 V, IDS = –2 A | 8.2 | 9.9 | mΩ | ||||
gƒs | Transconductance | VDS = –0.8 V, IDS = –2 A | 18 | S | |||
DYNAMIC CHARACTERISTICS | |||||||
CISS | Input Capacitance | VGS = 0 V, VDS = –4 V, ƒ = 1 MHz |
870 | 1130 | pF | ||
COSS | Output Capacitance | 445 | 580 | pF | |||
CRSS | Reverse Transfer Capacitance | 204 | 265 | pF | |||
RG | Series Gate Resistance | 300 | Ω | ||||
Qg | Gate Charge Total (–4.5 V) | VDS = –4 V, ID = –2 A |
18.9 | 24.6 | nC | ||
Qgd | Gate Charge - Gate-to-Drain | 4.2 | nC | ||||
Qgs | Gate Charge - Gate-to-Source | 3.2 | nC | ||||
Qg(th) | Gate Charge at Vth | 0.7 | nC | ||||
QOSS | Output Charge | VDS = –4 V, VGS = 0 V | 3.1 | nC | |||
td(on) | Turn On Delay Time | VDS = –4 V, VGS = –4.5 V, IDS = –2 A, RG = 0 Ω |
58 | ns | |||
tr | Rise Time | 600 | ns | ||||
td(off) | Turn Off Delay Time | 3450 | ns | ||||
tƒ | Fall Time | 2290 | ns | ||||
DIODE CHARACTERISTICS | |||||||
VSD | Diode Forward Voltage | IDS = –2 A, VGS = 0 V | –0.7 | –1.0 | V |
THERMAL METRIC | TYPCIAL VALUES | UNIT | |||
---|---|---|---|---|---|
RθJA | Junction-to-Ambient Thermal Resistance(1) | 75 | °C/W | ||
Junction-to-Ambient Thermal Resistance(2) | 230 |
![]() |
Typ RθJA = 75°C/W when mounted on 1inch2 of 2 oz. Cu. |
![]() |
Typ RθJA = 230°C/W when mounted on minimum pad area of 2 oz. Cu. |
ID = –2 A | VDS = –4 V | |
ID = –250 µA | ||
ID = –2 A | ||
Single Pulse, Max RθJA = 75°C/W | ||
VDS = –4 V | ||
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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.