JAJSDJ8A April   2017  – October 2021 ADC12D1620QML-SP

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Converter Electrical Characteristics: Static Converter Characteristics
    6. 6.6  Converter Electrical Characteristics: Dynamic Converter Characteristics
    7. 6.7  Converter Electrical Characteristics: Analog Input/Output and Reference Characteristics
    8. 6.8  Converter Electrical Characteristic: Channel-to-Channel Characteristics
    9. 6.9  Converter Electrical Characteristics: LVDS CLK Input Characteristics
    10. 6.10 Electrical Characteristics: AutoSync Feature
    11. 6.11 Converter Electrical Characteristics: Digital Control and Output Pin Characteristics
    12. 6.12 Converter Electrical Characteristics: Power Supply Characteristics
    13. 6.13 Converter Electrical Characteristics: AC Electrical Characteristics
    14. 6.14 Electrical Characteristics: Delta Parameters
    15. 6.15 Timing Requirements: Serial Port Interface
    16. 6.16 Timing Requirements: Calibration
    17. 6.17 Quality Conformance Inspection
    18. 6.18 Timing Diagrams
    19. 6.19 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
      1. 7.1.1 Operation Summary
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Input Control and Adjust
        1. 7.3.1.1 AC- and DC-Coupled Modes
        2. 7.3.1.2 Input Full-Scale Range Adjust
        3. 7.3.1.3 Input Offset Adjust
        4. 7.3.1.4 Low-Sampling Power-Saving Mode (LSPSM)
        5. 7.3.1.5 DES Timing Adjust
        6. 7.3.1.6 Sampling Clock Phase Adjust
      2. 7.3.2 Output Control and Adjust
        1. 7.3.2.1 SDR / DDR Clock
        2. 7.3.2.2 LVDS Output Differential Voltage
        3. 7.3.2.3 LVDS Output Common-Mode Voltage
        4. 7.3.2.4 Output Formatting
        5. 7.3.2.5 Test-Pattern Mode
        6. 7.3.2.6 Time Stamp
      3. 7.3.3 Calibration Feature
        1. 7.3.3.1 Calibration Control Pins and Bits
        2. 7.3.3.2 How to Execute a Calibration
        3. 7.3.3.3 On-Command Calibration
        4. 7.3.3.4 Calibration Adjust
          1. 7.3.3.4.1 Read/Write Calibration Settings
        5. 7.3.3.5 Calibration and Power-Down
        6. 7.3.3.6 Calibration and the Digital Outputs
      4. 7.3.4 Power Down
      5. 7.3.5 Low-Sampling Power-Saving Mode (LSPSM)
    4. 7.4 Device Functional Modes
      1. 7.4.1 DES/Non-DES Mode
      2. 7.4.2 Demux/Non-Demux Mode
    5. 7.5 Programming
      1. 7.5.1 Control Modes
        1. 7.5.1.1 Non-ECM
          1. 7.5.1.1.1  Dual-Edge Sampling Pin (DES)
          2. 7.5.1.1.2  Non-Demultiplexed Mode Pin (NDM)
          3. 7.5.1.1.3  Dual Data-Rate Phase Pin (DDRPh)
          4. 7.5.1.1.4  Calibration Pin (CAL)
          5. 7.5.1.1.5  Low-Sampling Power-Saving Mode Pin (LSPSM)
          6. 7.5.1.1.6  Power-Down I-Channel Pin (PDI)
          7. 7.5.1.1.7  Power-Down Q-Channel Pin (PDQ)
          8. 7.5.1.1.8  Test-Pattern Mode Pin (TPM)
          9. 7.5.1.1.9  Full-Scale Input-Range Pin (FSR)
          10. 7.5.1.1.10 AC- or DC-Coupled Mode Pin (VCMO)
          11. 7.5.1.1.11 LVDS Output Common-Mode Pin (VBG)
        2. 7.5.1.2 Extended Control Mode
          1. 7.5.1.2.1 Serial Interface
    6. 7.6 Register Maps
      1. 7.6.1 Register Definitions
  8. 8 Application Information Disclaimer
    1. 8.1 Application Information
      1. 8.1.1 Analog Inputs
        1. 8.1.1.1 Acquiring the Input
        2. 8.1.1.2 Driving the ADC in DES Mode
        3. 8.1.1.3 FSR and the Reference Voltage
        4. 8.1.1.4 Out-Of-Range Indication
        5. 8.1.1.5 AC-Coupled Input Signals
        6. 8.1.1.6 DC-Coupled Input Signals
        7. 8.1.1.7 Single-Ended Input Signals
      2. 8.1.2 Clock Inputs
        1. 8.1.2.1 CLK Coupling
        2. 8.1.2.2 CLK Frequency
        3. 8.1.2.3 CLK Level
        4. 8.1.2.4 CLK Duty Cycle
        5. 8.1.2.5 CLK Jitter
        6. 8.1.2.6 CLK Layout
      3. 8.1.3 LVDS Outputs
        1. 8.1.3.1 Common-Mode and Differential Voltage
        2. 8.1.3.2 Output Data Rate
        3. 8.1.3.3 Terminating Unused LVDS Output Pins
      4. 8.1.4 Synchronizing Multiple ADC12D1620 Devices in a System
        1. 8.1.4.1 AutoSync Feature
        2. 8.1.4.2 DCLK Reset Feature
      5. 8.1.5 Temperature Sensor
    2. 8.2 Radiation Environments
      1. 8.2.1 Total Ionizing Dose
      2. 8.2.2 Single Event Latch-Up and Functional Interrupt
      3. 8.2.3 Single Event Upset
    3. 8.3 Cold Sparing
  9. 9 Power Supply Recommendations
    1. 9.1 System Power-On Considerations
      1. 9.1.1 Control Pins
      2. 9.1.2 Power On in Non-ECM
      3. 9.1.3 Power On in ECM
      4. 9.1.4 Power-on and Data Clock (DCLK)
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 Power Planes
      2. 10.1.2 Bypass Capacitors
      3. 10.1.3 Ground Planes
      4. 10.1.4 Power System Example
    2. 10.2 Layout Example
    3. 10.3 Thermal Considerations
    4. 10.4 Board Mounting Recommendation
  11. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Device Nomenclature
      2. 11.1.2 Third-Party Products Disclaimer
    2. 11.2 ドキュメントの更新通知を受け取る方法
    3. 11.3 サポート・リソース
    4. 11.4 Trademarks
    5. 11.5 静電気放電に関する注意事項
    6. 11.6 用語集
  12. 12Mechanical, Packaging, and Orderable Information
    1. 12.1 Engineering Samples

パッケージ・オプション

デバイスごとのパッケージ図は、PDF版データシートをご参照ください。

メカニカル・データ（パッケージ｜ピン）
  • FVA|256
  • NAA|376
サーマルパッド・メカニカル・データ
発注情報

6.12 Converter Electrical Characteristics: Power Supply Characteristics

The following specifications apply after calibration for VA = VDR = VTC = VE = 1.9 V; I and Q channels AC-coupled, FSR pin = high; CL = 10 pF; differential AC-coupled sine wave input clock, fCLK = 1.6 GHz at 0.5 VP-P with 50% duty cycle; VBG = floating; non-extended control mode; Rext = Rtrim = 3300 Ω ±0.1%; analog signal source impedance = 100-Ω differential; 1:2 demultiplex non-DES mode; I and Q channels; duty-cycle stabilizer on.(1)(2)
PARAMETERCONDITIONSSUB-GROUPSMINTYP(3)MAXUNIT
fCLK = 1.6 GHz, 1:2 DEMUX MODE, NON-LSPSM
IAAnalog supply currentPDI = PDQ = Low[1, 2, 3]1160mA
PDI = Low; PDQ = High637mA
PDI = High; PDQ = Low635mA
PDI = PDQ = High2mA
ITCTrack-and-hold and clock supply currentPDI = PDQ = Low[1, 2, 3]471mA
PDI = Low; PDQ = High284mA
PDI = High; PDQ = Low284mA
PDI = PDQ = High1mA
IDROutput driver supply currentPDI = PDQ = Low[1, 2, 3]281mA
PDI = Low; PDQ = High149mA
PDI = High; PDQ = Low143mA
PDI = PDQ = High8µA
IEDigital encoder supply currentPDI = PDQ = Low[1, 2, 3]90mA
PDI = Low; PDQ = High54mA
PDI = High; PDQ = Low42mA
PDI = PDQ = High0.04µA
ITTotal currentPDI = PDQ = Low[1, 2, 3]20202280mA
PDI = Low; PDQ = High[1, 2, 3]11201300mA
PDI = High; PDQ = Low[1, 2, 3]11101300mA
PDI = PDQ = High2.7mA
PCPower consumptionPDI = PDQ = Low[1, 2, 3]3.84.4W
PDI = Low; PDQ = High2.1W
PDI = High; PDQ = Low2.1W
PDI = PDQ = High5.2mW
fCLK = 800 MHz, 1:2 DEMUX MODE, LSPSM
IAAnalog supply currentPDI = PDQ = Low[1, 2, 3]754mA
PDI = Low; PDQ = High423mA
PDI = High; PDQ = Low423mA
PDI = PDQ = High2mA
ITCTrack-and-hold and clock supply currentPDI = PDQ = Low[1, 2, 3]344mA
PDI = Low; PDQ = High212mA
PDI = High; PDQ = Low212mA
PDI = PDQ = High1mA
IDROutput driver supply currentPDI = PDQ = Low[1, 2, 3]273mA
PDI = Low; PDQ = High141mA
PDI = High; PDQ = Low141mA
PDI = PDQ = High8µA
IEDigital encoder supply currentPDI = PDQ = Low[1, 2, 3]46mA
PDI = Low; PDQ = High24mA
PDI = High; PDQ = Low22mA
PDI = PDQ = High0.03µA
ITTotal currentPDI = PDQ = Low[1, 2, 3]14171620mA
PDI = Low; PDQ = High[1, 2, 3]801940mA
PDI = High; PDQ = Low[1, 2, 3]799940mA
PDI = PDQ = High2.7mA
PCPower consumptionPDI = PDQ = Low[1, 2, 3]2.73.1W
PDI = Low; PDQ = High1.5W
PDI = High; PDQ = Low1.5W
PDI = PDQ = High5.2mW
(1) The analog inputs are protected as shown below. Input voltage magnitudes beyond the Absolute Maximum Ratings may damage this device.
GUID-0E180FB8-5707-431A-A0F2-8F15E7197F19-low.gif
(2) To ensure accuracy, it is required that VA, VTC, VE and VDR be well bypassed. Each supply pin must be decoupled with separate bypass capacitors.
(3) Typical figures are at TA = 25°C, and represent most likely parametric norms. Test limits are ensured to Texas Instrument's average outgoing quality level (AOQL).