The following specifications apply after calibration for VA =
VDR = VTC = VE = 1.9 V; I and Q channels
AC-coupled, FSR pin = high; CL = 10-pF; differential AC-coupled sine
wave input clock, fCLK = 1.6 GHz at 0.5 VP-P with 50% duty
cycle; VBG = floating; non-extended control mode; Rext = Rtrim = 3300
Ω ±0.1%; analog signal source impedance = 100-Ω differential; 1:2 demultiplex
non-DES mode; I and Q channels; duty-cycle stabilizer on.(1)(2)
PARAMETER |
TEST
CONDITIONS |
SUB-GROUPS |
MIN |
TYP(3) |
MAX |
UNIT |
INL |
Integral non-linearity |
DC-coupled, 1 MHz sine wave over-ranged |
[1, 2, 3] |
–7.5 |
±2.5 |
7.5 |
LSB |
DNL |
Differential non-linearity |
DC-coupled, 1 MHz sine wave over-ranged |
[1, 2, 3] |
–1.35 |
±0.5 |
1.35 |
LSB |
|
Resolution with no missing codes |
|
[1, 2, 3] |
|
|
12 |
bits |
VOFF |
Offset error |
|
|
|
8 |
|
LSB |
VOFF_ADJ |
Input offset adjustment range |
Extended control mode |
|
|
±45 |
|
mV |
PFSE |
Positive full-scale error |
See(4) |
[1, 2, 3] |
–30 |
|
30 |
mV |
NFSE |
Negative full-scale error |
See(4) |
[1, 2, 3] |
–30 |
|
30 |
mV |
|
Out-of-range output code |
(VIN+) −
(VIN−) > positive full scale |
[1, 2, 3] |
|
|
4095 |
|
(VIN+) − (VIN−) <
negative full scale |
[1, 2, 3] |
0 |
|
|
|
(1) The analog inputs are protected as shown below. Input voltage
magnitudes beyond the
Absolute Maximum Ratings may damage this device.
![GUID-0E180FB8-5707-431A-A0F2-8F15E7197F19-low.gif](/ods/images/JAJSDJ8A/GUID-0E180FB8-5707-431A-A0F2-8F15E7197F19-low.gif)
(2) To ensure accuracy, it is required that VA,
VTC, VE and VDR be well bypassed. Each
supply pin must be decoupled with separate bypass capacitors.
(3) Typical figures are at TA = 25°C, and represent most
likely parametric norms. Test limits are ensured to Texas Instrument's average
outgoing quality level (AOQL).
(4) Calculation of full-scale error for this device assumes that
the actual reference voltage is exactly its nominal value. Full-scale error for
this device, therefore, is a combination of full-scale error and reference
voltage error. For relationship between gain error and full-scale error, see
gain error in
Device Nomenclature.