JAJSF13C March   2018  – January 2019 ADS1260 , ADS1261

PRODUCTION DATA.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
    1.     Device Images
      1.      ブロック図
  4. 4 改訂履歴
  5. 5 概要（続き）
  6. 6 Device Comparison Table
  7. 7 Pin Configuration and Functions
    1.     Pin Functions
  8. 8 Specifications
    1. 8.1 Absolute Maximum Ratings
    2. 8.2 ESD Ratings
    3. 8.3 Recommended Operating Conditions
    4. 8.4 Thermal Information
    5. 8.5 Electrical Characteristics
    6. 8.6 Timing Requirements
    7. 8.7 Switching Characteristics
    8. 8.8 Typical Characteristics
  9. 9 Parameter Measurement Information
    1. 9.1 Noise Performance
  10. 10Detailed Description
    1. 10.1 Overview
    2. 10.2 Functional Block Diagram
    3. 10.3 Feature Description
      1. 10.3.1  Analog Inputs
        1. 10.3.1.1 ESD Diodes
        2. 10.3.1.2 Input Multiplexer
        3. 10.3.1.3 Temperature Sensor
        4. 10.3.1.4 Power-Supply Readback
        5. 10.3.1.5 Inputs Open
        6. 10.3.1.6 Internal VCOM Connection
        7. 10.3.1.7 Alternate Functions
      2. 10.3.2  PGA
        1. 10.3.2.1 PGA Bypass Mode
        2. 10.3.2.2 PGA Voltage Monitor
      3. 10.3.3  Reference Voltage
        1. 10.3.3.1 Internal Reference
        2. 10.3.3.2 External Reference
        3. 10.3.3.3 AVDD - AVSS Reference (Default)
        4. 10.3.3.4 Reference Monitor
      4. 10.3.4  Level-Shift Voltage (VBIAS)
      5. 10.3.5  Burn-Out Current Sources
      6. 10.3.6  Sensor-Excitation Current Sources (IDAC1 and IDAC2)
      7. 10.3.7  General-Purpose Input/Outputs (GPIOs)
      8. 10.3.8  Oversampling
      9. 10.3.9  Modulator
      10. 10.3.10 Digital Filter
        1. 10.3.10.1 Sinc Filter
          1. 10.3.10.1.1 Sinc Filter Frequency Response
        2. 10.3.10.2 FIR Filter
          1. 10.3.10.2.1 FIR Filter Frequency Response
        3. 10.3.10.3 Filter Bandwidth
        4. 10.3.10.4 50-Hz and 60-Hz Normal Mode Rejection
    4. 10.4 Device Functional Modes
      1. 10.4.1 Conversion Control
        1. 10.4.1.1 Continuous-Conversion Mode
        2. 10.4.1.2 Pulse-Conversion Mode
        3. 10.4.1.3 Conversion Latency
        4. 10.4.1.4 Start-Conversion Delay
      2. 10.4.2 Chop Mode
      3. 10.4.3 AC-Excitation Mode
      4. 10.4.4 ADC Clock Mode
      5. 10.4.5 Power-Down Mode
        1. 10.4.5.1 Hardware Power-Down
        2. 10.4.5.2 Software Power-Down
      6. 10.4.6 Reset
        1. 10.4.6.1 Power-on Reset
        2. 10.4.6.2 Reset by Pin
        3. 10.4.6.3 Reset by Command
      7. 10.4.7 Calibration
        1. 10.4.7.1 Offset and Full-Scale Calibration
          1. 10.4.7.1.1 Offset Calibration Registers
          2. 10.4.7.1.2 Full-Scale Calibration Registers
        2. 10.4.7.2 Offset Self-Calibration (SFOCAL)
        3. 10.4.7.3 Offset System-Calibration (SYOCAL)
        4. 10.4.7.4 Full-Scale Calibration (GANCAL)
        5. 10.4.7.5 Calibration Command Procedure
        6. 10.4.7.6 User Calibration Procedure
    5. 10.5 Programming
      1. 10.5.1 Serial Interface
        1. 10.5.1.1 Chip Select (CS)
        2. 10.5.1.2 Serial Clock (SCLK)
        3. 10.5.1.3 Data Input (DIN)
        4. 10.5.1.4 Data Output/Data Ready (DOUT/DRDY)
        5. 10.5.1.5 Serial Interface Auto-Reset
      2. 10.5.2 Data Ready (DRDY)
        1. 10.5.2.1 DRDY in Continuous-Conversion Mode
        2. 10.5.2.2 DRDY in Pulse-Conversion Mode
        3. 10.5.2.3 Data Ready by Software Polling
      3. 10.5.3 Conversion Data
        1. 10.5.3.1 Status byte (STATUS)
        2. 10.5.3.2 Conversion Data Format
      4. 10.5.4 CRC
      5. 10.5.5 Commands
        1. 10.5.5.1  NOP Command
        2. 10.5.5.2  RESET Command
        3. 10.5.5.3  START Command
        4. 10.5.5.4  STOP Command
        5. 10.5.5.5  RDATA Command
        6. 10.5.5.6  SYOCAL Command
        7. 10.5.5.7  GANCAL Command
        8. 10.5.5.8  SFOCAL Command
        9. 10.5.5.9  RREG Command
        10. 10.5.5.10 WREG Command
        11. 10.5.5.11 LOCK Command
        12. 10.5.5.12 UNLOCK Command
    6. 10.6 Register Map
      1. 10.6.1  Device Identification (ID) Register (address = 00h) [reset = xxh]
        1. Table 30. ID Register Field Descriptions
      2. 10.6.2  Device Status (STATUS) Register (address = 01h) [reset = 01h]
        1. Table 31. STATUS Register Field Descriptions
      3. 10.6.3  Mode 0 (MODE0) Register (address = 02h) [reset = 24h]
        1. Table 32. MODE0 Register Field Descriptions
      4. 10.6.4  Mode 1 (MODE1) Register (address = 03h) [reset = 01h]
        1. Table 33. MODE1 Register Field Descriptions
      5. 10.6.5  Mode 2 (MODE2) Register (address = 04h) [reset = 00h]
        1. Table 34. MODE2 Register Field Descriptions
      6. 10.6.6  Mode 3 (MODE3) Register (address = 05h) [reset = 00h]
        1. Table 35. MODE3 Register Field Descriptions
      7. 10.6.7  Reference Configuration (REF) Register (address = 06h) [reset = 05h]
        1. Table 36. REF Register Field Descriptions
      8. 10.6.8  Offset Calibration (OFCALx) Registers (address = 07h, 08h, 09h) [reset = 00h, 00h, 00h]
        1. Table 37. OFCAL0, OFCAL1, OFCAL2 Registers Field Description
      9. 10.6.9  Full-Scale Calibration (FSCALx) Registers (address = 0Ah, 0Bh, 0Ch) [reset = 00h, 00h, 40h]
        1. Table 38. FSCAL0, FSCAL1, FSCAL2 Registers Field Description
      10. 10.6.10 IDAC Multiplexer (IMUX) Register (address = 0Dh) [reset = FFh]
        1. Table 39. IMUX Register Field Descriptions
      11. 10.6.11 IDAC Magnitude (IMAG) Register (address = 0Eh) [reset = 00h]
        1. Table 40. IMAG Register Field Descriptions
      12. 10.6.12 Reserved (RESERVED) Register (address = 0Fh) [reset = 00h]
        1. Table 41. RESERVED Register Field Descriptions
      13. 10.6.13 PGA Configuration (PGA) Register (address = 10h) [reset = 00h]
        1. Table 42. PGA Register Field Descriptions
      14. 10.6.14 Input Multiplexer (INPMUX) Register (address = 11h) [reset = FFh]
        1. Table 43. INPMUX Register Field Descriptions
      15. 10.6.15 Input Bias (INPBIAS) Register (address = 12h) [reset = 00h]
        1. Table 44. INPBIAS Register Field Descriptions
  11. 11Application and Implementation
    1. 11.1 Application Information
      1. 11.1.1 Input Range
      2. 11.1.2 Input Overload
      3. 11.1.3 Burn-Out Current Source
      4. 11.1.4 Unused Inputs and Outputs
      5. 11.1.5 AC-Excitation
      6. 11.1.6 Serial Interface and Digital Connections
    2. 11.2 Typical Application
      1. 11.2.1 Design Requirements
      2. 11.2.2 Detailed Design Procedure
      3. 11.2.3 Application Curves
    3. 11.3 Initialization Setup
  12. 12Power Supply Recommendations
    1. 12.1 Power-Supply Decoupling
    2. 12.2 Analog Power-Supply Clamp
    3. 12.3 Power-Supply Sequencing
  13. 13Layout
    1. 13.1 Layout Guidelines
    2. 13.2 Layout Example
  14. 14デバイスおよびドキュメントのサポート
    1. 14.1 ドキュメントのサポート
      1. 14.1.1 関連資料
    2. 14.2 関連リンク
    3. 14.3 ドキュメントの更新通知を受け取る方法
    4. 14.4 コミュニティ・リソース
    5. 14.5 商標
    6. 14.6 静電気放電に関する注意事項
    7. 14.7 Glossary
  15. 15メカニカル、パッケージ、および注文情報

パッケージ・オプション

デバイスごとのパッケージ図は、PDF版データシートをご参照ください。

メカニカル・データ（パッケージ｜ピン）
  • RHB|32
サーマルパッド・メカニカル・データ
発注情報

11.2.2 Detailed Design Procedure

IDAC1 current flows through reference resistor, RREF, which generates the ADC reference voltage, VREF = IIDAC1 · RREF. IDAC1 current also flows through the RTD element. Since the same current flows through RREF and the RTD element, the RTD measurement is ratiometric, which means the drift and error of the current source are cancelled. Therefore, the measurement accuracy is solely dependent on the tolerance of RREF and on ADC gain and offset errors. The errors are calibrated by host software control using shorted-input calibration and using a 400 Ω precision resistor for full-scale calibration.

The current of IDAC2 is programmed to the same value as IDAC1 and is connected to RLEAD2. IDAC2 generates an equal voltage drop across RLEAD1 and IDAC1. The accuracy of lead-wire compensation depends on the matching error between IDAC1 to IDAC2.

Using RRTD = 400 Ω, IDAC current = 500 µA, and gain = 8, the minimum ADC reference voltage requirement calculates to 1.6 V. To provide 10% design margin, RREF calculates to 3.52 kΩ (1.76 V / 500 µA). 500 µA is selected to minimize heating of the sensor.

Resistor RBIAS level-shifts the RTD voltage to meet the input range requirement of the ADC. This voltage is VRTDN and the low limit is calculated by Equation 8. The VRTDN low limit is 1 V.

Equation 8. AVSS + 0.3 V + VRTD · (Gain – 1) / 2 ≤ VRTDN

Using 10% design margin, RBIAS calculates to 1.1 kΩ = 1.1 V / (2 · 500 µA). The next step is to verify the positive RTD voltage (VRTDP) does not exceed the maximum input range, as shown in Equation 9:

Equation 9. Maximum VRTDP ≤ AVDD – 0.3 V – VRTD · (Gain – 1) / 2

Evaluation of the equation results in the VRTDP high limit = 3.75 V. Calculate the actual VRTDP input voltage by Equation 10:

Equation 10. Actual VRTDP = VRTDN + IIDAC1 · ( RRTD + 2 · RLEAD) = 1.1 V + 500 µA · (400 Ω + 20 Ω) = 1.31 V

VRTDN = 1.1 V and VRTDP = 1.31 V satisfy the negative and positive input voltage requirements of the ADC, respectively.

Verify the burden voltage of current source IDAC1 is below the specified compliance range. The burden voltage is the sum of voltages in the IDAC1 loop as calculated by VRTDP+ (IDAC1 · RREF) + VD ( VD= external diode voltage). The result is 3.37 V, which meets the specified compliance voltage of the current source.

External filter components RF1, RF2, CDIF1, CCM1, CCM2) and RF3, RF4, CDIF2, CCM3, and CCM4) filter the signal and reference inputs of the ADC. The filters remove both differential and common-mode noise. The input signal differential filter cutoff frequency as calculated by Equation 11:

Equation 11. fDIF = 1 / [2π · RF1 + RF2) · RDIF1 + CM1|| CM2)]

The Input signal common-mode filter is calculated by Equation 12:

Equation 12. fCM = 1 / (2π · RF1 · CM1) = 1 / (2π · RF2 · CM2)

Component mismatch in the common-mode filter converts common-mode noise into differential noise. Use a differential capacitor CDIF1 10× higher value than the common-mode capacitors, CCM1 and CCM2 to minimize the effects of mismatch. The recommended range of input resistors is 1 kΩ to 10 kΩ; increasing the resistance beyond 10 kΩ beyond can compromise noise and drift performance of the ADC. Use high-quality C0G ceramics or film-type capacitors. For consistent noise performance across the full RTD temperature range, match the corner frequencies of the input and reference filters. Detailed information is found in the RTD Ratiometric Measurements and Filtering Using the ADS1148 and ADS1248 Family of Devices application report.