JAJSG65B September   2018  – December 2018 ADS1278-SP

PRODUCTION DATA.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
    1.     Device Images
      1.      概略回路図
  4. 4 改訂履歴
  5. 5 概要（続き）
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements: SPI Format
    7. 7.7 Timing Requirements: Frame-Sync Format
    8. 7.8 Quality Conformance Inspection
    9. 7.9 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Sampling Aperture Matching
      2. 8.3.2  Frequency Response
        1. 8.3.2.1 High-Speed, Low-Power, And Low-Speed Modes
        2. 8.3.2.2 High-Resolution Mode
      3. 8.3.3  Phase Response
      4. 8.3.4  Settling Time
      5. 8.3.5  Data Format
      6. 8.3.6  Analog Inputs (AINP, AINN)
      7. 8.3.7  Voltage Reference Inputs (VREFP, VREFN)
      8. 8.3.8  Clock Input (CLK)
      9. 8.3.9  Mode Selection (MODE)
      10. 8.3.10 Synchronization (SYNC)
      11. 8.3.11 Power-Down (PWDN)
      12. 8.3.12 Format[2:0]
      13. 8.3.13 Serial Interface Protocols
      14. 8.3.14 SPI Serial Interface
        1. 8.3.14.1 SCLK
        2. 8.3.14.2 DRDY/FSYNC (SPI Format)
        3. 8.3.14.3 DOUT
        4. 8.3.14.4 DIN
      15. 8.3.15 Frame-Sync Serial Interface
        1. 8.3.15.1 SCLK
        2. 8.3.15.2 DRDY/FSYNC (Frame-Sync Format)
        3. 8.3.15.3 DOUT
        4. 8.3.15.4 DIN
      16. 8.3.16 DOUT Modes
        1. 8.3.16.1 TDM Mode
        2. 8.3.16.2 TDM Mode, Fixed-Position Data
        3. 8.3.16.3 TDM Mode, Dynamic Position Data
        4. 8.3.16.4 Discrete Data Output Mode
      17. 8.3.17 Daisy-Chaining
      18. 8.3.18 Modulator Output
      19. 8.3.19 Pin Test Using Test[1:0] Inputs
      20. 8.3.20 VCOM Output
    4. 8.4 Device Functional Modes
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12デバイスおよびドキュメントのサポート
    1. 12.1 ドキュメントの更新通知を受け取る方法
    2. 12.2 コミュニティ・リソース
    3. 12.3 商標
    4. 12.4 静電気放電に関する注意事項
    5. 12.5 Glossary
  13. 13メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.8 Quality Conformance Inspection

MIL-STD-883, Method 5005 - Group A

SUBGROUP DESCRIPTION TEMP (°C)
1 Static tests at 25
2 Static tests at 125
3 Static tests at –55
4 Dynamic tests at 25
5 Dynamic tests at 125
6 Dynamic tests at –55
7 Functional tests at 25
8A Functional tests at 125
8B Functional tests at –55
9 Switching tests at 25
10 Switching tests at 125
11 Switching tests at –55
12 Setting time at 25
13 Setting time at 125
14 Setting time at –55