SBAS659 November   2014 ADS58J89

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  Handling Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics
    6. 6.6  Electrical Characteristics: 250 MSPS Output, 2x Decimation Filter
    7. 6.7  Electrical Characteristics: 500 MSPS Output
    8. 6.8  Electrical Characteristics: Sample Clock Timing Characteristics
    9. 6.9  Electrical Characteristics: Digital Outputs
    10. 6.10 Timing Requirements
    11. 6.11 Reset Timing
    12. 6.12 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Decimation by 2 (250 MSPS Output)
      2. 7.3.2  Over-Range Indication
      3. 7.3.3  JESD204B Interface
        1. 7.3.3.1 JESD204B Initial Lane Alignment (ILA)
        2. 7.3.3.2 JESD204B Test Patterns
        3. 7.3.3.3 JESD204B Frame Assembly
      4. 7.3.4  SYSREF Clocking Schemes
      5. 7.3.5  Split-Mode Operation
      6. 7.3.6  Eye Diagram Information
      7. 7.3.7  Analog Inputs
      8. 7.3.8  Clock Inputs
      9. 7.3.9  Input Clock Divider
      10. 7.3.10 Power-Down Control
      11. 7.3.11 Device Configuration
      12. 7.3.12 JESD204B Interface Initialization Sequence
      13. 7.3.13 Device and Register Initialization
    4. 7.4 Device Functional Modes
      1. 7.4.1 Operating Modes
      2. 7.4.2 Mode Configuration
      3. 7.4.3 Output Format
      4. 7.4.4 Burst Mode of Every Other Sample (250 MSPS Output)
      5. 7.4.5 SNR Boost (500 MSPS Output)
      6. 7.4.6 Burst Mode
        1. 7.4.6.1 Burst Mode Counters
        2. 7.4.6.2 Burst Mode
        3. 7.4.6.3 TDD Burst Mode
        4. 7.4.6.4 Trigger Input
        5. 7.4.6.5 Manual Trigger Mode
        6. 7.4.6.6 Auto Trigger Mode
        7. 7.4.6.7 TDD-Burst Mode
          1. 7.4.6.7.1 TDD Burst Mode Examples
    5. 7.5 Programming
      1. 7.5.1 Serial Register Write
      2. 7.5.2 Serial Register Readout
    6. 7.6 Register Maps
      1. 7.6.1 Register Descriptions
        1. 7.6.1.1  Register Address 0
        2. 7.6.1.2  Register Address 1
        3. 7.6.1.3  Register Address 2
        4. 7.6.1.4  Register Address 3
        5. 7.6.1.5  Register Address 4
        6. 7.6.1.6  Register Address 5
        7. 7.6.1.7  Register Address 6
        8. 7.6.1.8  Register Address 7
        9. 7.6.1.9  Register Address 8
        10. 7.6.1.10 Register Address 12
        11. 7.6.1.11 Register Address 13
        12. 7.6.1.12 Register Address 14
        13. 7.6.1.13 Register Address 15
        14. 7.6.1.14 Register Address 16
        15. 7.6.1.15 Register Address 19
        16. 7.6.1.16 Register Address 22
        17. 7.6.1.17 Register Address 23
        18. 7.6.1.18 Register Address 26
        19. 7.6.1.19 Register Address 29
        20. 7.6.1.20 Register Address 30
        21. 7.6.1.21 Register Address 31
        22. 7.6.1.22 Register Address 32
        23. 7.6.1.23 Register Address 33
        24. 7.6.1.24 Address: 0x24, 0x25, 0x26, 0x27
        25. 7.6.1.25 Address: 0x28, 0x29, 0x2A, 0x2B
        26. 7.6.1.26 Register Address 44
        27. 7.6.1.27 Register Address 45
        28. 7.6.1.28 Register Address 46
        29. 7.6.1.29 Register Address 47
        30. 7.6.1.30 Address: 0x32, 0x33, 0x34, 0x35
        31. 7.6.1.31 Address: 0x36, 0x37, 0x38, 0x39
        32. 7.6.1.32 Register Address 58
        33. 7.6.1.33 Register Address 59
        34. 7.6.1.34 Register Address 60
        35. 7.6.1.35 Register Address 61
        36. 7.6.1.36 Register Address 99
        37. 7.6.1.37 Register Address 100
        38. 7.6.1.38 Register Address 103
        39. 7.6.1.39 Register Address 104
        40. 7.6.1.40 Register Address 107
        41. 7.6.1.41 Register Address 108
        42. 7.6.1.42 Register Address 111
  8. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 SNR and Clock Jitter
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
  9. Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 CML SerDes Transmitter Interface
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Trademarks
    2. 11.2 Electrostatic Discharge Caution
    3. 11.3 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

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発注情報

8 Application and Implementation

NOTE

Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality.

8.1 Application Information

In the design of any application involving a high-speed data converter, particular attention should be paid the design of the analog input, the clocking solution, and careful layout of the clock and analog signals. In addition, the JESD204B interface means there now are high-speed serial lines that should be handled to preserve adequate signal integrity at the device that receives the sample data. The ADS58J89 evaluation module (EVM) is one practical example of the design of the analog input circuit and clocking solution, as well as a practical example of good circuit board layout practices around the ADC.

8.1.1 SNR and Clock Jitter

The signal-to-noise ratio of the channel is limited by three different factors: the quantization noise is typically not noticeable in pipeline converters and is 84 dB for a 14-bit channel. The thermal noise limits the SNR at low input frequencies while the clock jitter sets the SNR for higher input frequencies.

Equation 2. eq_SNR1_SBAS659.gif

Calculate the SNR limitation due to sample clock jitter using the following:

Equation 3. eq_SNR2_SBAS659.gif

The total clock jitter (tJitter) has two components – the internal aperture jitter (85 fs for ADS58J89), which is set by the noise of the clock input buffer, the external clock jitter, and the jitter from the analog input signal. Calculate total clock jitter using the following:

Equation 4. eq_SNR3_SBAS659.gif

External clock jitter can be minimized by using high quality clock sources and jitter cleaners, as well as bandpass filters at the clock input while a faster clock slew rate improves the channel aperture jitter.

The ADS58J89 has a thermal noise of 66 dBFS and internal aperture jitter of 98 fs. The SNR depending on amount of external jitter for different input frequencies is shown in Figure 107.

D00A_SBAS659.gif
Figure 107. SNR vs Input Frequency and External Clock Jitter

8.2 Typical Application

The analog inputs of the ADS58J89 must be fully differential and biased to a desired common mode voltage, VCM. Therefore, there will be a signal conditioning circuit for each of the analog inputs. If the amplitude of the input circuit is such that no gain is needed to make full use of the full-scale range of the ADC, then a transformer coupled circuit as in Figure 108 may be used with good results. The transformer coupling is inherently low-noise, and inherently AC-coupled so that the signal may be biased to VCM after the transformer coupling. If signal gain is required, or the input bandwidth is to include the spectrum all the way down to DC such that AC coupling is not possible, then an amplifier-based signal conditioning circuit would be required.

By using the simple drive circuit of Figure 108, uniform performance can be obtained over a wide frequency range. The buffers present at the analog inputs of the device help isolate the external drive source from the switching currents of the sampling circuit.

ai_input_drive_cir_bas591.gifFigure 108. Input Drive Circuit
sch_clock_BAS659.gifFigure 109. Recommended Differential Clock Driving Circuit

8.2.1 Design Requirements

The ADS58J89 requires a fully differential analog input with a full-scale range not to exceed 1.25 V peak to peak, biased to a common mode voltage of 2.0 V. In addition the input circuit must provide proper transmission line termination (or proper load resistors in an amplifier-based solution) so the input of the impedance of the ADC analog inputs should be considered as well.

The clocking solution will have a direct impact on performance in terms of SNR, as shown in Figure 107. The ADS58J89 is capable of a typical SNR of 66 dBFS for input frequencies of about 100 MHz (in 14-bit burst mode), so we will want to have a clocking solution that can preserve this level of performance.

8.2.2 Detailed Design Procedure

The ADS58J89 has an input bandwidth of approximately 900 MHz, but we will consider an application involving the first or second Nyquist zones, so we will limit the frequency bandwidth here to be under 250 MHz. We will also consider a 50-ohm signal source, so the proper termination would be 50-Ω differential. As seen in Figure 110 and Figure 111, the input impedance of the analog input at 250 MHz is large compared to 50 Ω, so the proper termination can be 50-Ω differential as shown in Figure 108. Splitting the termination into two 25-Ω resistors with an AC capacitor to ground provides a path to filter out any ripple on the common mode that may result from any amplitude or phase imbalance of the differential input, improving SFDR performance. The ADS58J89 provides a VCM output that may be used to bias the input to the desired level, but as seen in Figure 52 the signal is internally biased inside the ADC so an external biasing to VCM is not required. If an external biasing to VCM were to be employed, the VCM voltage may be applied to the mid-point of the two 25-Ω termination resistors in Figure 108.

For the clock input, Figure 107 shows the SNR of the device above 100 MHz begins to degrade with external clock jitter of greater than 100 fs rms, so we will recommend the clock source be limited to approximately 100 fS of rms jitter. For the ADS58J89 EVM, the LMK04828 clock device is capable of providing a low-jitter sample clock as well as providing the SYSREF signal required as shown in Figure 47 and Figure 48, so that clocking device is one good choice for the clocking solution for the ADS58J89.

8.2.3 Application Curves

Figure 110 and Figure 111 show the differential impedance between the channel INP and INM pins. The impedance is modeled as a parallel combination of RIN and CIN (RIN || 1 / jwCIN).

D032_SBAS659.gifFigure 110. Equivalent R
D033_SBAS659.gifFigure 111. Equivalent C