4 Revision History
Changes from C Revision (February 2015) to D Revision
-
Changed Figure 1Go
-
Changed Serial Interface section: changed last half of first paragraph, changed Figure 35Go
-
Changed Figure 38Go
-
Added Community Resources section Go
Changes from B Revision (December 2014) to C Revision
-
Changed Wide Operating Range Features bullet: changed the value of AVDD from 1.8 V to 1.65 VGo
-
Changed the wide analog input voltage range value to ±0.825 V in first paragraph of Description section Go
-
Changed AVDD parameter minimum specification in Recommended Operating Conditions table Go
-
Changed EO parameter uncalibrated test conditions in Electrical Characteristics tableGo
-
Changed Maximum throughput rate parameter test conditions in Electrical Characteristics table Go
-
Changed AVDD parameter minimum specification in Electrical Characteristics table Go
-
Changed conditions for Timing Characteristics table: changed range of AVDD and added CLOAD condition Go
-
Changed tD_CKDO specification in Timing Characteristics table Go
-
Added fSCLK minimum specification to Timing Characteristics table Go
-
Changed titles of Figure 26 to Figure 30 Go
-
Changed Reference sub-section in Feature Description sectionGo
-
Changed AVDD range in description of fCLK-CAL parameter in Table 2 Go
-
Changed AVDD range in description of fCLK-CAL parameter in Table 3Go
-
Changed Reference Circuit section in Application InformationGo
-
Added last two sentences to AVDD and DVDD Supply Recommendations sectionGo
Changes from A Revision (November 2014) to B Revision
-
Changed ESD Ratings table to latest standards Go
-
Added footnotes to Electrical Characteristics table Go
-
Changed y-axis unit in Figure 30 Go
Changes from * Revision (November 2014) to A Revision
-
Made changes to product preview data sheetGo