JAJSEC1C November   2019  – July 2020 ADS8686S

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics
    6. 6.6  Timing Requirements
    7. 6.7  Switching Characteristics
    8. 6.8  Timing Diagrams: Universal
    9. 6.9  Timing Diagrams: Parallel Data Read
    10. 6.10 Timing Diagrams: Serial Data Read
    11. 6.11 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Analog Inputs
      2. 7.3.2  Analog Input Impedance
      3. 7.3.3  Input Clamp Protection Circuit
      4. 7.3.4  Programmable Gain Amplifier (PGA)
      5. 7.3.5  Second-Order, Programmable, Low-Pass Filter (LPF)
      6. 7.3.6  ADC Driver
      7. 7.3.7  Multiplexer
      8. 7.3.8  Digital Filter and Noise
      9. 7.3.9  Reference
        1. 7.3.9.1 Internal Reference
        2. 7.3.9.2 External Reference
        3. 7.3.9.3 Supplying One VREF to Multiple Devices
      10. 7.3.10 ADC Transfer Function
    4. 7.4 Device Functional Modes
      1. 7.4.1 Device Interface: Pin Description
        1. 7.4.1.1  REFSEL (Input)
        2. 7.4.1.2  RESET (Input)
        3. 7.4.1.3  SEQEN (Input)
        4. 7.4.1.4  HW_RANGESEL[1:0] (Input)
        5. 7.4.1.5  SER/BYTE/PAR (Input)
        6. 7.4.1.6  DB[3:0] (Input/Output)
        7. 7.4.1.7  DB4/SER1W (Input/Output)
        8. 7.4.1.8  DB5/CRCEN (Input/Output)
        9. 7.4.1.9  DB[7:6] (Input/Output)
        10. 7.4.1.10 DB8 (Input/Output)
        11. 7.4.1.11 DB9/BYTESEL (Input/Output)
        12. 7.4.1.12 DB10/SDI (Input/Output)
        13. 7.4.1.13 DB11/SDOB (Input/Output)
        14. 7.4.1.14 DB12/SDOA (Input/Output)
        15. 7.4.1.15 DB13/OS0 (Input/Output)
        16. 7.4.1.16 DB14/OS1 (Input/Output)
        17. 7.4.1.17 DB15/OS2 (Input/Output)
        18. 7.4.1.18 WR/BURST (Input)
        19. 7.4.1.19 SCLK/RD (Input)
        20. 7.4.1.20 CS (Input)
        21. 7.4.1.21 CHSEL[2:0] (Input)
        22. 7.4.1.22 BUSY (Output)
        23. 7.4.1.23 CONVST (Input)
      2. 7.4.2 Device Modes of Operation
        1. 7.4.2.1 Shutdown Mode
        2. 7.4.2.2 Operation Mode
          1. 7.4.2.2.1 Hardware Mode
          2. 7.4.2.2.2 Software Mode
        3. 7.4.2.3 Reset Functionality
        4. 7.4.2.4 Channel Selection
          1. 7.4.2.4.1 Hardware Mode Channel Selection
          2. 7.4.2.4.2 Software Mode Channel Selection
        5. 7.4.2.5 Sequencer
          1. 7.4.2.5.1 Hardware Mode Sequencer
          2. 7.4.2.5.2 Software Mode Sequencer
        6. 7.4.2.6 Burst Sequencer
          1. 7.4.2.6.1 Hardware Mode Burst Sequencer
          2. 7.4.2.6.2 Software Mode Burst Sequencer
        7. 7.4.2.7 Diagnostics
          1. 7.4.2.7.1 Analog Diagnosis
          2. 7.4.2.7.2 Interface Diagnosis: SELF TEST and CRC
    5. 7.5 Programming
      1. 7.5.1 Parallel Interface
        1. 7.5.1.1 Reading Conversion Results
        2. 7.5.1.2 Writing Register Data
        3. 7.5.1.3 Reading Register Data
      2. 7.5.2 Parallel Byte Interface
        1. 7.5.2.1 Reading Conversion Results
        2. 7.5.2.2 Writing Register Data
        3. 7.5.2.3 Reading Register Data
      3. 7.5.3 Serial Interface
        1. 7.5.3.1 Reading Conversion Results
        2. 7.5.3.2 Writing Register Data
        3. 7.5.3.3 Reading Register Data
    6. 7.6 Register Maps
      1. 7.6.1 Page1 Registers
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 8x2 Channel Data Acquisition System (DAQ) for Power Automation
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curve
      2. 8.2.2 Input Protection for Electrical Overstress
  9. 9 Power Supply Recommendations
    1. 9.1 Power Supplies
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Examples
  11. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Development Support
    2. 11.2 Documentation Support
      1. 11.2.1 Related Documentation
    3. 11.3 Receiving Notification of Documentation Updates
    4. 11.4 サポート・リソース
    5. 11.5 Trademarks
    6. 11.6 Electrostatic Discharge Caution
    7. 11.7 Glossary

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.3.9.3 Supplying One VREF to Multiple Devices

For applications that require multiple ADS8686S devices, using the same reference voltage source for all the ADCs helps eliminate any potential errors in the system resulting from mismatch between multiple reference sources.

Figure 7-8 shows the recommended connection diagram for an application that uses one device in internal reference mode and provides the reference source for other devices. The device used as the source of the voltage reference is bypassed by a 10-µF capacitor on the REFIO pin, whereas the other devices are bypassed with a 100-nF capacitor.

GUID-C9E31DC4-93EC-49A6-81EA-5233557ADCBD-low.gif Figure 7-8 Multiple Devices Connected with an Internal Reference from One Device

Figure 7-9 shows the recommended connection diagram for an application that uses an external voltage reference (such as the REF5025) to provide the reference source for multiple devices.

GUID-EE8B5B59-2360-465F-ABC3-7BAB7ACE9E1F-low.gif Figure 7-9 Multiple Devices Connected Using an External Reference