JAJSRV8 August   2024 AMC0136

ADVANCE INFORMATION  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information (DEN Package)
    5. 5.5 Package Characteristics
    6. 5.6 Electrical Characteristics
    7. 5.7 Switching Characteristics
    8. 5.8 Timing Diagram
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Analog Input
      2. 6.3.2 Modulator
      3. 6.3.3 Isolation Channel Signal Transmission
      4. 6.3.4 Digital Output
        1. 6.3.4.1 Output Behavior in Case of a Full-Scale Input
        2. 6.3.4.2 Output Behavior in Case of a Missing High-Side Supply
    4. 6.4 Device Functional Modes
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
      3. 7.2.3 Input Filter Design
      4. 7.2.4 Bitstream Filtering
    3. 7.3 Best Design Practices
    4. 7.4 Power Supply Recommendations
    5. 7.5 Layout
      1. 7.5.1 Layout Guidelines
      2. 7.5.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Documentation Support
      1. 8.1.1 Related Documentation
    2. 8.2 ドキュメントの更新通知を受け取る方法
    3. 8.3 サポート・リソース
    4. 8.4 Trademarks
    5. 8.5 静電気放電に関する注意事項
    6. 8.6 用語集
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information
    1. 10.1 Mechanical Data

パッケージ・オプション

デバイスごとのパッケージ図は、PDF版データシートをご参照ください。

メカニカル・データ（パッケージ｜ピン）
  • DEN|8
サーマルパッド・メカニカル・データ
発注情報

5.6 Electrical Characteristics

minimum and maximum specifications apply from TA = –40°C to +125°C, AVDD = 3.0V to 5.5V, DVDD = 2.7V to 5.5V, and VIN = –1V to +1V; typical specifications are at TA = 25°C, AVDD = 5V, DVDD = 3.3V, and fCLKIN = 10MHz (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ANALOG INPUT
CIN Input capacitance fCLKIN = 10MHz 2 pF
RIN Input resistance 0.1 1.15 GΩ
IIB Input bias current IN = AGND –10 ±3 10 nA
CMTI Common-mode transient immunity 150 V/ns
DC ACCURACY
EO Offset error TA = 25°C, IN = AGND –0.9 ±0.08 0.9 mV
TCEO Offset error temperature drift(3) –7 3.5 7 µV/°C
EG Gain error(1) Initial, at TA = 25°C,
VIN = 1V or VIN = –1V		 –0.25 ±0.02 0.25 %
TCEG Gain error temperature drift(4) –40 ±10 40 ppm/°C
INL Integral nonlinearity(2) Resolution: 16 bits –4 ±1.6 7 LSB
DNL Differential nonlinearity Resolution: 16 bits –0.99 0.99 LSB
PSRR Power-supply rejection ratio AVDD DC PSRR, IN = AGND,
AVDD from 3.0V to 5.5V		 –85 dB
AVDD AC PSRR, IN = AGND,
AVDD with10kHz / 100 mV ripple		 –83
AC ACCURACY
SNR Signal-to-noise ratio VIN = 2 VPP, fIN = 1kHz 86 89 dB
SINAD Signal-to-noise + distortion VIN = 2 VPP, fIN = 1 kHz 76 86 dB
THD Total harmonic distortion VIN = 2 VPP, fIN = 1kHz –88 –77 dB
DIGITAL INPUT (CMOS Logic With Schmitt-Trigger)
IIN Input current DGND ≤ VIN ≤ DVDD 7 µA
CIN Input capacitance 4 pF
VIH High-level input voltage 0.7 x DVDD DVDD + 0.3 V
VIL Low-level input voltage –0.3 0.3 x DVDD V
DIGITAL OUTPUT (CMOS)
CLOAD Output load capacitance fCLKIN = 10MHz 15 30 pF
VOH High-level output voltage IOH = –4 mA DVDD – 0.4 V
VOL Low-level output voltage IOL = 4mA 0.4 V
POWER SUPPLY
IAVDD High-side supply current 5.3 7 mA
IDVDD Low-side supply current CLOAD = 15 pF 3.6 5 mA
AVDDUV High-side undervoltage detection threshold AVDD rising 2.3 2.55 2.75 V
AVDD falling 2.15 2.35 2.55
DVDDUV Low-side undervoltage detection threshold DVDD rising 2.3 2.55 2.75 V
DVDD falling 2.15 2.35 2.55
(1) The typical value includes one sigma statistical variation.
(2) Integral nonlinearity is defined as the maximum deviation from a straight line passing through the end-points of the ideal ADC transfer
function expressed as number of LSBs or as a percent of the specified linear full-scale range FSR.
(3) Offset error drift is calculated using the box method, as described by the following equation:
TCEO = (valueMAX - valueMIN) / TempRange
(4) Gain error drift is calculated using the box method, as described by the following equation:
TCEG (ppm) = ((valueMAX - valueMIN) / (value x TempRange)) X 106