JAJSEG2K October   2017  – July 2024 BQ2980 , BQ2982

PRODUCTION DATA  

  1.   1
  2. 特長
  3. アプリケーション
  4. 概要
  5. Device Comparison Table
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
  8. Detailed Description
    1. 7.1 Overview
      1. 7.1.1 Device Configurability
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Overvoltage (OV) Status
      2. 7.3.2 Undervoltage (UV) Status
      3. 7.3.3 Overcurrent in Charge (OCC) Status
      4. 7.3.4 Overcurrent in Discharge (OCD) and Short Circuit in Discharge (SCD) Status
      5. 7.3.5 Overtemperature (OT) Status
      6. 7.3.6 Charge and Discharge Driver
      7. 7.3.7 CTR for FET Override and Device Shutdown
      8. 7.3.8 CTR for PTC Connection
      9. 7.3.9 ZVCHG (0-V Charging)
    4. 7.4 Device Functional Modes
      1. 7.4.1 Power Modes
        1. 7.4.1.1 Power-On-Reset (POR)
        2. 7.4.1.2 NORMAL Mode
        3. 7.4.1.3 FAULT Mode
        4. 7.4.1.4 SHUTDOWN Mode
  9. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Test Circuits for Device Evaluation
      2. 8.1.2 Test Circuit Diagrams
      3. 8.1.3 Using CTR as FET Driver On/Off Control
    2. 8.2 Typical Applications
      1. 8.2.1 BQ298x Configuration 1: System-Controlled Reset/Shutdown Function
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Selection of Power FET
        4. 8.2.1.4 Application Curves
      2. 8.2.2 BQ298x Configuration 2: CTR Function Disabled
      3. 8.2.3 BQ298x Configuration 3: PTC Thermistor Protection
  10. Power Supply Recommendations
  11. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 サード・パーティ製品に関する免責事項
    2. 11.2 ドキュメントの更新通知を受け取る方法
    3. 11.3 サポート・リソース
    4. 11.4 Trademarks
    5. 11.5 静電気放電に関する注意事項
    6. 11.6 用語集
  13. 12Revision History
  14. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Undervoltage (UV) Status

The device detects a UV fault when the battery voltage measured is below the UV threshold (VUVP). If this condition exists for longer than the UV delay (tUVP), the DSG output is driven to VFETOFF to turn off the DSG FET.

The device includes a UV_SHUT option which may be enabled during factory configuration. If this option is enabled, during the UV fault state the device goes into SHUTDOWN mode to preserve the battery. In SHUTDOWN mode, the BQ2980 will drive the CHG output to the PACK voltage, putting the device into ZVCHG mode (the BQ2982 does not enable this ZVCHG mode). That means, the CHG FET can be turned on if a charger is connected and both VDD and PACK meet the ZVCHG turn-on conditions (see Section 7.3.9 for more details). The PACK pin is internally pulled to VSS through RPACK-VSS. This is to determine if the charger is disconnected on the PACK+ terminal before shutting down the device. It is also to ensure the device does not falsely wake up from SHUTDOWN mode due to noise.

The UV status is released and the DSG output rises to HIGH, that is, VDSG = VDD × (1 + AFETON), if one of the following conditions occurs:

  • When VBAT is > (VUVP + VUVP_HYS) and the discharge load is removed or
  • When VBAT is > VUVP and a charger is connected.

The device detects that the charger is attached if (VPACK – VBAT) > 700-mV typical. To detect for load removal, the device checks if (VBAT – VPACK) < 400-mV typical.

If the UV_SHUT option is disabled, during a UV fault DSG is turned off and the device does not go into SHUTDOWN. The power consumption is reduced to IFETOFF. The PACK pin is still internally pulled to VSS through RPACK-VSS. To recover UV with this option, one of the following conditions must occur:

  • When VBAT is > (VUVP + VUVP_HYS) or
  • When VBAT is > VUVP and a charger is connected.