JAJSKT4J July   2021  – November 2023 BQ77216

PRODUCTION DATA  

  1.   1
  2. 特長
  3. アプリケーション
  4. 概要
  5. 概要 (続き)
  6. Device Comparison Table
  7. Pin Configuration and Functions
  8. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 DC Characteristics
    6. 7.6 Timing Requirements
  9. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Voltage Fault Detection
      2. 8.3.2 Open-Wire Fault Detection
      3. 8.3.3 Temperature Fault Detection
      4. 8.3.4 Oscillator Health Check
      5. 8.3.5 Sense Positive Input for Vx
      6. 8.3.6 Output Drive, COUT and DOUT
      7. 8.3.7 The LATCH Function
      8. 8.3.8 Supply Input, VDD
    4. 8.4 Device Functional Modes
      1. 8.4.1 NORMAL Mode
      2. 8.4.2 FAULT Mode
      3. 8.4.3 Customer Test Mode
  10. Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Design Requirements
      2. 9.1.2 Detailed Design Procedure
        1. 9.1.2.1 Cell Connection Sequence
    2. 9.2 Systems Example
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 サード・パーティ製品に関する免責事項
    2. 12.2 ドキュメントの更新通知を受け取る方法
    3. 12.3 サポート・リソース
    4. 12.4 Trademarks
    5. 12.5 静電気放電に関する注意事項
    6. 12.6 用語集
  14. 13Revision History
  15. 14Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Overview

The BQ77216 family of devices provides a range of voltage and temperature monitoring including overvoltage (OVP), undervoltage (UVP), open wire (OW), and overtemperature (OT) protection for Li-ion battery pack systems. Each cell is monitored independently for overvoltage, undervoltage, and open-wire conditions. With the addition of an external NTC thermistor, the device can detect overtemperature conditions. An internal delay timer is initiated upon detection of an overvoltage, undervoltage, open-wire, or overtemperature condition. Upon expiration of the delay timer, the respective output is triggered into its active state (either high or low, depending on the configuration). The overvoltage triggers the COUT pin if a fault is detected, and undervoltage triggers the DOUT pin if a fault is detected. If an undertemperature, overtemperature, or open-wire fault is detected, then both the DOUT and COUT are triggered.

For quicker production-line testing, the BQ77216 device provides a Customer Test Mode (CTM) with greatly reduced delay time.