JAJSKT4J July   2021  – November 2023 BQ77216

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 概要 (続き)
  6. 5 Device Comparison Table
  7. 6 Pin Configuration and Functions
  8. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 DC Characteristics
    6. 7.6 Timing Requirements
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Voltage Fault Detection
      2. 8.3.2 Open-Wire Fault Detection
      3. 8.3.3 Temperature Fault Detection
      4. 8.3.4 Oscillator Health Check
      5. 8.3.5 Sense Positive Input for Vx
      6. 8.3.6 Output Drive, COUT and DOUT
      7. 8.3.7 The LATCH Function
      8. 8.3.8 Supply Input, VDD
    4. 8.4 Device Functional Modes
      1. 8.4.1 NORMAL Mode
      2. 8.4.2 FAULT Mode
      3. 8.4.3 Customer Test Mode
  10. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Design Requirements
      2. 9.1.2 Detailed Design Procedure
        1. 9.1.2.1 Cell Connection Sequence
    2. 9.2 Systems Example
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 サード・パーティ製品に関する免責事項
    2. 12.2 ドキュメントの更新通知を受け取る方法
    3. 12.3 サポート・リソース
    4. 12.4 Trademarks
    5. 12.5 静電気放電に関する注意事項
    6. 12.6 用語集
  14. 13Revision History
  15. 14Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

9.2 Systems Example

In this application example, the choice of a FUSE or FETs is required on the COUT and DOUT pins—configured as an active-high drive to 6-V outputs.

GUID-4490E359-0D06-481B-B330-8056B4D385DE-low.gifFigure 9-3 14-Series Cell Configuration with Active High 6-V Option

When pairing with the BQ769x2 or BQ76940 devices, the top cell must be used. For the BQ77216 device to drive the CHG and DSG FETs, the active high 6-V option is preferred. Its COUT and DOUT are controlling two N-CH FETs to jointly control the CHG and DSG FETs with the monitoring device. For such joint architecture, the open-wire feature of the BQ77216 device may be affected if the primary protector or monitor device is actively measuring the cells. Care is needed to ensure the VOW spec of the BQ77216 device is met or to choose a version of the BQ77216 device with open wire disabled. When working with a BQ769x2 device, set the LOOP_SLOW to 0x11 to ensure the BQ77216 VOW spec is met.  

GUID-20200716-CA0I-Q33Z-VD6N-CMS8SDNBDL7S-low.gif Figure 9-4 BQ77216 with BQ76952