JAJSML8 October   2020 DAC43401-Q1 , DAC53401-Q1

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Electrical Characteristics
    6. 7.6  Timing Requirements: I2C Standard Mode
    7. 7.7  Timing Requirements: I2C Fast Mode
    8. 7.8  Timing Requirements: I2C Fast Mode Plus
    9. 7.9  Typical Characteristics: VDD = 1.8 V (Reference = VDD) or VDD = 2 V (Internal Reference)
    10. 7.10 Typical Characteristics: VDD = 5.5 V (Reference = VDD) or VDD = 5 V (Internal Reference)
    11. 7.11 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Digital-to-Analog Converter (DAC) Architecture
        1. 8.3.1.1 Reference Selection and DAC Transfer Function
          1. 8.3.1.1.1 Power Supply as Reference
          2. 8.3.1.1.2 Internal Reference
      2. 8.3.2 DAC Update
        1. 8.3.2.1 DAC Update Busy
      3. 8.3.3 Nonvolatile Memory (EEPROM or NVM)
        1. 8.3.3.1 NVM Cyclic Redundancy Check
        2. 8.3.3.2 NVM_CRC_ALARM_USER Bit
        3. 8.3.3.3 NVM_CRC_ALARM_INTERNAL Bit
      4. 8.3.4 Programmable Slew Rate
      5. 8.3.5 Power-on-Reset (POR)
      6. 8.3.6 Software Reset
      7. 8.3.7 Device Lock Feature
      8. 8.3.8 PMBus Compatibility
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power Down Mode
      2. 8.4.2 Continuous Waveform Generation (CWG) Mode
      3. 8.4.3 PMBus Compatibility Mode
    5. 8.5 Programming
      1. 8.5.1 F/S Mode Protocol
      2. 8.5.2 I2C Update Sequence
        1. 8.5.2.1 Address Byte
        2. 8.5.2.2 Command Byte
      3. 8.5.3 I2C Read Sequence
    6. 8.6 Register Map
      1. 8.6.1 STATUS Register (address = D0h) [reset = 000Ch or 0014h]
      2. 8.6.2 GENERAL_CONFIG Register (address = D1h) [reset = 01F0h]
      3. 8.6.3 TRIGGER Register (address = D3h) [reset = 0008h]
      4. 8.6.4 DAC_DATA Register (address = 21h) [reset = 0000h]
      5. 8.6.5 DAC_MARGIN_HIGH Register (address = 25h) [reset = 0000h]
      6. 8.6.6 DAC_MARGIN_LOW Register (address = 26h) [reset = 0000h]
      7. 8.6.7 PMBUS_OPERATION Register (address = 01h) [reset = 0000h]
      8. 8.6.8 PMBUS_STATUS_BYTE Register (address = 78h) [reset = 0000h]
      9. 8.6.9 PMBUS_VERSION Register (address = 98h) [reset = 2200h]
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Programmable LED Biasing
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curves
      2. 9.2.2 Power-Supply Margining
        1. 9.2.2.1 Design Requirements
        2. 9.2.2.2 Detailed Design Procedure
        3. 9.2.2.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 ドキュメントの更新通知を受け取る方法
    3. 12.3 サポート・リソース
    4. 12.4 Trademarks
    5. 12.5 静電気放電に関する注意事項
    6. 12.6 用語集
  13. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VDD Supply voltage, VDD to AGND –0.3 6 V
Digital input(s) to AGND –0.3 VDD + 0.3 V
CAP to AGND –0.3 1.65 V
VFB to AGND –0.3 VDD + 0.3 V
VOUT to AGND –0.3 VDD + 0.3 V
Current into any pin –10 10 mA
TJ Junction temperature –40 150 °C
Tstg Storage temperature –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.