JAJSML8 October 2020 DAC43401-Q1 , DAC53401-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
STATIC PERFORMANCE | ||||||
Resolution | DAC53401-Q1 | 10 | Bits | |||
DAC43401-Q1 | 8 | |||||
INL | Relative accuracy(1) | –1 | 1 | LSB | ||
DNL | Differential nonlinearity(1) | –1 | 1 | LSB | ||
Zero code error | Code 0d into DAC | 6 | 12 | mV | ||
Internal VREF, gain = 4x, VDD = 5.5 V | 6 | 15 | ||||
Zero code error temperature coefficient | ±10 | µV/°C | ||||
Offset error(4) | –0.6 | 0.25 | 0.6 | %FSR | ||
Offset error temperature coefficient(4) | ±0.0003 | %FSR/°C | ||||
Gain error(4) | –0.5 | 0.25 | 0.5 | %FSR | ||
Gain error temperature coefficient(4) | ±0.0008 | %FSR/°C | ||||
Full scale error | 1.8 V ≤ VDD ≺ 2.7 V, code 1023d into DAC, no headroom |
–1 | 0.5 | 1 | %FSR | |
2.7 V ≤ VDD ≤ 5.5 V, code 1023d into DAC, no headroom |
–0.5 | 0.25 | 0.5 | |||
Full scale error temperature coefficient | ±0.0008 | %FSR/°C | ||||
OUTPUT CHARACTERISTICS | ||||||
Output voltage | Reference tied to VDD | 0 | 5.5 | V | ||
CL | Capacitive load(2) | RL = Infinite, phase margin = 30° | 1 | nF | ||
RL = 5 kΩ, phase margin = 30° | 2 | |||||
Load regulation | DAC at midscale, –10 mA ≤ IOUT ≤ 10 mA, VDD = 5.5 V |
0.4 | mV/mA | |||
Short circuit current | VDD = 1.8 V, full-scale output shorted to AGND or zero-scale output shorted to VDD |
10 | mA | |||
VDD = 2.7 V, full-scale output shorted to AGND or zero-scale output shorted to VDD |
25 | |||||
VDD = 5.5 V, full-scale output shorted to AGND or zero-scale output shorted to VDD |
50 | |||||
Output voltage headroom(1) | To VDD (DAC output unloaded, internal reference = 1.21 V), VDD ≥ 1.21 ☓ gain + 0.2 V | 0.2 | V | |||
To VDD (DAC output unloaded, reference tied to VDD) |
0.8 | %FSR | ||||
To VDD (ILOAD = 10 mA at VDD = 5.5 V, ILOAD = 3 mA at VDD = 2.7 V, ILOAD = 1 mA at VDD = 1.8 V), DAC code = full scale | 10 | |||||
VOUT dc output impedance | DAC output enabled and DAC code = midscale | 0.25 | Ω | |||
DAC output enabled and DAC code = 4d | 0.25 | |||||
DAC output enabled and DAC code = 1016d | 0.26 | |||||
ZO | VFB dc output impedance(3) | DAC output enabled, DAC reference tied to VDD (gain = 1x) or internal reference (gain = 1.5x or 2x) | 160 | 200 | 240 | kΩ |
DAC output enabled, internal VREF, gain = 3x or 4x | 192 | 240 | 288 | |||
VOUT + VFB dc output leakage(2) | At startup, measured when DAC output is disabled and held at VDD / 2 for VDD = 5.5 V | 5 | nA | |||
Power supply rejection ratio (dc) | Internal VREF, gain = 2x, DAC at midscale; VDD = 5 V ±10% |
0.25 | mV/V | |||
DYNAMIC PERFORMANCE | ||||||
tsett | Output voltage settling time | 1/4 to 3/4 scale and 3/4 to 1/4 scale settling to 10%FSR, VDD = 5.5 V | 8 | µs | ||
1/4 to 3/4 scale and 3/4 to 1/4 scale settling to 10%FSR, VDD = 5.5 V, internal VREF, gain = 4x | 12 | |||||
Slew rate | VDD = 5.5 V | 1 | V/µs | |||
Power-on glitch magnitude | At startup (DAC output disabled), RL = 5 kΩ, CL = 200 pF |
75 | mV | |||
At startup (DAC output disabled), RL = 100 kΩ | 200 | |||||
Output enable glitch magnitude | DAC output disabled to enabled (DAC registers at zero scale, RL = 100 kΩ | 250 | mV | |||
Vn | Output noise voltage (peak to peak) | 0.1 Hz to 10 Hz, DAC at midscale, VDD = 5.5 V | 34 | µVPP | ||
Internal VREF, gain = 4x, 0.1 Hz to 10 Hz, DAC at midscale, VDD = 5.5 V | 70 | |||||
Output noise density | Measured at 1 kHz, DAC at midscale, VDD = 5.5 V | 0.2 | µV/√Hz | |||
Internal VREF, gain = 4x,, measured at 1 kHz, DAC at midscale, VDD = 5.5 V | 0.7 | |||||
Power supply rejection ratio (ac)(3) | Internal VREF, gain = 4x, 200-mV 50 or 60 Hz sine wave superimposed on power supply voltage, DAC at midscale | –71 | dB | |||
Code change glitch impulse | ±1 LSB change around mid code (including feedthrough) | 10 | nV-s | |||
Code change glitch impulse magnitude | ±1 LSB change around mid code (including feedthrough) | 15 | mV | |||
VOLTAGE REFERENCE | ||||||
Initial accuracy | TA = 25°C | 1.212 | V | |||
Reference output temperature coefficient(2) | 50 | ppm/°C | ||||
EEPROM | ||||||
Endurance | –40°C ≤ TA ≤ +85°C | 20000 | Cycles | |||
TA > 85°C | 1000 | |||||
Data retention(2) | TA = 25°C | 50 | Years | |||
EEPROM programming write cycle time(2) | 10 | 20 | ms | |||
DIGITAL INPUTS | ||||||
Digital feedthrough | DAC output static at midscale, fast mode plus, SCL toggling | 20 | nV-s | |||
Pin capacitance | Per pin | 10 | pF | |||
POWER | ||||||
Load capacitor - CAP pin(2) | 0.5 | 15 | µF | |||
IDD | Current flowing into VDD | Normal mode, DACs at full scale, digital pins static | 0.5 | 0.8 | mA | |
DAC power-down, internal reference power down | 80 | µA |