SLAS950A May 2013 – June 2015 DAC7562-Q1 , DAC7563-Q1 , DAC8162-Q1 , DAC8163-Q1 , DAC8562-Q1 , DAC8563-Q1
PRODUCTION DATA.
The DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 (DACxx6x-Q1) devices are low-power, voltage-output, dual-channel, 12-, 14-, and 16-bit digital-to-analog converters (DACs), respectively. These devices include a 2.5-V, 4-ppm/°C internal reference, giving a full-scale output voltage range of 2.5 V or 5 V. The internal reference has an initial accuracy of ±5 mV and can source or sink up to 20 mA at the VREFIN/VREFOUT pin.
These devices are monotonic, providing excellent linearity and minimizing undesired code-to-code transient voltages (glitch). They use a versatile three-wire serial interface that operates at clock rates up to 50 MHz. The interface is compatible with standard SPI™, QSPI™, Microwire, and digital signal processor (DSP) interfaces. The DACxx62-Q1 devices incorporate a power-on-reset circuit that ensures the DAC output powers up and remains at zero scale until a valid code is written to the device, whereas the DACxx63-Q1 devices similarly power up at mid-scale. These devices contain a power-down feature that reduces current consumption to typically 550 nA at 5 V. The low power consumption, internal reference, and small footprint make these devices ideal for portable, battery-operated equipment.
The DACxx62-Q1 devices are drop-in and function-compatible with each device in this family, as are the DACxx63-Q1 devices. The entire family is available in a 10-pin VSSOP-10 (DGS) package.
PART NUMBER | PACKAGE | BODY SIZE (NOM) |
---|---|---|
DAC7562-Q1 | VSSOP (10) | 3.00 mm × 3.00 mm |
DAC7563-Q1 | ||
DAC8162-Q1 | ||
DAC8163-Q1 | ||
DAC8562-Q1 | ||
DAC8563-Q1 |
Changes from * Revision (May 2013) to A Revision
PART NUMBER | RESOLUTION | MAXIMUM RELATIVE ACCURACY (LSB) | MAXIMUM DIFFERENTIAL NONLINEARITY (LSB) | MAXIMUM REFERENCE DRIFT (ppm/°C) | RESET TO |
---|---|---|---|---|---|
DAC7562-Q1 | 12-bit | ±0.75 | ±0.25 | 10 | Zero |
DAC7563-Q1 | Mid-scale | ||||
DAC8162-Q1 | 14-bit | ±3 | ±0.5 | 10 | Zero |
DAC8163-Q1 | Mid-scale | ||||
DAC8562-Q1 | 16-bit | ±12 | ±1 | 10 | Zero |
DAC8563-Q1 | Mid-scale |
PIN | DESCRIPTION | |
---|---|---|
NAME | NO. | |
AVDD | 9 | Power-supply input, 2.7 V to 5.5 V |
CLR | 5 | Asynchronous clear input. The CLR input is falling-edge sensitive. When CLR is activated, zero scale (DACxx62-Q1) or mid-scale (DACxx63-Q1) is loaded to all input and DAC registers. This sets the DAC output voltages accordingly. The part exits clear code mode on the 24th falling edge of the next write to the part. If CLR is activated during a write sequence, the write is aborted. |
DIN | 8 | Serial data input. Data are clocked into the 24-bit input shift register on each falling edge of the serial clock input. Schmitt-trigger logic input |
GND | 3 | Ground reference point for all circuitry on the device |
LDAC | 4 | In synchronous mode, data are updated with the falling edge of the 24th SCLK cycle, which follows a falling edge of SYNC. For such synchronous updates, the LDAC pin is not required, and it must be connected to GND permanently or asserted and held low before sending commands to the device. In asynchronous mode, the LDAC pin is used as a negative edge-triggered timing signal for simultaneous DAC updates. Multiple single-channel commands can be written in order to set different channel buffers to desired values and then make a falling edge on LDAC pin to simultaneously update the DAC output registers. |
SCLK | 7 | Serial clock input. Data can be transferred at rates up to 50 MHz. Schmitt-trigger logic input |
SYNC | 6 | Level-triggered control input (active-low). This input is the frame synchronization signal for the input data. When SYNC goes low, it enables the input shift register, and data are sampled on subsequent falling clock edges. The DAC output updates following the 24th clock falling edge. If SYNC is taken high before the 23rd clock edge, the rising edge of SYNC acts as an interrupt, and the write sequence is ignored by the DAC756x-Q1, DAC816x-Q1, DAC856x-Q1. Schmitt-trigger logic input |
VOUTA | 1 | Analog output voltage from DAC-A |
VOUTB | 2 | Analog output voltage from DAC-B |
VREFIN/VREFOUT | 10 | Bidirectional voltage reference pin. If internal reference is used, 2.5-V output. |
MIN | MAX | UNIT | ||
---|---|---|---|---|
AVDD to GND | –0.3 | 6 | V | |
CLR, DIN, LDAC, SCLK and SYNC input voltage to GND | –0.3 | AVDD + 0.3 | V | |
VOUT[A, B] to GND | –0.3 | AVDD + 0.3 | V | |
VREFIN/VREFOUT to GND | –0.3 | AVDD + 0.3 | V | |
Operating temperature | –40 | 125 | °C | |
Junction temperature, TJ max | 150 | °C | ||
Storage temperature, Tstg | –65 | 150 | °C |
VALUE | UNIT | ||||
---|---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per AEC Q100-002(1) | ±2000 | V | |
Charged-device model (CDM), per AEC Q100-011 | All pins | ±500 | |||
Corner pins (1, 5, 6, and 10) | ±750 |
MIN | NOM | MAX | UNIT | |||
---|---|---|---|---|---|---|
POWER SUPPLY | ||||||
Supply voltage | AVDD to GND | 2.7 | 5.5 | V | ||
DIGITAL INPUTS | ||||||
Digital input voltage | CLR, DIN, LDAC, SCLK and SYNC | 0 | AVDD | V | ||
REFERENCE INPUT | ||||||
VREFIN | Reference input voltage | 0 | AVDD | V | ||
TEMPERATURE RANGE | ||||||
TA | Operating ambient temperature | –40 | 125 | °C |
THERMAL METRIC(1) | DACxx6x-Q1 | UNIT | |
---|---|---|---|
DGS (VSSOP) | |||
10 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 173.8 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 48.5 | °C/W |
RθJB | Junction-to-board thermal resistance | 79.9 | °C/W |
ψJT | Junction-to-top characterization parameter | 1.7 | °C/W |
ψJB | Junction-to-board characterization parameter | 68.4 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
STATIC PERFORMANCE(1) | |||||||
DAC856x-Q1 | Resolution | 16 | Bits | ||||
Relative accuracy | Using line passing through codes 512 and 65,024 | ±4 | ±12 | LSB | |||
Differential nonlinearity | 16-bit monotonic | ±0.2 | ±1 | LSB | |||
DAC816x-Q1 | Resolution | 14 | Bits | ||||
Relative accuracy | Using line passing through codes 128 and 16,256 | ±1 | ±3 | LSB | |||
Differential nonlinearity | 14-bit monotonic | ±0.1 | ±0.5 | LSB | |||
DAC756x-Q1 | Resolution | 12 | Bits | ||||
Relative accuracy | Using line passing through codes 32 and 4,064 | ±0.3 | ±0.75 | LSB | |||
Differential nonlinearity | 12-bit monotonic | ±0.05 | ±0.25 | LSB | |||
Offset error | Extrapolated from two-point line(1), unloaded | ±1 | ±4 | mV | |||
Offset error drift | ±2 | µV/°C | |||||
Full-scale error | DAC register loaded with all 1s | ±0.03 | ±0.2 | % FSR | |||
Zero-code error | DAC register loaded with all 0s | 1 | 4 | mV | |||
Zero-code error drift | ±2 | µV/°C | |||||
Gain error | Extrapolated from two-point line(1), unloaded | ±0.01 | ±0.15 | % FSR | |||
Gain temperature coefficient | ±1 | ppm FSR/°C | |||||
OUTPUT CHARACTERISTICS(2) | |||||||
Output voltage range | 0 | AVDD | V | ||||
Output voltage settling time(3) | DACs unloaded | 7 | µs | ||||
RL = 1 MΩ | 10 | ||||||
Slew rate | Measured between 20% - 80% of a full-scale transition | 0.75 | V/µs | ||||
Capacitive load stability | RL = ∞ | 1 | nF | ||||
RL = 2 kΩ | 3 | ||||||
Code-change glitch impulse | 1-LSB change around major carry | 0.1 | nV-s | ||||
Digital feedthrough | SCLK toggling, SYNC high | 0.1 | nV-s | ||||
Power-on glitch impulse | RL = 2 kΩ, CL = 470 pF, AVDD = 5.5 V | 40 | mV | ||||
Code-change total glitch amplitude | 1-LSB change around major carry. Includes glitch impulse and digital feedthrough. RL = 2 kΩ, CL = 470 pF, AVDD = 5.5 V |
3 | mV | ||||
Channel-to-channel DC crosstalk | Full-scale swing on adjacent channel, External reference |
5 | µV | ||||
Full-scale swing on adjacent channel, Internal reference |
15 | ||||||
DC output impedance | At mid-scale input | 5 | Ω | ||||
Short-circuit current | DAC outputs at full-scale, DAC outputs shorted to GND | 40 | mA | ||||
Power-up time, including settling time | Coming out of power-down mode | 50 | µs | ||||
AC PERFORMANCE(2) | |||||||
DAC output noise density | TA = 25°C, at mid-scale input, fOUT = 1 kHz | 90 | nV/√Hz | ||||
DAC output noise | TA = 25°C, at mid-scale input, 0.1 Hz to 10 Hz | 2.6 | µVPP | ||||
LOGIC INPUTS(2) | |||||||
Input pin Leakage current | –1 | ±0.1 | 1 | µA | |||
Logic input LOW voltage VINL | 0 | 0.8 | V | ||||
Logic input HIGH voltage VINH | 0.7 × AVDD | AVDD | V | ||||
Pin capacitance | 3 | pF | |||||
REFERENCE | |||||||
External reference current | External VREF = 2.5 V (when internal reference is disabled), all channels active using gain = 1 | 15 | µA | ||||
Reference input impedance | Internal reference disabled, gain = 1 | 170 | kΩ | ||||
Internal reference disabled, gain = 2 | 85 | ||||||
REFERENCE OUTPUT | |||||||
Output voltage | TA = 25°C | 2.495 | 2.5 | 2.505 | V | ||
Initial accuracy | TA = 25°C | –5 | ±0.1 | 5 | mV | ||
Output voltage temperature drift | 4 | 10 | ppm/°C | ||||
Output voltage noise | f = 0.1 Hz to 10 Hz | 12 | µVPP | ||||
Output voltage noise density (high-frequency noise) | TA = 25°C, f = 1 kHz, CL = 0 µF | 250 | nV/√Hz | ||||
TA = 25°C, f = 1 MHz, CL = 0 µF | 30 | ||||||
TA = 25°C, f = 1 MHz, CL = 4.7 µF | 10 | ||||||
Load regulation, sourcing(4) | TA = 25°C | 20 | µV/mA | ||||
Load regulation, sinking(4) | TA = 25°C | 185 | µV/mA | ||||
Output current load capability(2) | ±20 | mA | |||||
Line regulation | TA = 25°C | 50 | µV/V | ||||
Long-term stability and drift (aging)(4) | TA = 25°C, time = 0 to 1900 hours | 100 | ppm | ||||
Thermal hysteresis(4) | First cycle | 200 | ppm | ||||
Additional cycles | 50 | ||||||
POWER REQUIREMENTS(5) | |||||||
IDD | AVDD = 3.6 V to 5.5 V | Normal mode, internal reference off | 0.25 | 0.5 | mA | ||
Normal mode, internal reference on | 0.9 | 1.6 | |||||
Power-down modes(6) | 0.55 | 2 | µA | ||||
Power-down modes(7) | 0.55 | 4 | |||||
AVDD = 2.7 V to 3.6 V | Normal mode, internal reference off | 0.2 | 0.4 | mA | |||
Normal mode, internal reference on | 0.73 | 1.4 | |||||
Power-down modes(6) | 0.35 | 2 | µA | ||||
Power-down modes(7) | 0.35 | 3 | |||||
Power dissipation | AVDD = 3.6 V to 5.5 V | Normal mode, internal reference off | 0.9 | 2.75 | mW | ||
Normal mode, internal reference on | 3.2 | 8.8 | |||||
Power-down modes(6) | 2 | 11 | µW | ||||
Power-down modes(7) | 2 | 22 | |||||
AVDD = 2.7 V to 3.6 V | Normal mode, internal reference off | 0.54 | 1.44 | mW | |||
Normal mode, internal reference on | 1.97 | 5 | |||||
Power-down modes(6) | 0.95 | 7.2 | µW | ||||
Power-down modes(7) | 0.95 | 10.8 |
MIN | NOM | MAX | UNIT | ||
---|---|---|---|---|---|
f(SCLK) | Serial clock frequency | 50 | MHz | ||
t1 | SCLK falling edge to SYNC falling edge (for successful write operation) | 10 | ns | ||
t2 | SCLK cycle time | 20 | ns | ||
t3 | SYNC rising edge to 23rd SCLK falling edge (for successful SYNC interrupt) | 13 | ns | ||
t4 | Minimum SYNC HIGH time | 80 | ns | ||
t5 | SYNC to SCLK falling edge setup time | 13 | ns | ||
t6 | SCLK LOW time | 8 | ns | ||
t7 | SCLK HIGH time | 8 | ns | ||
t8 | SCLK falling edge to SYNC rising edge | 10 | ns | ||
t9 | Data setup time | 6 | ns | ||
t10 | Data hold time | 5 | ns | ||
t11 | SCLK falling edge to LDAC falling edge for asynchronous LDAC update mode | 5 | ns | ||
t12 | LDAC pulse duration, LOW time | 10 | ns | ||
t13 | CLR pulse duration, LOW time | 80 | ns | ||
t14 | CLR falling edge to start of VOUT transition | 100 | ns |
MEASUREMENT | POWER-SUPPLY VOLTAGE | FIGURE NUMBER | |
---|---|---|---|
Internal Reference Voltage vs Temperature | 5.5 V | Figure 2 | |
Internal Reference Voltage Temperature Drift Histogram | Figure 3 | ||
Internal Reference Voltage vs Load Current | Figure 4 | ||
Internal Reference Voltage vs Time | Figure 5 | ||
Internal Reference Noise Density vs Frequency | Figure 6 | ||
Internal Reference Voltage vs Supply Voltage | 2.7 V – 5.5 V | Figure 7 |
MEASUREMENT | POWER-SUPPLY VOLTAGE | FIGURE NUMBER | |
---|---|---|---|
FULL-SCALE, GAIN, OFFSET AND ZERO-CODE ERRORS | |||
Full-Scale Error vs Temperature | 5.5 V | Figure 16 | |
Gain Error vs Temperature | Figure 17 | ||
Offset Error vs Temperature | Figure 18 | ||
Zero-Code Error vs Temperature | Figure 19 | ||
Full-Scale Error vs Temperature | 2.7 V | Figure 63 | |
Gain Error vs Temperature | Figure 64 | ||
Offset Error vs Temperature | Figure 65 | ||
Zero-Code Error vs Temperature | Figure 66 | ||
LOAD REGULATION | |||
DAC Output Voltage vs Load Current | 5.5 V | Figure 30 | |
2.7 V | Figure 74 | ||
DIFFERENTIAL NONLINEARITY ERROR | |||
Differential Linearity Error vs Digital Input Code | T = –40°C | 5.5 V | Figure 9 |
T = 25°C | Figure 11 | ||
T = 125°C | Figure 13 | ||
Differential Linearity Error vs Temperature | Figure 15 | ||
Differential Linearity Error vs Digital Input Code | T = –40°C | 2.7 V | Figure 56 |
T = 25°C | Figure 58 | ||
T = 125°C | Figure 60 | ||
Differential Linearity Error vs Temperature | Figure 62 | ||
INTEGRAL NONLINEARITY ERROR (RELATIVE ACCURACY) | |||
Linearity Error vs Digital Input Code | T = –40°C | 5.5 V | Figure 8 |
T = 25°C | Figure 10 | ||
T = 125°C | Figure 12 | ||
Linearity Error vs Temperature | Figure 14 | ||
Linearity Error vs Digital Input Code | T = –40°C | 2.7 V | Figure 55 |
T = 25°C | Figure 57 | ||
T = 125°C | Figure 59 | ||
Linearity Error vs Temperature | Figure 61 | ||
POWER-DOWN CURRENT | |||
Power-Down Current vs Temperature | 5.5 V | Figure 28 | |
Power-Down Current vs Power-Supply Voltage | 2.7 V – 5.5 V | Figure 29 | |
Power-Down Current vs Temperature | 2.7 V | Figure 73 | |
POWER-SUPPLY CURRENT | |||
Power-Supply Current vs Temperature | External VREF | 5.5 V | Figure 20 |
Internal VREF | Figure 21 | ||
Power-Supply Current vs Digital Input Code | External VREF | Figure 22 | |
Internal VREF | Figure 23 | ||
Power-Supply Current Histogram | External VREF | Figure 24 | |
Internal VREF | Figure 25 | ||
Power-Supply Current vs Power-Supply Voltage | External VREF | 2.7 V – 5.5 V | Figure 26 |
Internal VREF | Figure 27 | ||
Power-Supply Current vs Temperature | External VREF | 3.6 V | Figure 49 |
Internal VREF | Figure 50 | ||
Power-Supply Current vs Digital Input Code | External VREF | Figure 51 | |
Internal VREF | Figure 52 | ||
Power-Supply Current Histogram | External VREF | Figure 53 | |
Internal VREF | Figure 54 | ||
Power-Supply Current vs Temperature | External VREF | 2.7 V | Figure 67 |
Internal VREF | Figure 68 | ||
Power-Supply Current vs Digital Input Code | External VREF | Figure 69 | |
Internal VREF | Figure 70 | ||
Power-Supply Current Histogram | External VREF | Figure 71 | |
Internal VREF | Figure 72 |
MEASUREMENT | POWER-SUPPLY VOLTAGE | FIGURE NUMBER | |
---|---|---|---|
CHANNEL-TO-CHANNEL CROSSTALK | |||
Channel-to-Channel Crosstalk | 5-V Rising Edge | 5.5 V | Figure 43 |
5-V Falling Edge | Figure 44 | ||
CLOCK FEEDTHROUGH | |||
Clock Feedthrough | 500 kHz, Mid-Scale | 5.5 V | Figure 48 |
2.7 V | Figure 87 | ||
GLITCH IMPULSE | |||
Glitch Impulse, 1-LSB Step | Rising Edge, Code 7FFFh to 8000h | 5.5 V | Figure 37 |
Falling Edge, Code 8000h to 7FFFh | Figure 38 | ||
Glitch Impulse, 4-LSB Step | Rising Edge, Code 7FFCh to 8000h | Figure 39 | |
Falling Edge, Code 8000h to 7FFCh | Figure 40 | ||
Glitch Impulse, 16-LSB Step | Rising Edge, Code 7FF0h to 8000h | Figure 41 | |
Falling Edge, Code 8000h to 7FF0h | Figure 42 | ||
Glitch Impulse, 1-LSB Step | Rising Edge, Code 7FFFh to 8000h | 2.7 V | Figure 79 |
Falling Edge, Code 8000h to 7FFFh | Figure 80 | ||
Glitch Impulse, 4-LSB Step | Rising Edge, Code 7FFCh to 8000h | Figure 81 | |
Falling Edge, Code 8000h to 7FFCh | Figure 82 | ||
Glitch Impulse, 16-LSB Step | Rising Edge, Code 7FF0h to 8000h | Figure 83 | |
Falling Edge, Code 8000h to 7FF0h | Figure 84 | ||
NOISE | |||
DAC Output Noise Density vs Frequency | External VREF | 5.5 V | Figure 45 |
Internal VREF | Figure 46 | ||
DAC Output Noise 0.1 Hz to 10 Hz | External VREF | Figure 47 | |
POWER-ON GLITCH | |||
Power-on Glitch | Reset to Zero Scale | 5.5 V | Figure 35 |
Reset to Mid-Scale | Figure 36 | ||
Reset to Zero Scale | 2.7 V | Figure 85 | |
Reset to Mid-Scale | Figure 86 | ||
SETTLING TIME | |||
Full-Scale Settling Time | Rising Edge, Code 0h to FFFFh | 5.5 V | Figure 31 |
Falling Edge, Code FFFFh to 0h | Figure 32 | ||
Half-Scale Settling Time | Rising Edge, Code 4000h to C000h | Figure 33 | |
Falling Edge, Code C000h to 4000h | Figure 34 | ||
Full-Scale Settling Time | Rising Edge, Code 0h to FFFFh | 2.7 V | Figure 75 |
Falling Edge, Code FFFFh to 0h | Figure 76 | ||
Half-Scale Settling Time | Rising Edge, Code 4000h to C000h | Figure 77 | |
Falling Edge, Code C000h to 4000h | Figure 78 |