JAJSUL1A May 2024 – July 2024 DRV8161 , DRV8162
ADVANCE INFORMATION
The DRV816x devices have adjustable VDS voltage monitors to detect overcurrent or short-circuit conditions on the external power MOSFETs. A MOSFET overcurrent event is sensed by monitoring the VDS voltage drop across the external MOSFET RDS(on). The high-side VDS monitors measure between the VDRAIN and SH pins. The low-side VDS monitors measure between the SH and SL pins. If the voltage across external MOSFET exceeds the VVDSLVL threshold for longer than the tDS_DG deglitch time, a VDS_OCP event is recognized. After detecting the VDS overcurrent event, all of the gate driver outputs are driven low to disable the external MOSFETs and nFAULT pin is driven low. The VDS threshold can be set between 0.1 V to 2.0 V by VDSLVL pin. The VDS deglitch time is fixed at tVDSDEG. The VDS OCP can be disabled by leaving VDSLVL pin open. After the over current condition is cleared, the fault state remains latched and can be cleared when INH(IN) and INL(EN) stay low for tCLRFLT time.