A. The worst case test pattern produces a maximum toggling of digital circuits, LVDS I/O and LVCMOS/ I/O.
B. Figure 1 and Figure 2 show a falling edge data strobe (IN_CLK).
Figure 1. Checker Board Test Pattern
A. The worst case test pattern produces a maximum toggling of digital circuits, LVDS I/O and LVCMOS/ I/O.
B. Recommended pin to signal mapping for 18 bits per pixel, customer may choose to define differently. The 16 grayscale test pattern tests device power consumption for a “typical” LCD display pattern. The test pattern approximates signal switching needed to produce groups of 16 vertical stripes across the display.
C. Figure 2 shows a falling edge data strobe (IN_CLK).