JAJSFJ7A May   2018  – September 2018 HD3SS3202

PRODUCTION DATA.  

  1. 1     特長
  2. 2     アプリケーション
  3. 3     概要
  4. DeviceImages
    1. 概略回路図 5
  5. 4     改訂履歴
  6. 5     Pin Configuration and Functions
    1. Pin Functions
  7. 6     Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 High-Speed Performance Parameters
    7. 6.7 Switching Characteristics
    8. 6.8 Typical Characteristics
  8. 7     Parameter Measurement Information
  9. 8     Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Output Enable and Power Savings
    4. 8.4 Device Functional Modes
  10. 9     Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Down Facing Port for USB3.1 Type C
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curves
    3. 9.3 Systems Examples
      1. 9.3.1 Up Facing Port for USB3.1 Type C
      2. 9.3.2 PCIE/USB
      3. 9.3.3 PCIE/eSATA
      4. 9.3.4 USB/eSATA
      5. 9.3.5 MIPI Camera Serial Interface
  11. 10    Power Supply Recommendations
  12. 11    Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  13. 12    デバイスおよびドキュメントのサポート
    1. 12.1 ドキュメントの更新通知を受け取る方法
    2. 12.2 コミュニティ・リソース
    3. 12.3 商標
    4. 12.4 静電気放電に関する注意事項
    5. 12.5 Glossary
  14. 13    メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VCC Supply voltage –0.5 4 V
Voltage Differential I/O –0.5 2.5 V
Control pins –0.5 VCC+ 0.5
Tstg Storage temperature –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Theseare stress ratings only, which do not imply functional operation of the device at these or anyother conditions beyond those indicated under Recommended OperatingConditions. Exposure to absolute-maximum-rated conditions for extended periods mayaffect device reliability.