4 改訂履歴
Changes from D Revision (September 2010) to E Revision
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Added 「ESD定格」表、「機能説明」セクション、「デバイスの機能モード」セクション、「アプリケーションと実装」セクション、「電源に関する推奨事項」セクション、「レイアウト」セクション、「デバイスおよびドキュメントのサポート」セクション、「メカニカル、パッケージ、および注文情報」セクションGo
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Changed 表紙の図Go
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Changed pin names in the pin description.Go
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Changed the temperature values in the Absolute Maximum Ratings tableGo
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Changed Ambient temperature from –25 to –40 in the MIN column. Go
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Deleted Temperature Range parameters from Electrical Characteristics.Go
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Changed I2C timing spec change based on characterization data. Go
Changes from C Revision (September, 2009) to D Revision
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Changed 「特長」の箇条書きで「高精度」を1%からBグレード・デバイスの0.5%にGo
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Added 「概要」に、デバイスのAおよびBグレードのバージョンに関する段落をGo
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Added new row to Packaging Information table to show new B-grade deviceGo
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Added B-grade columns in Electrical Characteristics for MIN, TYP and MAX valuesGo
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Changed Current Sense Gain Error over temperature specification from 10 ppm/°C to 1m%/°CGo
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Added Configure/Measure/Calculate ExampleGo
Changes from B Revision (June, 2009) to C Revision
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Changed specified temperature range from –25°C to –40°CGo
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Changed Offset Voltage (RTI) vs Temperature minimum specification from 0.1 μV/°C to 0.16 μV/°CGo
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Changed Typical Characteristics: Figure 3, Figure 4, Figure 5, Figure 6Go
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Changed Typical Characteristics: Figure 9, Figure 10Go