12 Revision History
Changes from Revision I (August 2023) to Revision J (October 2024)
- ドキュメント全体にわたって表、図、相互参照の採番方法を更新Go
- Updated distance through isolation, while maintaining other insulation specificationsGo
- Updated the input leakage current for ENx pins throughout the electrical characteristic sections Go
- Updated the TDDB plot and the projected lifetimeGo
- Deleted the Community Resources section and added the
Support Resources sectionGo
Changes from Revision H (March 2023) to Revision I (August 2023)
- Updated Thermal Characteristics, Safety Limiting Values, and Thermal Derating Curves to provide more accurate system-level thermal calculationsGo
- Updated electrical and switching characteristics to match device performanceGo
Changes from Revision G (March 2020) to Revision H (March 2023)
- ドキュメント全体を通して標準名を以下のように変更:「DIN V VDE V 0884-11:2017-01」から「DIN EN IEC 60747-17 (VDE 0884-17)」Go
- ドキュメント全体を通して、IEC/EN/CSA 60950-1 規格への参照を削除Go
- ドキュメント全体を通して、すべての標準名から標準リビジョンおよび年への参照を削除Go
- Added Maximum impulse voltage (VIMP) specification per DIN EN IEC 60747-17 (VDE 0884-17)Go
- Changed test conditions and values of Maximum surge isolation voltage (VIOSM) specification per DIN EN IEC 60747-17 (VDE 0884-17)Go
- Clarified method b test conditions of Apparent charge (qPD)Go
- Changed values of Maximum surge isolation voltage (VIOSM) specification per DIN EN IEC 60747-17 (VDE 0884-17)Go