SLLSFK3 november 2022 ISOW7741-Q1 , ISOW7742-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
Channel Isolation | ||||||
VITH | Input pin rising threshold | 0.7 x VSI | V | |||
VITL | Input pin falling threshold | 0.3 x VSI | V | |||
VI(HYS) | Input pin threshold hysteresis (INx) | 0.1 x VSI | V | |||
IIL | Low level input current | VIL = 0 at INx | -25 | µA | ||
IIH | High level input current | VIH = VSI(1) at INx | 25 | µA | ||
VOH | High level output voltage | IO = –1 mA, see Switching Characteristics Test Circuit and Voltage Waveforms | VSO(1) – 0.1 | V | ||
VOL | Low level output voltage | IO = 1 mA, see Switching Characteristics Test Circuit and Voltage Waveforms | 0.1 | V | ||
CMTI | Common mode transient immunity | VI = VSI or 0 V, VCM = 1000 V; see Common-Mode Transient Immunity Test Circuit | 85 | 100 | kV/us |