JAJSB70C July   2000  – October 2018 LF198-N , LF298 , LF398-N

PRODUCTION DATA.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
    1.     Device Images
      1.      代表的な接続
      2.      アクイジション時間
  4. 4 改訂履歴
  5. 5 概要（続き）
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 Recommended Operating Conditions
    3. 7.3 Thermal Information
    4. 7.4 Electrical Characteristics, LF198-N and LF298
    5. 7.5 Electrical Characteristics, LF198A-N
    6. 7.6 Electrical Characteristics, LF398-N
    7. 7.7 Electrical Characteristics, LF398A-N (OBSOLETE)
    8. 7.8 Typical Characteristics
  8. 8 Parameter Measurement Information
    1. 8.1 TTL and CMOS 3 V ≤ VLOGIC (Hi State) ≤ 7 V
    2. 8.2 CMOS 7 V ≤ VLOGIC (Hi State) ≤ 15 V
    3. 8.3 Operational Amplifier Drive
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
    4. 9.4 Device Functional Modes
  10. 10Application and Implementation
    1. 10.1 Application Information
      1. 10.1.1 Hold Capacitor
      2. 10.1.2 DC and AC Zeroing
      3. 10.1.3 Logic Rise Time
      4. 10.1.4 Sampling Dynamic Signals
      5. 10.1.5 Digital Feedthrough
    2. 10.2 Typical Applications
      1. 10.2.1  X1000 Sample and Hold
        1. 10.2.1.1 Design Requirements
        2. 10.2.1.2 Detailed Design Procedure
        3. 10.2.1.3 Application Curves
      2. 10.2.2  Sample and Difference Circuit
      3. 10.2.3  Ramp Generator With Variable Reset Level
      4. 10.2.4  Integrator With Programmable Reset Level
      5. 10.2.5  Output Holds at Average of Sampled Input
      6. 10.2.6  Increased Slew Current
      7. 10.2.7  Reset Stabilized Amplifier
      8. 10.2.8  Fast Acquisition, Low Droop Sample and Hold
      9. 10.2.9  Synchronous Correlator for Recovering Signals Below Noise Level
      10. 10.2.10 2-Channel Switch
      11. 10.2.11 DC and AC Zeroing
      12. 10.2.12 Staircase Generator
      13. 10.2.13 Differential Hold
      14. 10.2.14 Capacitor Hysteresis Compensation
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13デバイスおよびドキュメントのサポート
    1. 13.1 デバイス・サポート
      1. 13.1.1 デバイスの項目表記
    2. 13.2 関連リンク
    3. 13.3 コミュニティ・リソース
    4. 13.4 商標
    5. 13.5 静電気放電に関する注意事項
    6. 13.6 Glossary
  14. 14メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.7 Electrical Characteristics, LF398A-N (OBSOLETE)

The following specifications apply for –VS + 3.5 V ≤ VIN ≤ +VS – 3.5 V, +VS = +15 V, –VS = –15 V, TA = TJ = 25°C, Ch = 0.01 µF, RL = 10 kΩ, LOGIC REFERENCE = 0 V, LOGIC HIGH = 2.5 V, LOGIC LOW = 0 V unless otherwise specified.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Input offset voltage(1) TJ = 25°C 2 2 mV
Full temperature range 3 mV
Input bias current(1) TJ = 25°C 10 25 nA
Full temperature range 50 nA
Input impedance TJ = 25°C 10 GΩ
Gain error TJ = 25°C, RL = 10 k 0.004% 0.005%
Full temperature range 0.01%
Feedthrough attenuation ratio at 1 kHz TJ = 25°C, Ch = 0.01 µF 86 90 dB
Output impedance TJ = 25°C, “HOLD” mode 0.5 1 Ω
Full temperature range 6 Ω
HOLD step(2) TJ = 25°C, Ch = 0.01 µF, VOUT = 0 1 1 mV
Supply current(1) TJ ≥ 25°C 4.5 6.5 mA
Logic and logic reference input current TJ = 25°C 2 10 µA
Leakage current into hold capacitor(1) TJ = 25°C, hold mode(3) 30 100 pA
Acquisition time to 0.1% ΔVOUT = 10 V, Ch = 1000 pF 4 6 µs
CH = 0.01 µF 20 25 µs
Hold capacitor charging current VIN – VOUT = 2 V 5 mA
Supply voltage rejection ratio VOUT = 0 90 110 dB
Differential logic threshold TJ = 25°C 0.8 1.4 2.4 V
(1) These parameters ensured over a supply voltage range of ±5 to ±18 V, and an input range of –VS + 3.5 V ≤ VIN ≤ +VS – 3.5 V.
(2) Hold step is sensitive to stray capacitive coupling between input logic signals and the hold capacitor. 1 pF, for instance, will create an additional 0.5-mV step with a 5-V logic swing and a 0.01-µF hold capacitor. Magnitude of the hold step is inversely proportional to hold capacitor value.
(3) Leakage current is measured at a junction temperature of 25°C. The effects of junction temperature rise due to power dissipation or elevated ambient can be calculated by doubling the 25°C value for each 11°C increase in chip temperature. Leakage is guaranteed over full input signal range.