JAJSRF3A September 2023 – October 2023 LM2104
PRODUCTION DATA
デバイスごとのパッケージ図は、PDF版データシートをご参照ください。
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
PROPAGATION DELAYS | ||||||
tDLRF | VIN rising to VGL falling | VIN = 0 V to 3 V, CLOAD = 0 pF, SD = 3 V. Measure time from 50% of the input to 90% of the output. | 115 | ns | ||
tDHFF | VIN falling to VGH falling | VIN = 3 V to 0 V, CLOAD = 0 pF, SD = 3 V. Measure time from 50% of the input to 90% of the output. | 115 | ns | ||
tDLFR | VIN falling to VGL rising | VIN = 3 V to 0 V, CLOAD = 0 pF, SD = 3 V. Measure time from 50% of the input to 10% of the output. | 600 | ns | ||
tDHRR | VIN rising to VGH rising | VIN = 0 V to 3 V, CLOAD = 0 pF, SD = 3 V. Measure time from 50% of the input to 10% of the output. | 600 | ns | ||
tSDF | VSD falling to output falling | VSD = 3 V to 0 V, VIN = 3 V, CLOAD = 0 pF. Measure time from 50% of the input to 90% of the output. | 115 | ns | ||
tSDR | VSD rising to output rising | VSD = 0 V to 3 V, VIN = 3 V, CLOAD = 0 pF. Measure time from 50% of the input to 10% of the output. | 115 | ns | ||
DEADTIME | ||||||
tDT | Internal Deadtime | 475 | ns | |||
OUTPUT RISE AND FALL TIME | ||||||
tR_GL | GL | CLOAD = 1000 pF, VIN = 0-3 V, VSD = 3 V | 28 | ns | ||
tR_GH | GH | CLOAD = 1000 pF, VIN = 0-3 V, VSD = 3 V | 28 | ns | ||
tF_GL | GL | CLOAD = 1000 pF, VIN = 0-3 V, VSD = 3 V | 18 | ns | ||
tF_GH | GH | CLOAD = 1000 pF, VIN = 0-3 V, VSD = 3 V | 18 | ns |