6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
|
MIN |
MAX |
UNIT |
VIN |
6 |
75 |
V |
VIN to RTN |
–0.3 |
76 |
V |
BST to RTN |
–0.3 |
90 |
V |
SW to RTN (steady state) |
|
–1.5 |
V |
BST to VCC |
|
76 |
V |
BST to SW |
|
14 |
V |
VCC to RTN |
–0.3 |
14 |
V |
SGND to RTN |
–0.3 |
0.3 |
V |
SS to RTN |
–0.3 |
4 |
V |
VIN to SW |
|
76 |
V |
All other inputs to RTN |
–0.3 |
7 |
V |
Lead temperature (soldering, 4 sec)(2) |
|
260 |
°C |
Junction temperature (LM5010A, Q1,Q0) |
–40 |
150 |
°C |
Storage temperature, Tstg |
–65 |
150 |
°C |
(1) Stresses beyond those listed under
Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) For detailed information on soldering plastic HTSSOP and WSON packages, see
メカニカル、パッケージ、および注文情報.
6.2 ESD Ratings: LM5010A
|
VALUE |
UNIT |
V(ESD) |
Electrostatic discharge |
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) |
±2000 |
V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) |
±750 |
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 ESD Ratings: LM5010A-Q1, LM5010-Q0
|
VALUE |
UNIT |
V(ESD) |
Electrostatic discharge |
Human-body model (HBM), per AEC Q100-002(1)(2) |
±2000 |
V |
Charged-device model (CDM), per AEC Q100-011(3) |
±750 |
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
(2) Level listed above is the passing level per ANSI/ESDA/JEDEC JS-001. JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process.
(3) Level listed above is the passing level per EIA-JEDEC JESD22-C101. JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process.
6.4 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
|
MIN |
NOM |
MAX |
UNIT |
VIN |
Input voltage |
6 |
|
75 |
V |
IO |
Output current |
|
|
1 |
A |
Ext-VCC |
External bias voltage(1) |
8 |
|
13 |
V |
TJ |
Operating junction temperature |
LM5010A |
–40 |
|
125 |
°C |
LM5010A-Q1, LM5010-Q0 |
–40 |
|
150 |
°C |
(1) VCC provides bias for the internal gate drive and control circuits. Device thermal limitations limit external loading.
6.5 Thermal Information
THERMAL METRIC(1) |
LM5010A, LM5010A-Q1 |
UNIT |
DPR (WSON) |
PWP (HTSSOP) |
10 PINS |
14 PINS |
RθJA |
Junction-to-ambient thermal resistance |
36 |
41.1 |
°C/W |
RθJC(top) |
Junction-to-case (top) thermal resistance |
31.9 |
26.5 |
°C/W |
RθJB |
Junction-to-board thermal resistance |
13.2 |
22.5 |
°C/W |
ψJT |
Junction-to-top characterization parameter |
0.3 |
0.7 |
°C/W |
ψJB |
Junction-to-board characterization parameter |
13.5 |
22.2 |
°C/W |
RθJC(bot) |
Junction-to-case (bottom) thermal resistance |
3 |
3.3 |
°C/W |
(1) For more information about traditional and new thermal metrics, see the
Semiconductor and IC Package Thermal Metrics application report,
SPRA953.
6.6 Electrical Characteristics
Typical values correspond to TJ = 25°C, minimum and maximum limits apply over TJ = –40°C to 125°C, VIN = 48 V, and
RON = 200 kΩ (unless otherwise noted).(1)
PARAMETER |
TEST CONDITIONS |
MIN |
TYP |
MAX |
UNIT |
VCC REGULATOR |
VCCReg |
VCC regulated output |
|
6.6 |
7 |
7.4 |
V |
|
VIN - VCC |
ICC = 0 mA, FS < 200 kHz, 6 V ≤ VIN ≤ 8.5 V |
|
100 |
|
mV |
|
VCC Bypass threshold |
VIN increasing |
|
8.9 |
|
V |
|
VCC Bypass hysteresis |
VIN decreasing |
|
260 |
|
mV |
|
VCC Output impedance (0 mA ≤ ICC ≤ 5 mA) |
VIN = 6 V |
|
55 |
|
Ω |
VIN = 8 V |
|
50 |
|
VIN = 48 V |
|
0.21 |
|
|
VCC Current limit |
VIN = 48 V, VCC = 0 V |
|
15 |
|
mA |
UVLOVCC |
VCC undervoltage lockout threshold |
VCC increasing |
|
5.25 |
|
V |
|
UVLOVCC hysteresis |
VCC decreasing |
|
180 |
|
mV |
|
UVLOVCC filter delay |
100 mV overdrive |
|
3 |
|
µs |
|
IIN Operating current |
Non-switching, FB = 3 V |
|
675 |
950 |
µA |
|
IIN Shutdown current |
RON/SD = 0 V |
|
100 |
200 |
µA |
SOFT-START PIN |
ISS |
Internal current source |
|
8 |
11.5 |
15 |
µA |
CURRENT LIMIT |
ILIM |
Threshold |
Current out of ISEN |
1 |
1.25 |
1.5 |
A |
|
Resistance from ISEN to SGND |
|
|
130 |
|
mΩ |
|
Response time |
|
|
150 |
|
ns |
ON TIMER, RON/SD PIN |
|
Shutdown threshold |
Voltage at RON/SD rising |
0.3 |
0.7 |
1.05 |
V |
|
Threshold hysteresis |
|
|
40 |
|
mV |
REGULATION AND OVER-VOLTAGE COMPARATORS (FB PIN) |
VREF |
FB regulation threshold |
TJ ≤ 125°C |
2.445 |
2.5 |
2.55 |
V |
TJ ≤ 150°C, over full operating junction temperature range |
2.435 |
|
|
|
2.44 |
|
|
|
FB overvoltage threshold |
|
|
2.9 |
|
V |
|
FB bias current |
|
|
1 |
|
nA |
THERMAL SHUTDOWN |
TSD |
Thermal shutdown temperature |
|
|
175 |
|
°C |
Thermal shutdown hysteresis |
|
|
20 |
|
°C |
(1) All minimum and maximum limits are specified by correlating the electrical characteristics to process and temperature variations and applying statistical process control.
6.7 Switching Characteristics
Typical values correspond to TJ = 25°C, minimum and maximum limits apply over TJ = –40°C to 125°C, and VIN = 48 V (unless otherwise noted)(1)
PARAMETER |
TEST CONDITIONS |
MIN |
TYP |
MAX |
UNIT |
RDS(ON) |
Buck switch |
ISW = 200 mA |
TJ ≤ 125°C |
|
0.35 |
0.8 |
Ω |
TJ ≤ 150°C, over full operating junction temperature range |
|
|
0.85 |
UVLOGD |
Gate drive UVLO |
VBST - VSW increasing |
1.7 |
3 |
4 |
V |
|
UVLOGD Hysteresis |
|
|
400 |
|
mV |
OFF TIMER |
tOFF |
Minimum OFF-time |
|
|
260 |
|
ns |
ON TIMER |
tON - 1 |
ON-time |
VIN = 10 V, RON = 200 kΩ |
2.1 |
2.75 |
3.4 |
µs |
tON - 2 |
ON-time |
VIN = 75 V, RON = 200 kΩ |
290 |
390 |
496 |
ns |
(1) All minimum and maximum limits are specified by correlating the electrical characteristics to process and temperature variations while applying statistical process control.
Figure 1. Start-Up Sequence
6.8 Typical Characteristics
at TA = 25°C (unless otherwise noted)
Figure 2. VCC vs VIN
Figure 4. ICC vs Externally Applied VCC
Figure 6. Voltage at RON/SD Pin
Figure 3. VCC vs ICC
Figure 5. ON-Time vs VIN and RON
Figure 7. IIN vs VIN