JAJSUH5F July   2005  – August 2024 LMH6702QML-SP

PRODUCTION DATA  

  1.   1
  2. 1特長
  3. 2アプリケーション
  4. 3概要
  5. 4Pin Configuration and Functions
  6. 5Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 Recommended Operating Conditions
    3. 5.3 Quality Conformance Inspection
    4. 5.4 Electrical Characteristics: DC Parameters
    5. 5.5 Electrical Characteristics: AC Parameters
    6. 5.6 Electrical Characteristics: Drift Values Parameters
    7. 5.7 Typical Characteristics
  7. 6Application and Implementation
    1. 6.1 Application Information
      1. 6.1.1 Feedback Resistor
      2. 6.1.2 Harmonic Distortion
      3. 6.1.3 Capacitive Load Drive
      4. 6.1.4 DC Accuracy and Noise
    2. 6.2 Layout
      1. 6.2.1 Layout Guidelines
  8. 7Device and Documentation Support
    1. 7.1 ドキュメントの更新通知を受け取る方法
    2. 7.2 サポート・リソース
    3. 7.3 Trademarks
    4. 7.4 静電気放電に関する注意事項
    5. 7.5 用語集
  9. 8Revision History
  10. 9Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

5.4 Electrical Characteristics: DC Parameters

The following conditions apply (unless otherwise specified)(1)(2):
RL = 100Ω, VCC = ±5VDC, AV = +2 feedback resistor (RF) = 250Ω, gain resistor (RG) = 250Ω
PARAMETER TEST CONDITIONS NOTES MIN MAX UNIT SUB- GROUPS
IBN Input bias current, noninverting –15 15 μA 1, 2
–21 21 μA 3
IBI Input bias current, inverting –30 30 μA 1, 2
–34 34 μA 3
VIO Input offset voltage –4.5 4.5 mV 1, 3
–6.0 6.0 mV 2
ICC Supply current, no load RL = ∞ 15 mA 1, 2, 3
PSSR Power supply rejection ratio –VCC = –4.5V to –5.0V,
+VCC = 4.5V to 5.0V		 45 dB 1, 2, 3
(1) The algebraic convention, whereby the most negative value is a minimum and most positive is a maximum, is used in this table. Negative current shall be defined as conventional current flow out of a device terminal.
(2) Pre- and post-irradiation limits are identical to those listed under the dc parameter tables. Post-irradiation testing is conducted at room temperature, 25°C, only. Testing is performed as specified in MIL-STD-883 Test Method 1019 Condition A. The ELDRS-Free part is also tested per Test Method 1019 Conditions D.