6 Specifications
6.1 Absolute Maximum Ratings
See (1)(2)
|
MIN |
MAX |
UNIT |
Supply voltage (V+ – V−) |
|
5.5 |
V |
Differential input voltage |
Supply Voltage |
|
Voltage between any two pins |
Supply Voltage |
|
Output short circuit duration(3) |
Current at input pin |
|
±5 |
mA |
Soldering information |
Infrared or convection (20 sec.) |
|
235 |
°C |
Wave soldering (10 sec.) (Lead temp) |
|
260 |
°C |
Junction temperature |
|
150 |
°C |
Storage temperature, Tstg |
−65 |
150 |
°C |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and specifications.
(3) Applies to both single supply and split supply operation. Continuous short circuit operation at elevated ambient temperature can result in exceeding the maximum allowed junction temperature of 150°C. Output current in excess of ±25 mA over long term may adversely affect reliability.
6.2 ESD Ratings: LMV761, LMV762
|
VALUE |
UNIT |
V(ESD) |
Electrostatic discharge(2) |
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) |
± 2000 |
V |
Machine model |
± 200 |
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) Unless otherwise specified human body model is 1.5 kΩ in series with 100 pF. Machine model 200 pF.
6.3 ESD Ratings: LMV762Q-Q1
|
VALUE |
UNIT |
V(ESD) |
Electrostatic discharge |
Human-body model (HBM), per AEC Q100-002(1) |
± 2000 |
V |
Machine model |
± 200 |
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
6.4 Recommended Operating Conditions
|
MIN |
MAX |
UNIT |
Supply voltage (V+ – V−) |
2.7 |
5.25 |
V |
Temperature range |
−40 |
125 |
°C |
6.5 Thermal Information
THERMAL METRIC(1) |
LMV761 |
LMV762, LMV762Q-Q1 |
UNIT |
D (SOIC) |
DBV (SOT-23) |
DGK (VSSOP) |
8 PINS |
6 PINS |
8 PINS |
RθJA |
Junction-to-ambient thermal resistance (2) |
190 |
265 |
235 |
°C/W |
(1) For more information about traditional and new thermal metrics, see the
Semiconductor and IC Package Thermal Metrics application report,
SPRA953.
(2) The maximum power dissipation is a function of TJ(MAX), θJA, and TA. The maximum allowable power dissipation at any ambient temperature is PD = (TJ(MAX) – TA) RθJA. All numbers apply for packages soldered directly into a PCB.
6.6 2.7-V Electrical Characteristics
Unless otherwise specified, all limited ensured for TJ = 25°C, VCM = V+ / 2, V+ = 2.7 V, V− = 0 V−.
PARAMETER |
TEST CONDITIONS |
MIN(4) |
TYP(3) |
MAX(4) |
UNIT |
VOS |
Input offset voltage |
|
|
0.2 |
|
mV |
apply at the temperature extremes(2) |
|
|
1 |
IB |
Input bias current(5) |
|
|
0.2 |
50 |
pA |
IOS |
Input offset current(5) |
|
|
0.001 |
5 |
pA |
CMRR |
Common-mode rejection ratio |
0 V < VCM < VCC – 1.3 V |
80 |
100 |
|
dB |
PSRR |
Power supply rejection ratio |
V+ = 2.7 V to 5 V |
80 |
110 |
|
dB |
CMVR |
Input common-mode voltage range |
CMRR > 50 dB |
apply at the temperature extremes(2) |
−0.3 |
|
1.5 |
V |
VO |
Output swing high |
IL = 2 mA, VID = 200 mV |
V+ – 0.35 |
V+ – 0.1 |
|
V |
Output swing low |
IL = −2 mA, VID = –200 mV |
|
90 |
250 |
mV |
ISC |
Output short circuit current(1) |
Sourcing, VO = 1.35 V, VID = 200 mV |
6 |
20 |
|
mA |
Sinking, VO = 1.35 V, VID = –200 mV |
6 |
15 |
|
IS |
Supply current LMV761 (single comparator) |
|
|
275 |
700 |
μA |
LMV762, LMV762Q-Q1 (both comparators) |
|
|
550 |
|
μA |
apply at the temperature extremes(2) |
|
|
1400 |
IOUT LEAKAGE |
Output leakage I at shutdown |
SD = GND, VO = 2.7 V |
|
0.2 |
|
μA |
IS LEAKAGE |
Supply leakage I at shutdown |
SD = GND, VCC = 2.7 V |
|
0.2 |
2 |
μA |
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that T
J = T
A. No ensured specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where T
J > T
A. See
Recommended Operating Conditions for information on temperature de-rating of this device. Absolute Maximum Rating indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically.
(2) Maximum temperature ensured range is −40°C to +125°C.
(3) Typical values represent the most likely parametric norm.
(4) All limits are specified by testing or statistical analysis.
(5) Specified by design.
6.7 5-V Electrical Characteristics
Unless otherwise specified, all limited ensured for TJ = 25°C, VCM = V+ / 2, V+ = 5 V, V− = 0 V−.
PARAMETER |
TEST CONDITIONS |
MIN(4) |
TYP(3) |
MAX(4) |
UNIT |
VOS |
Input offset voltage |
|
|
0.2 |
|
mV |
apply at the temperature extremes(2) |
|
|
1 |
IB |
Input bias current(5) |
|
|
0.2 |
50 |
pA |
IOS |
Input offset current(5) |
|
|
0.01 |
5 |
pA |
CMRR |
Common-mode rejection ratio |
0 V < VCM < VCC – 1.3 V |
80 |
100 |
|
dB |
PSRR |
Power supply rejection ratio |
V+ = 2.7 V to 5 V |
80 |
110 |
|
dB |
CMVR |
Input common-mode voltage range |
CMRR > 50 dB |
apply at the temperature extremes(2) |
−0.3 |
|
3.8 |
V |
VO |
Output swing high |
IL = 4 mA, VID = 200 mV |
V+ – 0.35 |
V+ – 0.1 |
|
V |
Output swing low |
IL = –4 mA, VID = –200 mV |
|
120 |
250 |
mV |
ISC |
Output short circuit current(1) |
Sourcing, VO = 2.5 V, VID = 200 mV |
6 |
60 |
|
mA |
Sinking, VO = 2.5 V, VID = −200 mV |
6 |
40 |
|
IS |
Supply current LMV761 (single comparator) |
|
|
225 |
700 |
μA |
LMV762, LMV762Q-Q1 (both comparators) |
|
|
450 |
|
μA |
apply at the temperature extremes(2) |
|
|
1400 |
IOUT LEAKAGE |
Output leakage I at shutdown |
SD = GND, VO = 5 V |
|
0.2 |
|
μA |
IS LEAKAGE |
Supply leakage I at shutdown |
SD = GND, VCC = 5 V |
|
0.2 |
2 |
μA |
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that T
J = T
A. No ensured specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where T
J > T
A. See
Recommended Operating Conditions for information on temperature de-rating of this device. Absolute Maximum Rating indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically.
(2) Maximum temperature ensured range is −40°C to +125°C.
(3) Typical values represent the most likely parametric norm.
(4) All limits are specified by testing or statistical analysis.
(5) Specified by design.
6.8 2-V Switching Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER |
TEST CONDITIONS |
MIN |
TYP |
MAX |
UNIT |
tPD |
Propagation delay RL = 5.1 kΩ CL = 50 pF |
Overdrive = 5 mV |
|
270 |
|
ns |
Overdrive = 10 mV |
|
205 |
|
Overdrive = 50 mV |
|
120 |
|
tSKEW |
Propagation delay skew |
|
|
5 |
|
ns |
tr |
Output rise time |
10% to 90% |
|
1.7 |
|
ns |
tf |
Output fall time |
90% to 10% |
|
1.8 |
|
ns |
ton |
Turnon time from shutdown |
|
|
6 |
|
μs |
6.9 5-V Switching Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER |
TEST CONDITIONS |
MIN |
TYP |
MAX |
UNIT |
tPD |
Propagation delay RL = 5.1 kΩ CL = 50 pF |
Overdrive = 5 mV |
|
225 |
|
ns |
Overdrive = 10 mV |
|
190 |
|
Overdrive = 50 mV |
|
120 |
|
tSKEW |
Propagation delay skew |
|
|
5 |
|
ns |
tr |
Output rise time |
10% to 90% |
|
1.7 |
|
ns |
tf |
Output fall time |
90% to 10% |
|
1.5 |
|
ns |
ton |
Turnon time from shutdown |
|
|
4 |
|
μs |
6.10 Typical Characteristics
Figure 1. PSI vs VCC
Figure 3. VOS vs VCC
Figure 5. Input Bias vs Common Mode at 25°C
Figure 7. Output Voltage vs Supply Voltage
Figure 9. Output Voltage vs Supply Voltage
Figure 11. ISINK vs VOUT
Figure 13. ISINK vs VOUT
Figure 15. Response Time vs Input Overdrives Positive Transition
Figure 17. Response Time vs Input Overdrives Negative Transition
Figure 2. PSI vs VCC
Figure 4. Input Bias vs Common Mode at 25°C
Figure 6. Output Voltage vs Supply Voltage
Figure 8. Output Voltage vs Supply Voltage
Figure 10. ISOURCE vs VOUT
Figure 12. ISOURCE vs VOUT
Figure 14. Prop Delay vs Overdrive
Figure 16. Response Time vs Input Overdrives Positive Transition
Figure 18. Response Time vs Input Overdrives Negative Transition