SNVSA77D December 2015 – November 2016 LP5912
PRODUCTION DATA.
MIN | MAX | UNIT | |||
---|---|---|---|---|---|
VIN | Input voltage | –0.3 | 7 | V | |
VOUT | Output voltage | –0.3 | 7 | V | |
VEN | Enable input voltage | -0.3 | 7 | V | |
VPG | Power Good (PG) pin OFF voltage | –0.3 | 7 | V | |
TJ | Junction temperature | 150 | °C | ||
PD | Continuous power dissipation(3) | Internally Limited | W | ||
Tstg | Storage temperature | –65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±2000 | V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±1000 |
MIN | MAX | UNIT | ||
---|---|---|---|---|
VIN | Input supply voltage | 1.6 | 6.5 | V |
VOUT | Output voltage | 0.8 | 5.5 | |
VEN | Enable input voltage | 0 | VIN | |
VPG | PG pin OFF voltage | 0 | 6.5 | |
IOUT | Output current | 0 | 500 | mA |
TJ-MAX-OP | Operating junction temperature(2) | –40 | 125 | °C |
THERMAL METRIC(1) | LP5912 | UNIT | |
---|---|---|---|
DRV (WSON) | |||
6 PINS | |||
RθJA | Junction-to-ambient thermal resistance, High-K(2) | 71.2(3) | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 93.7 | °C/W |
RθJB | Junction-to-board thermal resistance | 40.7 | °C/W |
ψJT | Junction-to-top characterization parameter | 2.5 | °C/W |
ψJB | Junction-to-board characterization parameter | 41.1 | °C/W |
RJC(bot) | Junction-to-case (bottom) thermal resistance | 11.2 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
OUTPUT VOLTAGE | ||||||
ΔVOUT | Output voltage tolerance | For VOUT(NOM) ≥ 3.3 V: VOUT(NOM) + 0.5 V ≤ VIN ≤ 6.5 V, IOUT = 1 mA to 500 mA |
–2% | 2% | ||
For 1.1 V ≤ VOUT(NOM) < 3.3 V: VOUT(NOM) + 0.5 V ≤ VIN ≤ 6.5 V, IOUT = 1 mA to 500 mA |
–3% | 3% | ||||
For VOUT(NOM) < 1.1 V: 1.6 V ≤ VIN ≤ 6.5 V, IOUT = 1 mA to 500 mA |
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Line regulation | For VOUT(NOM) ≥ 1.1V: VOUT(NOM) + 0.5 V ≤ VIN ≤ 6.5 V |
0.8 | %/V | |||
For VOUT(NOM) < 1.1V : 1.6 V ≤ VIN ≤ 6.5 V |
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Load regulation | IOUT = 1 mA to 500 mA | 0.0022 | %/mA | |||
CURRENT LEVELS | ||||||
ISC | Short-circuit current limit | TJ = 25°C, see(4) | 700 | 900 | 1100 | mA |
IRO | Reverse leakage current(5) | VEN = VIN = 0 V, VOUT = 5.5 V | 10 | 150 | µA | |
IQ | Quiescent current(6) | VEN = 1.3 V, IOUT = 0 mA | 30 | 55 | µA | |
VEN = 1.3 V, IOUT = 500 mA | 400 | 600 | ||||
IQ(SD) | Quiescent current, shutdown mode(6) | VEN = 0 V –40°C ≤ TJ ≤ 85°C |
0.2 | 1.5 | µA | |
VEN = 0 V |
0.2 | 5 | ||||
IG | Ground current(7) | VEN = 1.3 V, IOUT = 0 mA | 35 | µA | ||
VDO DROPOUT VOLTAGE | ||||||
VDO | Dropout voltage(8) | IOUT = 500 mA, 1.6 V ≤ VOUT(NOM) < 3.3 V | 170 | 250 | mV | |
IOUT = 500 mA, 3.3 V ≤ VOUT(NOM) ≤ 5.5 V | 95 | 180 | mV | |||
VIN to VOUT RIPPLE REJECTION | ||||||
PSRR | Power Supply Rejection Ratio(10) | ƒ = 100 Hz, VOUT ≥ 1.1 V, IOUT = 20 mA | 80 | dB | ||
ƒ = 1 kHz, VOUT ≥ 1.1 V, IOUT = 20 mA | 75 | |||||
ƒ = 10 kHz, VOUT ≥ 1.1 V, IOUT = 20 mA | 65 | |||||
ƒ = 100 kHz, VOUT ≥ 1.1 V, IOUT = 20 mA | 40 | |||||
ƒ = 100 Hz, 0.8 V < VOUT < 1.1 V, IOUT = 20 mA | 65 | |||||
ƒ = 1 kHz, 0.8 V < VOUT < 1.1 V, IOUT = 20 mA | 65 | |||||
ƒ = 10 kHz, 0.8 V < VOUT < 1.1 V, IOUT = 20 mA | 65 | |||||
ƒ = 100 kHz, 0.8 V < VOUT < 1.1 V, IOUT = 20 mA | 40 | |||||
OUTPUT NOISE VOLTAGE | ||||||
eN | Noise voltage | IOUT = 1 mA, BW = 10 Hz to 100 kHz | 12 | µVRMS | ||
IOUT = 500 mA, BW = 10 Hz to 100 kHz | 12 | |||||
THERMAL SHUTDOWN | ||||||
TSD | Thermal shutdown temperature | 160 | °C | |||
THYS | Thermal shutdown hysteresis | 15 | °C | |||
LOGIC INPUT THRESHOLDS | ||||||
VEN(OFF) | OFF Threshold | VIN = 1.6 V to 6.5 V VEN falling until device is disabled |
0.3 | V | ||
VEN(ON) | ON Threshold | 1.6 V ≤ VIN ≤ 6.5 V VEN rising until device is enabled |
1.3 | |||
IEN | Input current at EN pin(9) | VEN = 6.5 V, VIN = 6.5 V | 2.5 | µA | ||
VEN = 0 V, VIN = 3.3 V | 0.001 | |||||
PGHTH | PG high threshold (% of nominal VOUT) | 94% | ||||
PGLTH | PG low threshold (% of nominal VOUT) | 90% | ||||
VOL(PG) | PG pin low-level output voltage | VOUT < PGLTH, sink current = 1 mA | 100 | mV | ||
IlKG(PG) | PG pin leakage current | VOUT < PGHTH, VPG = 6.5 V | 1 | µA | ||
tPGD | PG delay time | Time from VOUT > PG threshold to PG toggling | 140 | µs | ||
TRANSITION CHARACTERISTICS | ||||||
ΔVOUT | Line transients(10) | For VIN ↑ and VOUT(NOM) ≥ 1.1 V: VIN = (VOUT(NOM) + 0.5 V) to (VOUT(NOM) + 1.1 V) VIN trise = 30 µs |
1 | mV | ||
For VIN ↑ and VOUT(NOM) < 1.1 V: VIN = 1.6 V to 2.2 V VIN trise = 30 µs |
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For VIN ↓ and VOUT(NOM) ≥ 1.1 V VIN = (VOUT(NOM) + 1.1 V) to (VOUT(NOM) + 0.5 V) VIN tfall = 30 µs |
–1 | |||||
For VIN ↓ and VOUT(NOM) < 1.1 V: VIN = 2.2 V to 1.6 V VIN tfall = 30 µs |
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Load transients(10) | IOUT = 5 mA to 500 mA IOUT trise = 10 µs |
–45 | mV | |||
IOUT = 500 mA to 5 mA IOUT tfall = 10 µs |
45 | |||||
Overshoot on start-up(10) | Stated as a percentage of VOUT(NOM) | 5% | ||||
tON | Turnon time | Time from VEN > VEN(ON) to VOUT = 95% of VOUT(NOM) | 200 | µs | ||
OUTPUT AUTO DISCHARGE RATE | ||||||
RAD | Output discharge pull-down resistance | VEN = 0 V, VIN = 3.6 V | 100 | Ω |
PARAMETER | TEST CONDITIONS | MIN(1) | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
CIN | Input capacitance(2) | Capacitance for stability | 0.7 | 1 | µF | |
COUT | Output capacitance(2) | 0.7 | 1 | 10 | µF | |
ESR | Output voltage(2) | 5 | 500 | mΩ |