SPNS180B September   2012  – June 2015 RM42L432

PRODUCTION DATA.  

  1. 1Device Overview
    1. 1.1 Features
    2. 1.2 Applications
    3. 1.3 Description
    4. 1.4 Functional Block Diagram
  2. 2Revision History
  3. 3Device Comparison
  4. 4Terminal Configuration and Functions
    1. 4.1 PZ QFP Package Pinout (100-Pin)
    2. 4.2 Terminal Functions
      1. 4.2.1  High-End Timer (N2HET)
      2. 4.2.2  Enhanced Quadrature Encoder Pulse Modules (eQEP)
      3. 4.2.3  General-Purpose Input/Output (GPIO)
      4. 4.2.4  Controller Area Network Interface Modules (DCAN1, DCAN2)
      5. 4.2.5  Multibuffered Serial Peripheral Interface (MibSPI1)
      6. 4.2.6  Standard Serial Peripheral Interface (SPI2)
      7. 4.2.7  Local Interconnect Network Controller (LIN)
      8. 4.2.8  Multibuffered Analog-to-Digital Converter (MibADC)
      9. 4.2.9  System Module
      10. 4.2.10 Error Signaling Module (ESM)
      11. 4.2.11 Main Oscillator
      12. 4.2.12 Test/Debug Interface
      13. 4.2.13 Flash
      14. 4.2.14 Core Supply
      15. 4.2.15 I/O Supply
      16. 4.2.16 Core and I/O Supply Ground Reference
    3. 4.3 Output Multiplexing and Control
      1. 4.3.1 Notes on Output Multiplexing
      2. 4.3.2 General Rules for Multiplexing Control Registers
    4. 4.4 Special Multiplexed Options
      1. 4.4.1 Filtering for eQEP Inputs
        1. 4.4.1.1 eQEPA Input
        2. 4.4.1.2 eQEPB Input
        3. 4.4.1.3 eQEPI Input
        4. 4.4.1.4 eQEPS Input
      2. 4.4.2 N2HET PIN_nDISABLE Input Port
  5. 5Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Power-On Hours (POH)
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Switching Characteristics Over Recommended Operating Conditions for Clock Domains
    6. 5.6  Wait States Required
    7. 5.7  Power Consumption
    8. 5.8  Thermal Resistance Characteristics for PZ
    9. 5.9  Input/Output Electrical Characteristics
    10. 5.10 Output Buffer Drive Strengths
    11. 5.11 Input Timings
    12. 5.12 Output Timings
  6. 6System Information and Electrical Specifications
    1. 6.1  Voltage Monitor Characteristics
      1. 6.1.1 Important Considerations
      2. 6.1.2 Voltage Monitor Operation
      3. 6.1.3 Supply Filtering
    2. 6.2  Power Sequencing and Power-On Reset
      1. 6.2.1 Power-Up Sequence
      2. 6.2.2 Power-Down Sequence
      3. 6.2.3 Power-On Reset: nPORRST
        1. 6.2.3.1 nPORRST Electrical and Timing Requirements
    3. 6.3  Warm Reset (nRST)
      1. 6.3.1 Causes of Warm Reset
      2. 6.3.2 nRST Timing Requirements
    4. 6.4  ARM Cortex-R4 CPU Information
      1. 6.4.1 Summary of ARM Cortex-R4 CPU Features
      2. 6.4.2 ARM Cortex-R4 CPU Features Enabled by Software
      3. 6.4.3 Dual Core Implementation
      4. 6.4.4 Duplicate clock tree after GCLK
      5. 6.4.5 ARM Cortex-R4 CPU Compare Module (CCM) for Safety
      6. 6.4.6 CPU Self-Test
        1. 6.4.6.1 Application Sequence for CPU Self-Test
        2. 6.4.6.2 CPU Self-Test Clock Configuration
        3. 6.4.6.3 CPU Self-Test Coverage
    5. 6.5  Clocks
      1. 6.5.1 Clock Sources
        1. 6.5.1.1 Main Oscillator
          1. 6.5.1.1.1 Timing Requirements for Main Oscillator
        2. 6.5.1.2 Low-Power Oscillator
          1. 6.5.1.2.1 Features
          2. 6.5.1.2.2 LPO Electrical and Timing Specifications
        3. 6.5.1.3 Phase Locked Loop (PLL) Clock Modules
          1. 6.5.1.3.1 Block Diagram
          2. 6.5.1.3.2 PLL Timing Specifications
      2. 6.5.2 Clock Domains
        1. 6.5.2.1 Clock Domain Descriptions
        2. 6.5.2.2 Mapping of Clock Domains to Device Modules
      3. 6.5.3 Clock Test Mode
    6. 6.6  Clock Monitoring
      1. 6.6.1 Clock Monitor Timings
      2. 6.6.2 External Clock (ECLK) Output Functionality
      3. 6.6.3 Dual Clock Comparator
        1. 6.6.3.1 Features
        2. 6.6.3.2 Mapping of DCC Clock Source Inputs
    7. 6.7  Glitch Filters
    8. 6.8  Device Memory Map
      1. 6.8.1 Memory Map Diagram
      2. 6.8.2 Memory Map Table
      3. 6.8.3 Master/Slave Access Privileges
    9. 6.9  Flash Memory
      1. 6.9.1 Flash Memory Configuration
      2. 6.9.2 Main Features of Flash Module
      3. 6.9.3 ECC Protection for Flash Accesses
      4. 6.9.4 Flash Access Speeds
    10. 6.10 Flash Program and Erase Timings for Program Flash
    11. 6.11 Flash Program and Erase Timings for Data Flash
    12. 6.12 Tightly Coupled RAM Interface Module
      1. 6.12.1 Features
      2. 6.12.2 TCRAMW ECC Support
    13. 6.13 Parity Protection for Accesses to peripheral RAMs
    14. 6.14 On-Chip SRAM Initialization and Testing
      1. 6.14.1 On-Chip SRAM Self-Test Using PBIST
        1. 6.14.1.1 Features
        2. 6.14.1.2 PBIST RAM Groups
      2. 6.14.2 On-Chip SRAM Auto Initialization
    15. 6.15 Vectored Interrupt Manager
      1. 6.15.1 VIM Features
      2. 6.15.2 Interrupt Request Assignments
    16. 6.16 Real-Time Interrupt Module
      1. 6.16.1 Features
      2. 6.16.2 Block Diagrams
      3. 6.16.3 Clock Source Options
    17. 6.17 Error Signaling Module
      1. 6.17.1 Features
      2. 6.17.2 ESM Channel Assignments
    18. 6.18 Reset / Abort / Error Sources
    19. 6.19 Digital Windowed Watchdog
    20. 6.20 Debug Subsystem
      1. 6.20.1 Block Diagram
      2. 6.20.2 Debug Components Memory Map
      3. 6.20.3 JTAG Identification Code
      4. 6.20.4 Debug ROM
      5. 6.20.5 JTAG Scan Interface Timings
      6. 6.20.6 Advanced JTAG Security Module
      7. 6.20.7 Boundary Scan Chain
  7. 7Peripheral Information and Electrical Specifications
    1. 7.1 Peripheral Legend
    2. 7.2 Multibuffered 12-Bit Analog-to-Digital Converter
      1. 7.2.1 Features
      2. 7.2.2 Event Trigger Options
        1. 7.2.2.1 MIBADC Event Trigger Hookup
      3. 7.2.3 ADC Electrical and Timing Specifications
      4. 7.2.4 Performance (Accuracy) Specifications
        1. 7.2.4.1 MibADC Nonlinearity Errors
        2. 7.2.4.2 MibADC Total Error
    3. 7.3 General-Purpose Input/Output
      1. 7.3.1 Features
    4. 7.4 Enhanced High-End Timer (N2HET)
      1. 7.4.1 Features
      2. 7.4.2 N2HET RAM Organization
      3. 7.4.3 Input Timing Specifications
      4. 7.4.4 N2HET Checking
        1. 7.4.4.1 Output Monitoring using Dual Clock Comparator (DCC)
      5. 7.4.5 Disabling N2HET Outputs
      6. 7.4.6 High-End Timer Transfer Unit (N2HET)
        1. 7.4.6.1 Features
        2. 7.4.6.2 Trigger Connections
    5. 7.5 Controller Area Network (DCAN)
      1. 7.5.1 Features
      2. 7.5.2 Electrical and Timing Specifications
    6. 7.6 Local Interconnect Network Interface (LIN)
      1. 7.6.1 LIN Features
    7. 7.7 Multibuffered / Standard Serial Peripheral Interface
      1. 7.7.1 Features
      2. 7.7.2 MibSPI Transmit and Receive RAM Organization
      3. 7.7.3 MibSPI Transmit Trigger Events
        1. 7.7.3.1 MIBSPI1 Event Trigger Hookup
      4. 7.7.4 MibSPI/SPI Master Mode I/O Timing Specifications
      5. 7.7.5 SPI Slave Mode I/O Timings
    8. 7.8 Enhanced Quadrature Encoder (eQEP)
      1. 7.8.1 Clock Enable Control for eQEPx Modules
      2. 7.8.2 Using eQEPx Phase Error
      3. 7.8.3 Input Connections to eQEPx Modules
      4. 7.8.4 Enhanced Quadrature Encoder Pulse (eQEPx) Timing
  8. 8Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Development Support
        1. 8.1.1.1 Getting Started
      2. 8.1.2 Device Nomenclature
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation from Texas Instruments
    3. 8.3 Community Resources
    4. 8.4 Trademarks
    5. 8.5 Electrostatic Discharge Caution
    6. 8.6 Glossary
    7. 8.7 Device Identification Code Register
    8. 8.8 Die Identification Registers
    9. 8.9 Module Certifications
      1. 8.9.1 DCAN Certification
      2. 8.9.2 LIN Certifications
        1. 8.9.2.1 LIN Master Mode
        2. 8.9.2.2 LIN Slave Mode - Fixed Baud Rate
        3. 8.9.2.3 LIN Slave Mode - Adaptive Baud Rate
  9. 9Mechanical Packaging and Orderable Addendum
    1. 9.1 Packaging Information

パッケージ・オプション

デバイスごとのパッケージ図は、PDF版データシートをご参照ください。

メカニカル・データ（パッケージ｜ピン）
  • PZ|100
サーマルパッド・メカニカル・データ
発注情報

2 Revision History

This data manual revision history highlights the technical changes made to the SPNS180A device-specific data manual to make it an SPNS180B revision.

Scope: Applicable updates to the Hercules™ MCU device family, specifically relating to the RM42L432 devices, which are now in the production data (PD) stage of development have been incorporated.

Changes from October 30, 2013 to June 30, 2015 (from A Revision (October 2013) to B Revision)

  • Updated/Changed section title to "Device Overview" Go
  • Added Section 1.3 (Description): Added paragraph describing IOMM Go
  • Section 1.3 (Description): Added the Device Information tableGo
  • Added Section 3, Device ComparisonGo
  • Section 5 (Specifications): Updated/Changed section titleGo
  • Section 5.1 (Absolute Maximum Ratings): Added Latch-up Performance Specification Go
  • Section 5.2 (ESD Ratings): Added sectionGo
  • Section 5.3 (Power-On Hours (POH)): Added table (new)Go
  • Table 5-3 (Output Buffer Drive Strengths): Added the "SPI3nCS[0]" signal to the 2 mA zero-dominant signals row Go
  • Table 5-4 (Selectable 8mA/2mA Control): Clarified impact of SPI2PC9 register on drive strength of SPI2SOMI pin in footnoteGo
  • Section 6.4.1 (Summary of ARM Cortex-R4 CPU Features): Added Quantity of Breakpoints and Watchpoints Go
  • Section 6.20.3 (JTAG Identification Code): Added a table showing JTAG ID code for each silicon revision.Go
  • Table 7-7 (MibADC Operating Characteristics ): Added missing footnote for ZSET 10-/12-bit modes.Go
  • Section 7.7.1 (Features [MibSPI]): Updated/Changed size of SPI baud clock generator from "8-bit" to "11-bit"Go
  • Section 8 (Device and Documentation Support): Updated/Changed section outline structureGo
  • Section 8.1 (Device Support): Added section (new)Go
  • Section 8.1.1 (Development Support, Hardware Development Tools): Updated/Changed the JTAG-based emulators specifiedGo
  • Section 8.1.2 (Device Nomenclature): Updated/Changed section titleGo
  • Figure 8-1 (Device Numbering Conventions): Updated/Change figure to include "Die Revision"Go
  • Section 8.7 (Device Identification Code Register): Added silicon revision B device identification codeGo
  • Section 8.8 (Die Identification Registers): Updated/Changed the DIEIDL and DIEIDH to point to the original registers at location 0xFFFFFF7C and 0xFFFFFF80 Go