JAJSS05C November   2000  – November 2023 SN65LBC173A , SN75LBC173A

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Dissipation Rating Table
    4. 5.4 Thermal Information
    5. 5.5 Recommended Operating Conditions
    6. 5.6 Electrical Characteristics
    7. 5.7 Switching Characteristics
    8. 5.8 Typical Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Typical Application
  10. 9 Device and Documentation Support
    1. 9.1 ドキュメントの更新通知を受け取る方法
    2. 9.2 サポート・リソース
    3. 9.3 商標
    4. 9.4 静電気放電に関する注意事項
    5. 9.5 用語集
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

5.7 Switching Characteristics

over recommended operating conditions
PARAMETER TEST CONDITIONS MIN TYP(1) MAX UNIT
tr Output rise time VID = −3 V to 3 V, See Figure 6-2 2 4 ns
tf Output fall time 2 4 ns
tPLH Propagation delay time, low-to-high level output 9 12 16 ns
tPHL Propagation delay time, high-to-low level output 9 12 16 ns
tPZH Propagation delay time, high-impedance to high-level output See Figure 6-3 27 38 ns
tPHZ Propagation delay time, high-level to high-impedance output 7 16 ns
tPZL Propagation delay time, high-impedance to low level output See Figure 6-4 29 38 ns
tPLZ Propagation delay time, low-level to high-impedance output 12 16 ns
tsk(p) Pulse skew (|(tPLH – tPHL)|) 0.2 1 ns
tsk(o) Output skew (see Note 4) 2 ns
tsk(pp) Part-to-part skew (see Note 5) 2 ns
(1) All typical values are at VCC = 5 V and 25°C.
(2) Outputs skew (tsk(o)) is the magnitude of the time delay difference between the outputs of a single device with all of the inputs connected together.
(3) Part-to-part skew (tsk(pp)) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices operate with the same input signals, the same supply voltages, at the same temperature, and have identical packages and test circuits.